{"id":"https://openalex.org/W4408540223","doi":"https://doi.org/10.1109/tim.2025.3551034","title":"Enhancing Magnetic Ring Defect Detection With Partially Adaptive Context-Enhanced Module Plugged Into Feature Pyramid Network","display_name":"Enhancing Magnetic Ring Defect Detection With Partially Adaptive Context-Enhanced Module Plugged Into Feature Pyramid Network","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4408540223","doi":"https://doi.org/10.1109/tim.2025.3551034"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3551034","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3551034","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075103597","display_name":"Lai Xinquan","orcid":null},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinquan Lai","raw_affiliation_strings":["School of Electronic Engineering, Xidian University, Xi&#x2019;an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, Xidian University, Xi&#x2019;an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060641960","display_name":"Zhengfeng Li","orcid":"https://orcid.org/0000-0003-2878-8779"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengfeng Li","raw_affiliation_strings":["School of Electronic Engineering, Xidian University, Xi&#x2019;an, China"],"raw_orcid":"https://orcid.org/0000-0003-2878-8779","affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, Xidian University, Xi&#x2019;an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076579142","display_name":"Shun-Tian Lou","orcid":"https://orcid.org/0009-0006-1483-8842"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuntian Lou","raw_affiliation_strings":["School of Electronic Engineering, Xidian University, Xi&#x2019;an, China"],"raw_orcid":"https://orcid.org/0009-0006-1483-8842","affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, Xidian University, Xi&#x2019;an, China","institution_ids":["https://openalex.org/I149594827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I149594827"],"apc_list":null,"apc_paid":null,"fwci":0.4223,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.56389319,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9900000095367432,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9776999950408936,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pyramid","display_name":"Pyramid (geometry)","score":0.6418124437332153},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.6321717500686646},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5556273460388184},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.485139936208725},{"id":"https://openalex.org/keywords/ring","display_name":"Ring (chemistry)","score":0.46647390723228455},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.43616700172424316},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.38090288639068604},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36343860626220703},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.24660634994506836},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2155706286430359},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15300801396369934},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.09748035669326782}],"concepts":[{"id":"https://openalex.org/C142575187","wikidata":"https://www.wikidata.org/wiki/Q3358290","display_name":"Pyramid (geometry)","level":2,"score":0.6418124437332153},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.6321717500686646},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5556273460388184},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.485139936208725},{"id":"https://openalex.org/C2780378348","wikidata":"https://www.wikidata.org/wiki/Q25351438","display_name":"Ring (chemistry)","level":2,"score":0.46647390723228455},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.43616700172424316},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.38090288639068604},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36343860626220703},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.24660634994506836},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2155706286430359},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15300801396369934},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.09748035669326782},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3551034","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3551034","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4453049681","display_name":"\u5f20\u91cf\u5bf9\u89d2\u5316\u53ca\u5176\u5728\u591a\u7ef4\u6570\u636e\u7279\u5f81\u5b66\u4e60\u4e0e\u5206\u7c7b\u4e2d\u7684\u5e94\u7528\u7814\u7a76","funder_award_id":"62071350","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G547280076