{"id":"https://openalex.org/W4408970726","doi":"https://doi.org/10.1109/tim.2025.3555693","title":"Automatic Identification and Suppression of Metal Artifacts in Multichannel OPM-MCG Data Based on Second-Order Blind Identification Method","display_name":"Automatic Identification and Suppression of Metal Artifacts in Multichannel OPM-MCG Data Based on Second-Order Blind Identification Method","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4408970726","doi":"https://doi.org/10.1109/tim.2025.3555693"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3555693","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3555693","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026163371","display_name":"Ruonan Wang","orcid":"https://orcid.org/0000-0002-0018-8213"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruonan Wang","raw_affiliation_strings":["National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-0018-8213","affiliations":[{"raw_affiliation_string":"National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101725808","display_name":"Fulong Wang","orcid":"https://orcid.org/0009-0007-4875-5698"},"institutions":[{"id":"https://openalex.org/I78675632","display_name":"Beijing Information Science & Technology University","ror":"https://ror.org/04xnqep60","country_code":"CN","type":"education","lineage":["https://openalex.org/I78675632"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fulong Wang","raw_affiliation_strings":["Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0007-4875-5698","affiliations":[{"raw_affiliation_string":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I78675632"]},{"raw_affiliation_string":"Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100430178","display_name":"Yanfei Yang","orcid":"https://orcid.org/0009-0009-6062-3537"},"institutions":[{"id":"https://openalex.org/I78675632","display_name":"Beijing Information Science & Technology University","ror":"https://ror.org/04xnqep60","country_code":"CN","type":"education","lineage":["https://openalex.org/I78675632"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanfei Yang","raw_affiliation_strings":["Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0009-6062-3537","affiliations":[{"raw_affiliation_string":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I78675632"]},{"raw_affiliation_string":"Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006069607","display_name":"R. P. Zhao","orcid":"https://orcid.org/0009-0005-6258-0228"},"institutions":[{"id":"https://openalex.org/I78675632","display_name":"Beijing Information Science & Technology University","ror":"https://ror.org/04xnqep60","country_code":"CN","type":"education","lineage":["https://openalex.org/I78675632"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruochen Zhao","raw_affiliation_strings":["Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0005-6258-0228","affiliations":[{"raw_affiliation_string":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I78675632"]},{"raw_affiliation_string":"Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yujie Ma","orcid":"https://orcid.org/0009-0002-8401-054X"},"institutions":[{"id":"https://openalex.org/I78675632","display_name":"Beijing Information Science & Technology University","ror":"https://ror.org/04xnqep60","country_code":"CN","type":"education","lineage":["https://openalex.org/I78675632"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yujie Ma","raw_affiliation_strings":["Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0002-8401-054X","affiliations":[{"raw_affiliation_string":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I78675632"]},{"raw_affiliation_string":"Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101288960","display_name":"Jin Ding","orcid":null},"institutions":[{"id":"https://openalex.org/I78675632","display_name":"Beijing Information Science & Technology University","ror":"https://ror.org/04xnqep60","country_code":"CN","type":"education","lineage":["https://openalex.org/I78675632"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jin Ding","raw_affiliation_strings":["Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0007-2945-729X","affiliations":[{"raw_affiliation_string":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I78675632"]},{"raw_affiliation_string":"Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001132879","display_name":"Le Jia","orcid":"https://orcid.org/0000-0002-5656-1339"},"institutions":[{"id":"https://openalex.org/I78675632","display_name":"Beijing Information Science & Technology University","ror":"https://ror.org/04xnqep60","country_code":"CN","type":"education","lineage":["https://openalex.org/I78675632"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Le