{"id":"https://openalex.org/W4409227491","doi":"https://doi.org/10.1109/tim.2025.3555752","title":"A Sensitivity-Guided Unsupervised Learning Method for Image Reconstruction of Electrical Impedance Tomography","display_name":"A Sensitivity-Guided Unsupervised Learning Method for Image Reconstruction of Electrical Impedance Tomography","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4409227491","doi":"https://doi.org/10.1109/tim.2025.3555752"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3555752","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3555752","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024929419","display_name":"Yuanbin Wu","orcid":"https://orcid.org/0009-0002-8551-6155"},"institutions":[{"id":"https://openalex.org/I205237279","display_name":"Nankai University","ror":"https://ror.org/01y1kjr75","country_code":"CN","type":"education","lineage":["https://openalex.org/I205237279"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yuehui Wu","raw_affiliation_strings":["College of Artificial Intelligence, Nankai University, Tianjin, China"],"raw_orcid":"https://orcid.org/0009-0002-8551-6155","affiliations":[{"raw_affiliation_string":"College of Artificial Intelligence, Nankai University, Tianjin, China","institution_ids":["https://openalex.org/I205237279"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100439073","display_name":"Jianda Han","orcid":"https://orcid.org/0000-0002-9664-4534"},"institutions":[{"id":"https://openalex.org/I205237279","display_name":"Nankai University","ror":"https://ror.org/01y1kjr75","country_code":"CN","type":"education","lineage":["https://openalex.org/I205237279"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianda Han","raw_affiliation_strings":["College of Artificial Intelligence and Tianjin Key Laboratory of Intelligent Robotics, Nankai University, Tianjin, China","College of Artificial Intelligence and the Tianjin Key Laboratory of Intelligent Robotics, Nankai University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-9664-4534","affiliations":[{"raw_affiliation_string":"College of Artificial Intelligence and Tianjin Key Laboratory of Intelligent Robotics, Nankai University, Tianjin, China","institution_ids":["https://openalex.org/I205237279"]},{"raw_affiliation_string":"College of Artificial Intelligence and the Tianjin Key Laboratory of Intelligent Robotics, Nankai University, Tianjin, China","institution_ids":["https://openalex.org/I205237279"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007142883","display_name":"Xinhao Bai","orcid":"https://orcid.org/0000-0003-0619-5251"},"institutions":[{"id":"https://openalex.org/I205237279","display_name":"Nankai University","ror":"https://ror.org/01y1kjr75","country_code":"CN","type":"education","lineage":["https://openalex.org/I205237279"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinhao Bai","raw_affiliation_strings":["College of Artificial Intelligence, Nankai University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0003-0619-5251","affiliations":[{"raw_affiliation_string":"College of Artificial Intelligence, Nankai University, Tianjin, China","institution_ids":["https://openalex.org/I205237279"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085117641","display_name":"Jianeng Lin","orcid":"https://orcid.org/0000-0002-0811-9423"},"institutions":[{"id":"https://openalex.org/I205237279","display_name":"Nankai University","ror":"https://ror.org/01y1kjr75","country_code":"CN","type":"education","lineage":["https://openalex.org/I205237279"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianeng Lin","raw_affiliation_strings":["College of Artificial Intelligence, Nankai University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-0811-9423","affiliations":[{"raw_affiliation_string":"College of Artificial Intelligence, Nankai University, Tianjin, China","institution_ids":["https://openalex.org/I205237279"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088919891","display_name":"Ningbo Yu","orcid":"https://orcid.org/0000-0003-2159-3055"},"institutions":[{"id":"https://openalex.org/I205237279","display_name":"Nankai University","ror":"https://ror.org/01y1kjr75","country_code":"CN","type":"education","lineage":["https://openalex.org/I205237279"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ningbo Yu","raw_affiliation_strings":["College of Artificial Intelligence and Tianjin Key Laboratory of Intelligent Robotics, Nankai University, Tianjin, China","College of Artificial Intelligence and the Tianjin Key Laboratory of Intelligent Robotics, Nankai University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0003-2159-3055","affiliations":[{"raw_affiliation_string":"College of Artificial Intelligence and Tianjin Key Laboratory of Intelligent Robotics, Nankai University, Tianjin, China","institution_ids":["https://openalex.org/I205237279"]},{"raw_affiliation_string":"College of Artificial Intelligence and the Tianjin Key Laboratory of Intelligent Robotics, Nankai University, Tianjin, China","institution_ids":["https://openalex.org/I205237279"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5024929419"],"corresponding_institution_ids":["https://openalex.org/I205237279"],"apc_list":null,"apc_paid":null,"fwci":0.6531,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.68271732,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9348999857902527,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.7536326050758362},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6938472390174866},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.651403546333313},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5684600472450256},{"id":"https://openalex.org/keywords/unsupervised-learning","display_name":"Unsupervised learning","score":0.5406110286712646},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4902191758155823},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.48007732629776},{"id":"https://openalex.org/keywords/electrical-capacitance-tomography","display_name":"Electrical capacitance