","display_name":"DC-DC\u53d8\u6362\u5668\u6709\u6e90\u529f\u7387\u7535\u611f\u96c6\u6210\u7814\u7a76","funder_award_id":"61771363","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W2109255472","https://openalex.org/W2162280586","https://openalex.org/W2412782625","https://openalex.org/W2536297875","https://openalex.org/W2565639579","https://openalex.org/W2592939477","https://openalex.org/W2802735793","https://openalex.org/W2884563051","https://openalex.org/W2904559969","https://openalex.org/W2944303778","https://openalex.org/W2962721361","https://openalex.org/W2963857746","https://openalex.org/W2967610771","https://openalex.org/W2994615081","https://openalex.org/W2998008435","https://openalex.org/W3009013436","https://openalex.org/W3012374719","https://openalex.org/W3018757597","https://openalex.org/W3034971973","https://openalex.org/W3035396860","https://openalex.org/W3040739812","https://openalex.org/W3046756309","https://openalex.org/W3092462694","https://openalex.org/W3107867277","https://openalex.org/W3138516171","https://openalex.org/W3171297660","https://openalex.org/W3177052299","https://openalex.org/W3208023024","https://openalex.org/W3211776777","https://openalex.org/W4213436958","https://openalex.org/W4214507171","https://openalex.org/W4226063514","https://openalex.org/W4226212070","https://openalex.org/W4281790833","https://openalex.org/W4285109947","https://openalex.org/W4289752563","https://openalex.org/W4312195514","https://openalex.org/W4312443924","https://openalex.org/W4316660753","https://openalex.org/W4360838197","https://openalex.org/W4386076325","https://openalex.org/W4386076493","https://openalex.org/W4386108434","https://openalex.org/W4391805449","https://openalex.org/W4395063238","https://openalex.org/W6809665764","https://openalex.org/W6810974023"],"related_works":["https://openalex.org/W4249847449","https://openalex.org/W44395729","https://openalex.org/W2765338038","https://openalex.org/W1496225612","https://openalex.org/W1523500768","https://openalex.org/W2517629151","https://openalex.org/W1566843515","https://openalex.org/W4206776094","https://openalex.org/W3154920669","https://openalex.org/W3121197456"],"abstract_inverted_index":{"Quality":[0],"control":[1],"of":[2,11,27,38,68,112],"magnetic":[3,171,189],"rings":[4],"in":[5,187],"complex":[6],"industrial":[7],"manufacturing":[8],"processes":[9],"is":[10],"great":[12],"importance":[13],"to":[14,34,59,99,106,123,152],"ensure":[15],"optimal":[16],"performance.":[17],"Magnetic":[18],"ring":[19,172,190],"surface":[20,113,173,191],"defect":[21,39,52,61,174,192],"inspection,":[22],"being":[23],"a":[24,78,117,136,144,163],"pivotal":[25],"aspect":[26],"quality":[28],"control,":[29],"poses":[30],"persistent":[31],"challenges":[32],"attributed":[33],"the":[35,65,90,94,181],"unpredictable":[36],"nature":[37],"shape":[40],"and":[41,45,93,109,126,154],"scale,":[42],"foreground-background":[43],"imbalance,":[44],"other":[46],"factors.":[47],"Most":[48],"current":[49],"state-of-the-art":[50],"(SOTA)":[51],"detectors":[53],"prioritize":[54],"improving":[55,69],"multiscale":[56],"feature":[57,95,138],"fusion":[58],"enhance":[60],"recognition":[62],"while":[63],"neglecting":[64],"significant":[66],"influence":[67],"backbone":[70,91],"features.":[71,158],"To":[72],"tackle":[73],"these":[74],"challenges,":[75],"we":[76,161],"propose":[77],"partially":[79,118],"adaptive":[80,119],"context-enhanced":[81],"module":[82,140],"(PACEM)":[83],"that":[84,142,180],"can":[85],"be":[86],"seamlessly":[87],"integrated":[88],"between":[89],"network":[92,97],"pyramid":[96],"(FPN)":[98],"extract":[100,125],"attention-guided":[101],"contextual":[102,137,157],"features,":[103],"enabling":[104],"adaptability":[105],"irregular":[107],"variations":[108],"neighboring":[110],"textures":[111],"defects.":[114],"PACEM":[115],"leverages":[116],"context":[120],"extractor":[121],"(PACE)":[122],"effectively":[124],"consolidate":[127],"semantic":[128],"information":[129],"across":[130],"diverse":[131],"receptive":[132],"fields,":[133],"followed":[134],"by":[135],"gating":[139],"(CFGM)":[141],"employs":[143],"unique":[145],"multihead":[146],"inverted":[147],"spatial":[148],"attention":[149],"(MHISA)":[150],"mechanism":[151],"discern":[153],"select":[155],"influential":[156],"In":[159],"addition,":[160],"present":[162],"lightweight":[164],"decoupled":[165],"head":[166],"(LDH)":[167],"specifically":[168],"tailored":[169],"for":[170],"detection.":[175,193],"Extensive":[176],"experiments":[177],"consistently":[178],"demonstrate":[179],"proposed":[182],"method":[183],"exhibits":[184],"superior":[185],"performance":[186],"enhancing":[188]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}