Jia","raw_affiliation_strings":["Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-5656-1339","affiliations":[{"raw_affiliation_string":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I78675632"]},{"raw_affiliation_string":"Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034623638","display_name":"Yumei Gong","orcid":"https://orcid.org/0009-0002-1423-5508"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yumei Gong","raw_affiliation_strings":["Hangzhou Institute of Extremely-Weak Magnetic Field Major National Science and Technology Infrastructure, Hangzhou, China"],"raw_orcid":"https://orcid.org/0009-0002-1423-5508","affiliations":[{"raw_affiliation_string":"Hangzhou Institute of Extremely-Weak Magnetic Field Major National Science and Technology Infrastructure, Hangzhou, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100727759","display_name":"D. Xu","orcid":"https://orcid.org/0000-0002-0337-2040"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dong Xu","raw_affiliation_strings":["Hangzhou Institute of Extremely-Weak Magnetic Field Major National Science and Technology Infrastructure, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-0337-2040","affiliations":[{"raw_affiliation_string":"Hangzhou Institute of Extremely-Weak Magnetic Field Major National Science and Technology Infrastructure, Hangzhou, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101931500","display_name":"Xiaoyu Liang","orcid":"https://orcid.org/0000-0002-2978-2742"},"institutions":[{"id":"https://openalex.org/I78675632","display_name":"Beijing Information Science & Technology University","ror":"https://ror.org/04xnqep60","country_code":"CN","type":"education","lineage":["https://openalex.org/I78675632"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoyu Liang","raw_affiliation_strings":["Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-2978-2742","affiliations":[{"raw_affiliation_string":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I78675632"]},{"raw_affiliation_string":"Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007984315","display_name":"Xiaolin Ning","orcid":"https://orcid.org/0000-0003-3563-3601"},"institutions":[{"id":"https://openalex.org/I78675632","display_name":"Beijing Information Science & Technology University","ror":"https://ror.org/04xnqep60","country_code":"CN","type":"education","lineage":["https://openalex.org/I78675632"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaolin Ning","raw_affiliation_strings":["Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-3563-3601","affiliations":[{"raw_affiliation_string":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I78675632"]},{"raw_affiliation_string":"Ministry of Education, School of Instrumentation Science and Optoelectronic Engineering, Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":11,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.6906,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.87763996,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"17"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11949","display_name":"Nuclear Physics and Applications","score":0.9775000214576721,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11949","display_name":"Nuclear Physics and Applications","score":0.9775000214576721,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12603","display_name":"NMR spectroscopy and applications","score":0.9764000177383423,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9753999710083008,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.7522927522659302},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.5010089874267578},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4684985280036926},{"id":"https://openalex.org/keywords/speech-recognition","display_name":"Speech recognition","score":0.3517545461654663},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.34608665108680725},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3290547728538513},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3233579993247986},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26406747102737427},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2028290331363678}],"concepts":[{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.7522927522659302},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.5010089874267578},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4684985280036926},{"id":"https://openalex.org/C28490314","wikidata":"https://www.wikidata.org/wiki/Q189436","display_name":"Speech