{"id":"https://openalex.org/W4408655484","doi":"https://doi.org/10.1109/tim.2025.3552867","title":"An Integrated Linear CMOS Hall Sensor for 3-D Magnetic Field Measurement With Low-Noise Readout Circuit","display_name":"An Integrated Linear CMOS Hall Sensor for 3-D Magnetic Field Measurement With Low-Noise Readout Circuit","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4408655484","doi":"https://doi.org/10.1109/tim.2025.3552867"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3552867","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3552867","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Lin Zhou","orcid":"https://orcid.org/0009-0002-6822-4345"},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lin Zhou","raw_affiliation_strings":["College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"raw_orcid":"https://orcid.org/0009-0002-6822-4345","affiliations":[{"raw_affiliation_string":"College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103864024","display_name":"Jun Du","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Du","raw_affiliation_strings":["Beijing Smartchip Microelectronics Technology Company Ltd., Peking, China","Beijing Smartchip Microelectronics Technology Company Limited, Peking, China"],"raw_orcid":"https://orcid.org/0009-0005-1474-5075","affiliations":[{"raw_affiliation_string":"Beijing Smartchip Microelectronics Technology Company Ltd., Peking, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"Beijing Smartchip Microelectronics Technology Company Limited, Peking, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003110798","display_name":"Hengchao Sun","orcid":"https://orcid.org/0009-0000-6693-5149"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hengchao Sun","raw_affiliation_strings":["Beijing Smartchip Microelectronics Technology Company Ltd., Peking, China","Beijing Smartchip Microelectronics Technology Company Limited, Peking, China"],"raw_orcid":"https://orcid.org/0009-0000-6693-5149","affiliations":[{"raw_affiliation_string":"Beijing Smartchip Microelectronics Technology Company Ltd., Peking, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"Beijing Smartchip Microelectronics Technology Company Limited, Peking, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Shuangxi Wang","orcid":"https://orcid.org/0009-0000-8311-4078"},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuangxi Wang","raw_affiliation_strings":["College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"raw_orcid":"https://orcid.org/0009-0000-8311-4078","affiliations":[{"raw_affiliation_string":"College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jielin Li","orcid":"https://orcid.org/0009-0000-9287-7042"},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jielin Li","raw_affiliation_strings":["College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"raw_orcid":"https://orcid.org/0009-0000-9287-7042","affiliations":[{"raw_affiliation_string":"College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065451206","display_name":"Haoxiang Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haoxiang Jiang","raw_affiliation_strings":["College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"raw_orcid":"https://orcid.org/0009-0000-0600-4852","affiliations":[{"raw_affiliation_string":"College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110369440","display_name":"Yue Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yue Xu","raw_affiliation_strings":["College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-0534-0798","affiliations":[{"raw_affiliation_string":"College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9253,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.73418493,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9398999810218811,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6491400003433228},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5979020595550537},{"id":"https://openalex.org/keywords/hall-effect-sensor","display_name":"Hall effect sensor","score":0.570353090763092},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5361587405204773},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4847862124443054},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.4646816551685333},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.4539383351802826},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4091331958770752},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3587217628955841},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35801059007644653},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.24967870116233826},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.1832796037197113},{"id":"https://openalex.org/keywords/magnet","display_name":"Magnet","score":0.10720443725585938}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6491400003433228},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5979020595550537},{"id":"https://openalex.org/C107637996","wikidata":"https://www.wikidata.org/wiki/Q1431247","display_name":"Hall