{"id":"https://openalex.org/W4408441793","doi":"https://doi.org/10.1109/tim.2025.3551566","title":"A Novel Method for Microwave Frequency Measurement Based on Frequency-to-Time Mapping","display_name":"A Novel Method for Microwave Frequency Measurement Based on Frequency-to-Time Mapping","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4408441793","doi":"https://doi.org/10.1109/tim.2025.3551566"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3551566","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2025.3551566","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/tim.2025.3551566","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110651741","display_name":"Shijun Xia","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Shijun Xia","raw_affiliation_strings":["Aerospace Science and Industry Defense Technology Research and Test Center, Beijing, China","Aerospace Science & Industry Defense Technology Research and Test Center, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0008-1212-8745","affiliations":[{"raw_affiliation_string":"Aerospace Science and Industry Defense Technology Research and Test Center, Beijing, China","institution_ids":[]},{"raw_affiliation_string":"Aerospace Science & Industry Defense Technology Research and Test Center, Beijing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045608690","display_name":"Ye Xiao","orcid":"https://orcid.org/0000-0002-0143-5466"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I84653119","display_name":"Academia Sinica","ror":"https://ror.org/05bxb3784","country_code":"TW","type":"facility","lineage":["https://openalex.org/I84653119"]}],"countries":["CN","TW"],"is_corresponding":false,"raw_author_name":"Ye Xiao","raw_affiliation_strings":["Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institute of Semiconductors, Key Laboratory of Optoelectronic Materials and Devices, Chinese Academy of sciences, Beijing, china"],"raw_orcid":"https://orcid.org/0000-0002-0143-5466","affiliations":[{"raw_affiliation_string":"Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"institute of Semiconductors, Key Laboratory of Optoelectronic Materials and Devices, Chinese Academy of sciences, Beijing, china","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I84653119"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Bo Chen","orcid":"https://orcid.org/0009-0001-6337-8524"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bo Chen","raw_affiliation_strings":["Aerospace Science and Industry Defense Technology Research and Test Center, Beijing, China","Aerospace Science & Industry Defense Technology Research and Test Center, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0001-6337-8524","affiliations":[{"raw_affiliation_string":"Aerospace Science and Industry Defense Technology Research and Test Center, Beijing, China","institution_ids":[]},{"raw_affiliation_string":"Aerospace Science & Industry Defense Technology Research and Test Center, Beijing, China","institution_ids":[]}]},{"author_position":"last","author":{"id":null,"display_name":"Hong Zhang","orcid":"https://orcid.org/0009-0006-2245-1672"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hong Zhang","raw_affiliation_strings":["Aerospace Science and Industry Defense Technology Research and Test Center, Beijing, China","Aerospace Science & Industry Defense Technology Research and Test Center, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0006-2245-1672","affiliations":[{"raw_affiliation_string":"Aerospace Science and Industry Defense Technology Research and Test Center, Beijing, China","institution_ids":[]},{"raw_affiliation_string":"Aerospace Science & Industry Defense Technology Research and Test Center, Beijing, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5110651741"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.838,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.84609439,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10767","display_name":"Advanced Photonic Communication Systems","score":0.9790999889373779,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10767","display_name":"Advanced Photonic Communication Systems","score":0.9790999889373779,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12004","display_name":"Advanced Frequency and Time Standards","score":0.9632999897003174,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.9171000123023987,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.565730094909668},{"id":"https://openalex.org/keywords/time\u2013frequency-analysis","display_name":"Time\u2013frequency analysis","score":0.5246796011924744},{"id":"https://openalex.org/keywords/frequency-standard","display_name":"Frequency