recognition","level":1,"score":0.3517545461654663},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.34608665108680725},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3290547728538513},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3233579993247986},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26406747102737427},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2028290331363678},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3555693","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3555693","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G405928335","display_name":null,"funder_award_id":"2022CXGC020208","funder_id":"https://openalex.org/F4320336742","funder_display_name":"Key Research and Development Program of Liaoning Province"}],"funders":[{"id":"https://openalex.org/F4320336742","display_name":"Key Research and Development Program of Liaoning Province","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W1573934564","https://openalex.org/W1862394037","https://openalex.org/W1916461295","https://openalex.org/W1966817276","https://openalex.org/W1967125431","https://openalex.org/W1968006185","https://openalex.org/W1970723811","https://openalex.org/W2003499122","https://openalex.org/W2010033853","https://openalex.org/W2012783660","https://openalex.org/W2017472757","https://openalex.org/W2021845341","https://openalex.org/W2037758954","https://openalex.org/W2045711050","https://openalex.org/W2050650033","https://openalex.org/W2087978924","https://openalex.org/W2098480856","https://openalex.org/W2111393476","https://openalex.org/W2115261698","https://openalex.org/W2133816242","https://openalex.org/W2135595031","https://openalex.org/W2141224535","https://openalex.org/W2142638745","https://openalex.org/W2151200325","https://openalex.org/W2154411331","https://openalex.org/W2167806087","https://openalex.org/W2317342050","https://openalex.org/W2390822007","https://openalex.org/W2886905122","https://openalex.org/W2907163035","https://openalex.org/W2943355930","https://openalex.org/W3007247528","https://openalex.org/W3034558365","https://openalex.org/W3111986259","https://openalex.org/W3134664738","https://openalex.org/W3135340538","https://openalex.org/W3200141076","https://openalex.org/W4213004941","https://openalex.org/W4253120876","https://openalex.org/W4365138706","https://openalex.org/W4387709825","https://openalex.org/W4388355043","https://openalex.org/W4388933760","https://openalex.org/W4399319743"],"related_works":["https://openalex.org/W2898732673","https://openalex.org/W2410053581","https://openalex.org/W2383658677","https://openalex.org/W3123203398","https://openalex.org/W1972473893","https://openalex.org/W2466435674","https://openalex.org/W2765200542","https://openalex.org/W2367893528","https://openalex.org/W3107784576","https://openalex.org/W242750434"],"abstract_inverted_index":{"Magnetocardiography":[0],"(MCG)":[1],"plays":[2],"a":[3,53,139],"growing":[4],"role":[5],"in":[6,45,106,120,143],"noninvasive":[7],"cardiac":[8],"disease":[9],"diagnosis.":[10],"However,":[11],"MCG":[12],"signals":[13],"are":[14,136],"prone":[15],"to":[16,68],"environmental":[17],"magnetic":[18],"fields":[19],"and":[20,25,38,88,98,118],"metal":[21,49,73,83,107,122],"artifacts,":[22,84,123],"distorting":[23],"waveforms":[24],"affecting":[26],"diagnostic":[27],"accuracy.":[28],"Existing":[29],"methods":[30],"like":[31],"the":[32],"fast":[33],"independent":[34],"component":[35],"analysis":[36],"(FastICA)":[37],"information":[39],"maximization":[40],"(Infomax)":[41],"algorithm":[42,58],"have":[43],"limitations":[44],"suppressing":[46,121],"ultralow":[47,71],"frequency":[48,72],"artifacts.":[50],"We":[51],"propose":[52],"second-order":[54],"blind":[55],"identification":[56],"(SOBI)":[57],"based":[59],"on":[60],"an":[61],"optimized":[62],"time-delay":[63],"matrix,":[64],"utilizing":[65],"temporal":[66],"coherence":[67],"effectively":[69],"separate":[70],"artifacts":[74],"from":[75],"mixed":[76],"sources.":[77],"An":[78],"automatic":[79],"screening":[80],"method":[81,115,146],"for":[82],"QRS,":[85],"T/P":[86],"waves,":[87],"unknown":[89],"interferences":[90],"is":[91],"established":[92],"using":[93],"time-frequency":[94],"features.":[95],"Extensive":[96],"simulations":[97],"real":[99],"OPM-MCG":[100],"experiments":[101],"validate":[102],"our":[103,114],"method\u2019s":[104],"superiority":[105],"artifact":[108],"suppression.":[109],"The":[110],"results":[111],"show":[112],"that":[113],"surpasses":[116],"FastICA":[117],"Infomax":[119],"achieving":[124],"average":[125],"SNR":[126],"improvement":[127],"of":[128],"5.36%\u201329.40%":[129],"across":[130],"four":[131],"subjects.":[132],"Reconstructed":[133],"P/QRS/T":[134],"waves":[135],"undistorted,":[137],"with":[138],"minimum":[140],"80.71%":[141],"reduction":[142],"RMSE.":[144],"This":[145],"potentially":[147],"expands":[148],"MCG\u2019s":[149],"clinical":[150],"applications,":[151],"benefiting":[152],"more":[153],"patients.":[154]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}