effect sensor","level":3,"score":0.570353090763092},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5361587405204773},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4847862124443054},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.4646816551685333},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.4539383351802826},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4091331958770752},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3587217628955841},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35801059007644653},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.24967870116233826},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.1832796037197113},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.10720443725585938},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3552867","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3552867","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.800000011920929,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G7307869155","display_name":null,"funder_award_id":"62171233","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1592605254","https://openalex.org/W1987749995","https://openalex.org/W2040104829","https://openalex.org/W2109519727","https://openalex.org/W2122229819","https://openalex.org/W2142454060","https://openalex.org/W2146500701","https://openalex.org/W2215086244","https://openalex.org/W2269994584","https://openalex.org/W2337382839","https://openalex.org/W2552213882","https://openalex.org/W2769381115","https://openalex.org/W2782477859","https://openalex.org/W2988462948","https://openalex.org/W3019587568","https://openalex.org/W3098567477","https://openalex.org/W3177424520","https://openalex.org/W3205016666","https://openalex.org/W4205744676","https://openalex.org/W4319068926","https://openalex.org/W4379984675","https://openalex.org/W4386590718","https://openalex.org/W4391582616","https://openalex.org/W4392251653","https://openalex.org/W4400727182"],"related_works":["https://openalex.org/W2082600734","https://openalex.org/W3136208481","https://openalex.org/W2061753885","https://openalex.org/W2327107878","https://openalex.org/W1999849981","https://openalex.org/W2569157012","https://openalex.org/W2171117985","https://openalex.org/W1526760723","https://openalex.org/W2012356576","https://openalex.org/W2126659863"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"an":[3],"integrated":[4],"3-D":[5,24,89,126],"Hall":[6,25,36,44,90,127],"sensor":[7,128],"with":[8,46],"a":[9,28,94,106,117,131,138,149,162,176],"low-noise":[10,63],"analog":[11,64],"front":[12,65],"end":[13,66],"to":[14],"measure":[15],"the":[16,81,125,146],"three-axis":[17],"linear":[18],"magnetic":[19,139,163],"field":[20,140,164],"in":[21,43,93],"space.":[22],"The":[23,88,120],"device":[26],"employs":[27],"modular":[29],"design":[30],"approach,":[31],"where":[32],"horizontal":[33],"and":[34,112,161],"vertical":[35],"devices":[37,45],"(VHDs)":[38],"are":[39],"optimized":[40],"independently,":[41],"resulting":[42],"nearly":[47],"identical":[48],"current-related":[49],"sensitivities":[50],"(<inline-formula":[51],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[52,96,154,168],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[53,97,155,169],"<tex-math":[54,98,156,170],"notation=\"LaTeX\">$S_{I}$":[55],"</tex-math></inline-formula>)":[56],"across":[57],"all":[58],"three":[59],"axes.":[60],"A":[61],"shared":[62],"using":[67],"switching":[68],"timings":[69],"for":[70],"multiplexing":[71],"is":[72],"proposed":[73],"to,":[74],"furthermore,":[75,145],"reduce":[76],"hardware":[77],"overhead,":[78],"which":[79],"ensures":[80],"same":[82],"accuracy":[83],"of":[84,109,133,142,152,166,179],"triaxial":[85],"signal":[86],"amplification.":[87],"sensor,":[91],"prototyped":[92],"0.18-<inline-formula":[95],"notation=\"LaTeX\">$\\mu":[99],"$":[100,158,172],"</tex-math></inline-formula>":[101,159,173],"m":[102],"CMOS-compatible":[103],"process,":[104],"occupies":[105],"core":[107],"area":[108],"0.22":[110],"mm2":[111],"draws":[113],"4.6":[114],"mA":[115],"from":[116],"1.8-V":[118],"supply.":[119],"experimental":[121],"results":[122],"demonstrate":[123],"that":[124],"prototype":[129,147],"exhibits":[130],"linearity":[132],"greater":[134],"than":[135],"99%":[136],"over":[137],"range":[141],"\u00b1200":[143],"mT;":[144],"obtains":[148],"residual":[150],"offset":[151],"<inline-formula":[153,167],"notation=\"LaTeX\">$120~\\mu":[157],"T":[160,174],"resolution":[165],"notation=\"LaTeX\">$146~\\mu":[171],"at":[175],"3-dB":[177],"bandwidth":[178],"27":[180],"kHz.":[181]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-03-20T00:00:00"}