standard","score":0.5211998820304871},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5002233982086182},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41928592324256897},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.34563377499580383},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3359752297401428},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3095688819885254},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2750917077064514},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24971303343772888},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.18590328097343445},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.14491328597068787}],"concepts":[{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.565730094909668},{"id":"https://openalex.org/C142433447","wikidata":"https://www.wikidata.org/wiki/Q7806653","display_name":"Time\u2013frequency analysis","level":3,"score":0.5246796011924744},{"id":"https://openalex.org/C131221115","wikidata":"https://www.wikidata.org/wiki/Q362396","display_name":"Frequency standard","level":2,"score":0.5211998820304871},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5002233982086182},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41928592324256897},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.34563377499580383},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3359752297401428},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3095688819885254},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2750917077064514},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24971303343772888},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.18590328097343445},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.14491328597068787}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3551566","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2025.3551566","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tim.2025.3551566","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2025.3551566","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320336737","display_name":"China Aerospace Science and Technology Innovation Fund","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1536977536","https://openalex.org/W1595800361","https://openalex.org/W1963729996","https://openalex.org/W2156357365","https://openalex.org/W2158861463","https://openalex.org/W2425536823","https://openalex.org/W2467829111","https://openalex.org/W2486722524","https://openalex.org/W2900430621","https://openalex.org/W2901674150","https://openalex.org/W3111949532","https://openalex.org/W3150072681","https://openalex.org/W3203184988","https://openalex.org/W3208540743","https://openalex.org/W3212894226","https://openalex.org/W4248288458","https://openalex.org/W4253977142","https://openalex.org/W4300170350","https://openalex.org/W4307282825","https://openalex.org/W4307715846","https://openalex.org/W6922109306"],"related_works":["https://openalex.org/W2115590068","https://openalex.org/W2461946479","https://openalex.org/W1678289875","https://openalex.org/W2123482894","https://openalex.org/W2061413604","https://openalex.org/W2334225663","https://openalex.org/W1549119392","https://openalex.org/W2159403800","https://openalex.org/W1517371459","https://openalex.org/W2911764982"],"abstract_inverted_index":{"A":[0],"novel":[1],"method":[2,88],"is":[3,60,70],"proposed":[4,87,128],"and":[5,49,52,78,139],"demonstrated":[6],"for":[7,39],"measuring":[8],"microwave":[9,37,91],"frequency":[10,24,31,92],"based":[11],"on":[12],"frequency-to-time":[13],"mapping":[14],"(FTM)":[15],"in":[16],"this":[17],"article.":[18],"The":[19,81,119],"system":[20],"utilizes":[21],"a":[22,29,35,54,67,95,105,112],"linear":[23],"modulation":[25],"(LFM)":[26],"source":[27,38],"as":[28],"time-domain":[30],"ruler,":[32],"along":[33,103],"with":[34,46,94,104],"reference":[36,50],"calibration.":[40],"By":[41],"mixing":[42],"the":[43,47,57,63,74,86,123,127],"LFM":[44],"signal":[45],"measured":[48,58,75],"signals":[51],"applying":[53],"low-pass":[55],"filter,":[56],"information":[59],"mapped":[61],"into":[62],"time":[64],"domain.":[65],"Then,":[66],"cross-correlation":[68],"algorithm":[69],"employed":[71],"to":[72,100],"decode":[73],"frequency,":[76],"phase,":[77],"amplitude":[79],"information.":[80],"experimental":[82],"results":[83,133],"show":[84],"that":[85],"achieves":[89],"high-speed":[90,131],"measurement":[93,96,106,132],"rate":[97,114],"of":[98,108,115,126,136],"up":[99],"10":[101,109],"kHz,":[102],"range":[107],"GHz":[110],"using":[111],"sampling":[113],"only":[116],"1":[117,140],"GS/s.":[118],"experiment":[120],"also":[121],"demonstrates":[122],"adjustable":[124],"ability":[125],"system,":[129],"providing":[130],"at":[134],"rates":[135],"100":[137],"kHz":[138],"MHz.":[141]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1}],"updated_date":"2026-05-10T08:33:47.465468","created_date":"2025-10-10T00:00:00"}