{"id":"https://openalex.org/W4408970709","doi":"https://doi.org/10.1109/tim.2025.3555691","title":"An 8-bit Split CDAC-Based Noise-Shaping SAR ADC in 180 nm CMOS for Power Efficient Digitization of Sensor Signals","display_name":"An 8-bit Split CDAC-Based Noise-Shaping SAR ADC in 180 nm CMOS for Power Efficient Digitization of Sensor Signals","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4408970709","doi":"https://doi.org/10.1109/tim.2025.3555691"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3555691","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3555691","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5104267966","display_name":"Sanchari Das","orcid":"https://orcid.org/0000-0003-0497-4032"},"institutions":[{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sanchari Das","raw_affiliation_strings":["Department of Electrical Engineering, University at Buffalo, Buffalo, NY, USA","Department of Electrical Engineering, University at Buffalo, Buffalo, NY-, USA"],"raw_orcid":"https://orcid.org/0000-0003-0497-4032","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University at Buffalo, Buffalo, NY, USA","institution_ids":["https://openalex.org/I63190737"]},{"raw_affiliation_string":"Department of Electrical Engineering, University at Buffalo, Buffalo, NY-, USA","institution_ids":["https://openalex.org/I63190737"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014934624","display_name":"Shruti Konwar","orcid":"https://orcid.org/0000-0002-7573-3394"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Shruti Konwar","raw_affiliation_strings":["Department of Electronics and Electrical Communication Engineering, IIT Kharagpur, Kharagpur, West Bengal, India","Department of Electronics and Electrical Communication Engineering, IIT, Kharagpur, India"],"raw_orcid":"https://orcid.org/0000-0002-7573-3394","affiliations":[{"raw_affiliation_string":"Department of Electronics and Electrical Communication Engineering, IIT Kharagpur, Kharagpur, West Bengal, India","institution_ids":["https://openalex.org/I145894827"]},{"raw_affiliation_string":"Department of Electronics and Electrical Communication Engineering, IIT, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025752301","display_name":"Sanjay Kumar","orcid":null},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sanjay Kumar","raw_affiliation_strings":["Department of Electronics and Electrical Communication Engineering, IIT Kharagpur, Kharagpur, West Bengal, India","Department of Electronics and Electrical Communication Engineering, IIT, Kharagpur, India"],"raw_orcid":"https://orcid.org/0000-0002-4043-3666","affiliations":[{"raw_affiliation_string":"Department of Electronics and Electrical Communication Engineering, IIT Kharagpur, Kharagpur, West Bengal, India","institution_ids":["https://openalex.org/I145894827"]},{"raw_affiliation_string":"Department of Electronics and Electrical Communication Engineering, IIT, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005496543","display_name":"Arindam Sanyal","orcid":"https://orcid.org/0000-0003-4045-6291"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arindam Sanyal","raw_affiliation_strings":["Department of Electrical Engg., Arizona State University, Tempe, AZ, USA","Department of Electrical Engg, Arizona State University, Tempe, AZ, USA"],"raw_orcid":"https://orcid.org/0000-0003-4045-6291","affiliations":[{"raw_affiliation_string":"Department of Electrical Engg., Arizona State University, Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Department of Electrical Engg, Arizona State University, Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075623958","display_name":"Bibhu Datta Sahoo","orcid":"https://orcid.org/0000-0002-3563-9096"},"institutions":[{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bibhu Datta Sahoo","raw_affiliation_strings":["Department of Electrical Engineering, University at Buffalo, Buffalo, NY, USA","Department of Electrical Engineering, University at Buffalo, Buffalo, NY-, USA"],"raw_orcid":"https://orcid.org/0000-0002-3563-9096","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University at Buffalo, Buffalo, NY, USA","institution_ids":["https://openalex.org/I63190737"]},{"raw_affiliation_string":"Department of Electrical Engineering, University at Buffalo, Buffalo, NY-, USA","institution_ids":["https://openalex.org/I63190737"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05200136,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/digitization","display_name":"Digitization","score":0.8144080638885498},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7673857808113098},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.6482076048851013},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6155427098274231},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4716053605079651},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4512943923473358},{"id":"https://openalex.org/keywords/signal-to-noise-ratio","display_name":"Signal-to-noise ratio (imaging)","score":0.4460933804512024},{"id":"https://openalex.org/keywords/noise-shaping","display_name":"Noise shaping","score":0.42970559000968933},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.41882622241973877},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4163863956928253},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32606709003448486},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.24413412809371948},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19640755653381348},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.18765941262245178},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16633078455924988},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07599636912345886}],"concepts":[{"id":"https://openalex.org/C2779308522","wikidata":"https://www.wikidata.org/wiki/Q843958","display_name":"Digitization","level":2,"score":0.8144080638885498},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7673857808113098},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.6482076048851013},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6155427098274231},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4716053605079651},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4512943923473358},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.4460933804512024},{"id":"https://openalex.org/C9083635","wikidata":"https://www.wikidata.org/wiki/Q2133535","display_name":"Noise shaping","level":2,"score":0.42970559000968933},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41882622241973877},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4163863956928253},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32606709003448486},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.24413412809371948},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19640755653381348},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.18765941262245178},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16633078455924988},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07599636912345886},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3555691","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3555691","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8700000047683716,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1526838648","https://openalex.org/W1806144281","https://openalex.org/W2018896644","https://openalex.org/W2035269471","https://openalex.org/W2057321991","https://openalex.org/W2071087062","https://openalex.org/W2101004723","https://openalex.org/W2124838096","https://openalex.org/W2307196925","https://openalex.org/W2345020386","https://openalex.org/W2536517842","https://openalex.org/W2540271174","https://openalex.org/W2562220823","https://openalex.org/W2580320552","https://openalex.org/W2743823487","https://openalex.org/W2810499632","https://openalex.org/W2905521207","https://openalex.org/W2913375214","https://openalex.org/W2982221936","https://openalex.org/W3015865377","https://openalex.org/W3083255238","https://openalex.org/W3083977280","https://openalex.org/W3106996514","https://openalex.org/W3135662627","https://openalex.org/W3205219848","https://openalex.org/W4235073896","https://openalex.org/W4286571712","https://openalex.org/W4293057391","https://openalex.org/W4293428392","https://openalex.org/W4311413069","https://openalex.org/W4385834427","https://openalex.org/W4392251575","https://openalex.org/W6893935069"],"related_works":["https://openalex.org/W2036735748","https://openalex.org/W3011208887","https://openalex.org/W3048332254","https://openalex.org/W3216832710","https://openalex.org/W2943504207","https://openalex.org/W2914701507","https://openalex.org/W2487410127","https://openalex.org/W3184887885","https://openalex.org/W3144658446","https://openalex.org/W2186057580"],"abstract_inverted_index":{"Noise":[0],"shaping":[1],"(NS)":[2],"successive":[3],"approximation":[4],"register":[5],"(SAR)":[6],"analog-to-digital":[7],"converters":[8],"(ADCs)":[9],"can":[10],"achieve":[11],"high":[12],"resolution":[13],"with":[14,46,84],"low":[15],"power":[16],"consumption":[17],"without":[18],"the":[19],"need":[20],"to":[21],"incorporate":[22],"power-hungry":[23],"transconductance":[24],"amplifiers.":[25],"An":[26],"improved":[27],"NS":[28,40,45],"architecture":[29,66],"is":[30,67],"proposed":[31,65],"that":[32],"takes":[33],"only":[34],"one":[35],"extra":[36],"clock":[37],"cycle":[38],"for":[39,62],"and":[41,59,75],"achieves":[42,76],"a":[43,47],"first-order":[44],"zero":[48],"at":[49],"0.9":[50],"using":[51],"an":[52,77,85,91],"8-bit":[53],"split":[54],"capacitor":[55],"digital-to-analog":[56],"converter":[57],"(DAC)":[58],"passive":[60],"capacitors":[61],"integration.":[63],"The":[64],"implemented":[68],"in":[69],"180":[70],"nm":[71],"1P6M":[72],"CMOS":[73],"process":[74],"signal-to-noise+distortion":[78],"ratio":[79],"(SNDR)":[80],"of":[81,88,94],"69":[82],"dB":[83],"effective-number-of-bits":[86],"(ENOBs)":[87],"11.16":[89],"occupying":[90],"active":[92],"area":[93],"0.07":[95],"mm2.":[96]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}