{"id":"https://openalex.org/W4408970727","doi":"https://doi.org/10.1109/tim.2025.3555700","title":"Incipient Fault Detection for Medium Voltage Cables: Considering the Impact of Solid Insulation Degradation on Fault Transient Behavior","display_name":"Incipient Fault Detection for Medium Voltage Cables: Considering the Impact of Solid Insulation Degradation on Fault Transient Behavior","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4408970727","doi":"https://doi.org/10.1109/tim.2025.3555700"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3555700","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3555700","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077489891","display_name":"Zhaogui Liu","orcid":"https://orcid.org/0000-0002-8846-8059"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaogui Liu","raw_affiliation_strings":["School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China","Department of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-8846-8059","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"Department of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087858299","display_name":"Ying Liu","orcid":"https://orcid.org/0000-0003-3890-5414"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ying Liu","raw_affiliation_strings":["School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China","Department of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0003-3890-5414","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"Department of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078742258","display_name":"Guangya Zhu","orcid":"https://orcid.org/0000-0003-3790-4014"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangya Zhu","raw_affiliation_strings":["High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","High Voltage Laboratory in College of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-3790-4014","affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"High Voltage Laboratory in College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102523108","display_name":"Songkun Pan","orcid":null},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Songkun Pan","raw_affiliation_strings":["High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","High Voltage Laboratory in College of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0003-0805-3297","affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"High Voltage Laboratory in College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.7464,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.93026316,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9772999882698059,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.7902072072029114},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.731442391872406},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6265867948532104},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.5337774753570557},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5178766250610352},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5040211081504822},{"id":"https://openalex.org/keywords/transient-voltage-suppressor","display_name":"Transient voltage suppressor","score":0.48311710357666016},{"id":"https://openalex.org/keywords/transient-recovery-voltage","display_name":"Transient recovery voltage","score":0.4798978567123413},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.45095837116241455},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4470158815383911},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3516060709953308},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3494269549846649},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3259761333465576},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.30916041135787964},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.2865629494190216},{"id":"https://openalex.org/keywords/voltage-regulation","display_name":"Voltage regulation","score":0.10063698887825012},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.09803307056427002},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.06441047787666321},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.06431463360786438},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.06343546509742737}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.7902072072029114},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.731442391872406},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6265867948532104},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.5337774753570557},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5178766250610352},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5040211081504822},{"id":"https://openalex.org/C14915586","wikidata":"https://www.wikidata.org/wiki/Q1653998","display_name":"Transient voltage suppressor","level":3,"score":0.48311710357666016},{"id":"https://openalex.org/C72047438","wikidata":"https://www.wikidata.org/wiki/Q779785","display_name":"Transient recovery voltage","level":5,"score":0.4798978567123413},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.45095837116241455},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4470158815383911},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3516060709953308},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3494269549846649},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3259761333465576},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.30916041135787964},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.2865629494190216},{"id":"https://openalex.org/C196226539","wikidata":"https://www.wikidata.org/wiki/Q7940752","display_name":"Voltage regulation","level":3,"score":0.10063698887825012},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.09803307056427002},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.06441047787666321},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.06431463360786438},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.06343546509742737},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3555700","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3555700","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.5099999904632568}],"awards":[{"id":"https://openalex.org/G2461668777","display_name":null,"funder_award_id":"5400-202318550A-3-2-ZN","funder_id":"https://openalex.org/F4320326707","funder_display_name":"State Grid Corporation of China"},{"id":"https://openalex.org/G4760468370","display_name":null,"funder_award_id":"2023NSFSC0820","funder_id":"https://openalex.org/F4320329861","funder_display_name":"Natural Science Foundation of Sichuan Province"},{"id":"https://openalex.org/G6477918544","display_name":null,"funder_award_id":"52107160","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320326707","display_name":"State Grid Corporation of China","ror":"https://ror.org/05twwhs70"},{"id":"https://openalex.org/F4320329861","display_name":"Natural Science Foundation of Sichuan Province","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W2080835449","https://openalex.org/W2095736798","https://openalex.org/W2099170502","https://openalex.org/W2155077058","https://openalex.org/W2227668348","https://openalex.org/W2246096824","https://openalex.org/W2344779444","https://openalex.org/W2531562075","https://openalex.org/W2807617370","https://openalex.org/W2921160297","https://openalex.org/W2945351333","https://openalex.org/W2997773093","https://openalex.org/W3024140202","https://openalex.org/W3160808865","https://openalex.org/W3162357622","https://openalex.org/W3163427068","https://openalex.org/W3177078637","https://openalex.org/W4210681711","https://openalex.org/W4213010207","https://openalex.org/W4220989484","https://openalex.org/W4323794576","https://openalex.org/W4392901597","https://openalex.org/W4392902464","https://openalex.org/W4393078965","https://openalex.org/W4396941605","https://openalex.org/W4403390899"],"related_works":["https://openalex.org/W2758798772","https://openalex.org/W2081338125","https://openalex.org/W4406350055","https://openalex.org/W4239924455","https://openalex.org/W2001630809","https://openalex.org/W2585325717","https://openalex.org/W4244925124","https://openalex.org/W2920605100","https://openalex.org/W2153668793","https://openalex.org/W1971518572"],"abstract_inverted_index":{"Accurately":[0],"detecting":[1,139],"incipient":[2,18,95,140],"fault":[3,19,42,51,71,91,96,121,141,166],"states":[4,122,142],"in":[5,143,165],"medium":[6],"voltage":[7],"(MV)":[8],"cables":[9],"is":[10,78,98,117],"crucial":[11],"for":[12,119,137,162],"preventing":[13],"sudden":[14],"cable":[15,75],"failures.":[16],"Existing":[17],"detection":[20,67,97,167],"methods":[21],"primarily":[22],"rely":[23],"on":[24,70,90,101,124],"the":[25,35,47,85,102,107,125,129,150,153],"nonlinear":[26],"behavior":[27,37],"of":[28,38,50,87,106,128,152],"arcs":[29],"inside":[30],"discharge":[31],"channels":[32],"without":[33],"considering":[34,74],"degradation":[36,77],"solid":[39],"insulation":[40,76,88],"during":[41],"progression.":[43],"This":[44,156],"limitation":[45],"hinders":[46],"accurate":[48,57],"determination":[49],"stages":[52],"and":[53,56,94,147],"makes":[54],"precise":[55],"maintenance":[58],"difficult.":[59],"In":[60],"order":[61],"to":[62],"address":[63],"this":[64,81,112],"problem,":[65],"a":[66,114,159],"scheme":[68],"based":[69,100,123],"transient":[72,92,103],"characteristics":[73,105],"designed.":[79],"First,":[80],"article":[82],"theoretically":[83],"analyzes":[84],"impact":[86],"carbonization":[89],"behavior,":[93],"performed":[99],"variation":[104],"zero-sequence":[108,130],"current":[109,131],"waveform.":[110],"On":[111],"basis,":[113],"novel":[115],"approach":[116],"developed":[118],"diagnosing":[120],"distortion":[126],"rate":[127],"waveform,":[132],"providing":[133],"an":[134],"effective":[135],"method":[136],"accurately":[138],"MV":[144],"cables.":[145],"Simulations":[146],"experiments":[148],"demonstrate":[149],"effectiveness":[151],"proposed":[154],"method.":[155],"study":[157],"provides":[158],"new":[160],"perspective":[161],"future":[163],"advancements":[164],"methodologies.":[168]},"counts_by_year":[{"year":2025,"cited_by_count":7}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}