tomography","score":0.468850702047348},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4581233263015747},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4571949541568756},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3690272569656372},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3442910313606262},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3367590606212616},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.28168126940727234},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2115752100944519},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2043226957321167},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16824093461036682},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14413046836853027},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.12988266348838806},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.09480178356170654}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.7536326050758362},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6938472390174866},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.651403546333313},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5684600472450256},{"id":"https://openalex.org/C8038995","wikidata":"https://www.wikidata.org/wiki/Q1152135","display_name":"Unsupervised learning","level":2,"score":0.5406110286712646},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4902191758155823},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.48007732629776},{"id":"https://openalex.org/C2777418626","wikidata":"https://www.wikidata.org/wiki/Q2584887","display_name":"Electrical capacitance tomography","level":4,"score":0.468850702047348},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4581233263015747},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4571949541568756},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3690272569656372},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3442910313606262},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3367590606212616},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.28168126940727234},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2115752100944519},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2043226957321167},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16824093461036682},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14413046836853027},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.12988266348838806},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.09480178356170654},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3555752","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3555752","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2990382911","display_name":null,"funder_award_id":"62473214","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4209367200","display_name":null,"funder_award_id":"NKU-63241210","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4786084016","display_name":null,"funder_award_id":"U24A20284","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W2091013704","https://openalex.org/W2138838870","https://openalex.org/W2345901332","https://openalex.org/W2735337215","https://openalex.org/W2896344704","https://openalex.org/W2913384339","https://openalex.org/W2921406441","https://openalex.org/W2971748233","https://openalex.org/W3008745348","https://openalex.org/W3047238636","https://openalex.org/W3096947210","https://openalex.org/W3119900676","https://openalex.org/W3131065880","https://openalex.org/W3160733781","https://openalex.org/W3163376171","https://openalex.org/W3165290021","https://openalex.org/W3169751171","https://openalex.org/W3208869780","https://openalex.org/W4207052116","https://openalex.org/W4226188202","https://openalex.org/W4282912956","https://openalex.org/W4293242669","https://openalex.org/W4293732274","https://openalex.org/W4311600258","https://openalex.org/W4312354699","https://openalex.org/W4312961426","https://openalex.org/W4319986922","https://openalex.org/W4362691822","https://openalex.org/W4385218226","https://openalex.org/W4388018930","https://openalex.org/W4390187912","https://openalex.org/W4392309076","https://openalex.org/W4393140334","https://openalex.org/W4393241124","https://openalex.org/W4393252887","https://openalex.org/W4400114537","https://openalex.org/W4400647702","https://openalex.org/W4407937853","https://openalex.org/W6872643270"],"related_works":["https://openalex.org/W2170544729","https://openalex.org/W2090093661","https://openalex.org/W3211685995","https://openalex.org/W2532315310","https://openalex.org/W2031832834","https://openalex.org/W2097442821","https://openalex.org/W2157674401","https://openalex.org/W1974104633","https://openalex.org/W1519688086","https://openalex.org/W2058033086"],"abstract_inverted_index":{"Electrical":[0],"impedance":[1],"tomography":[2],"(EIT)":[3],"detects":[4],"time-varying":[5],"conductivity":[6,72,141,160],"distribution":[7,73],"and":[8,19,61,100,114,174,192],"has":[9],"grown":[10],"to":[11,68,81,107,130,140,188],"be":[12],"a":[13,30,41,62,101],"promising":[14],"imaging":[15,186],"modality":[16],"in":[17],"industrial":[18],"biomedical":[20],"fields.":[21],"However,":[22],"current":[23],"deep":[24],"learning-based":[25],"image":[26,48],"reconstruction":[27,49],"methods":[28],"require":[29],"large":[31],"number":[32],"of":[33,95,149,157],"voltage-conductivity":[34],"samples":[35],"for":[36,46],"training.":[37],"This":[38],"paper":[39],"proposes":[40],"sensitivity-guided":[42],"unsupervised":[43,193],"learning":[44,194],"method":[45,145,167],"EIT":[47,87],"(SULEIT).":[50],"First,":[51],"the":[52,71,76,82,86,91,96,109,112,125,132,137,147,150,154,158,164,189],"voltage":[53,58,116,138],"measurements":[54,139],"are":[55,79],"projected":[56],"into":[57],"feature":[59],"maps":[60],"fully":[63],"convolutional":[64],"network":[65,127,152],"is":[66,105,128],"designed":[67],"nonlinearly":[69],"reconstruct":[70],"images.":[74,142],"Subsequently,":[75],"reconstructed":[77],"images":[78],"converted":[80,115],"measurement":[83],"domain":[84],"through":[85],"forward":[88],"modeling.":[89],"Moreover,":[90],"loss":[92],"function":[93],"consisting":[94],"mean":[97,177],"absolute":[98],"error":[99,179],"L1":[102],"regularization":[103],"term":[104],"devised":[106],"evaluate":[108],"disparity":[110],"between":[111],"measured":[113],"measurements.":[117],"By":[118],"combining":[119],"data-driven":[120],"techniques":[121],"with":[122],"physical":[123],"constraints,":[124],"neural":[126,151],"enforced":[129],"learn":[131],"inherently":[133],"nonlinear":[134],"mapping":[135],"from":[136],"The":[143],"proposed":[144,165],"enables":[146],"training":[148],"without":[153],"prior":[155],"knowledge":[156],"true":[159],"distributions.":[161],"Experiments":[162],"show":[163],"SULEIT":[166],"obtains":[168],"higher":[169],"correlation":[170],"coefficient":[171],"(CC)":[172],"values":[173],"lower":[175],"root":[176],"square":[178],"(RMSE)":[180],"values,":[181],"which":[182],"demonstrate":[183],"its":[184],"superior":[185],"quality":[187],"alternative":[190],"numerical":[191],"methods.":[195]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}