{"id":"https://openalex.org/W4408358887","doi":"https://doi.org/10.1109/tim.2025.3550640","title":"PUNet: Printed Fabric Defect Segmentation Method Based on UNet","display_name":"PUNet: Printed Fabric Defect Segmentation Method Based on UNet","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4408358887","doi":"https://doi.org/10.1109/tim.2025.3550640"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3550640","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3550640","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Jie Tang","orcid":"https://orcid.org/0009-0004-3264-9602"},"institutions":[{"id":"https://openalex.org/I27599042","display_name":"Xi'an Polytechnic University","ror":"https://ror.org/03442p831","country_code":"CN","type":"education","lineage":["https://openalex.org/I27599042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Tang","raw_affiliation_strings":["School of Electronic Information, Xi’an Polytechnic University, Xi’an, China","Xi’an Polytechnic University, Xi’an, China"],"raw_orcid":"https://orcid.org/0009-0004-3264-9602","affiliations":[{"raw_affiliation_string":"School of Electronic Information, Xi’an Polytechnic University, Xi’an, China","institution_ids":["https://openalex.org/I27599042"]},{"raw_affiliation_string":"Xi’an Polytechnic University, Xi’an, China","institution_ids":["https://openalex.org/I27599042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100616495","display_name":"Huanhuan Zhang","orcid":"https://orcid.org/0000-0001-5745-1775"},"institutions":[{"id":"https://openalex.org/I27599042","display_name":"Xi'an Polytechnic University","ror":"https://ror.org/03442p831","country_code":"CN","type":"education","lineage":["https://openalex.org/I27599042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huanhuan Zhang","raw_affiliation_strings":["School of Electronic Information, Xi’an Polytechnic University, Xi’an, China","Xi’an Polytechnic University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0001-5745-1775","affiliations":[{"raw_affiliation_string":"School of Electronic Information, Xi’an Polytechnic University, Xi’an, China","institution_ids":["https://openalex.org/I27599042"]},{"raw_affiliation_string":"Xi’an Polytechnic University, Xi’an, China","institution_ids":["https://openalex.org/I27599042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072847606","display_name":"Zebin Su","orcid":"https://orcid.org/0000-0002-8822-7589"},"institutions":[{"id":"https://openalex.org/I27599042","display_name":"Xi'an Polytechnic University","ror":"https://ror.org/03442p831","country_code":"CN","type":"education","lineage":["https://openalex.org/I27599042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zebin Su","raw_affiliation_strings":["School of Electronic Information, Xi’an Polytechnic University, Xi’an, China","Xi’an Polytechnic University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-8822-7589","affiliations":[{"raw_affiliation_string":"School of Electronic Information, Xi’an Polytechnic University, Xi’an, China","institution_ids":["https://openalex.org/I27599042"]},{"raw_affiliation_string":"Xi’an Polytechnic University, Xi’an, China","institution_ids":["https://openalex.org/I27599042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102922903","display_name":"Meng Jiang","orcid":"https://orcid.org/0000-0002-8746-8276"},"institutions":[{"id":"https://openalex.org/I27599042","display_name":"Xi'an Polytechnic University","ror":"https://ror.org/03442p831","country_code":"CN","type":"education","lineage":["https://openalex.org/I27599042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Meng Jiang","raw_affiliation_strings":["School of Electronic Information, Xi’an Polytechnic University, Xi’an, China","Xi’an Polytechnic University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-8746-8276","affiliations":[{"raw_affiliation_string":"School of Electronic Information, Xi’an Polytechnic University, Xi’an, China","institution_ids":["https://openalex.org/I27599042"]},{"raw_affiliation_string":"Xi’an Polytechnic University, Xi’an, China","institution_ids":["https://openalex.org/I27599042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103267253","display_name":"Pengfei Li","orcid":"https://orcid.org/0000-0002-5128-7107"},"institutions":[{"id":"https://openalex.org/I27599042","display_name":"Xi'an Polytechnic University","ror":"https://ror.org/03442p831","country_code":"CN","type":"education","lineage":["https://openalex.org/I27599042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengfei Li","raw_affiliation_strings":["School of Electronic Information, Xi’an Polytechnic University, Xi’an, China","Xi’an Polytechnic University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-5128-7107","affiliations":[{"raw_affiliation_string":"School of Electronic Information, Xi’an Polytechnic University, Xi’an, China","institution_ids":["https://openalex.org/I27599042"]},{"raw_affiliation_string":"Xi’an Polytechnic University, Xi’an, China","institution_ids":["https://openalex.org/I27599042"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066405237","display_name":"Junfeng Jing","orcid":"https://orcid.org/0000-0001-6646-3698"},"institutions":[{"id":"https://openalex.org/I27599042","display_name":"Xi'an Polytechnic University","ror":"https://ror.org/03442p831","country_code":"CN","type":"education","lineage":["https://openalex.org/I27599042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junfeng Jing","raw_affiliation_strings":["School of Electronic Information, Xi’an Polytechnic University, Xi’an, China","Xi’an Polytechnic University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0001-6646-3698","affiliations":[{"raw_affiliation_string":"School of Electronic Information, Xi’an Polytechnic University, Xi’an, China","institution_ids":["https://openalex.org/I27599042"]},{"raw_affiliation_string":"Xi’an Polytechnic University, Xi’an, China","institution_ids":["https://openalex.org/I27599042"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I27599042"],"apc_list":null,"apc_paid":null,"fwci":0.7777,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.70814631,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9311000108718872,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4379495680332184},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.42172253131866455},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.41726475954055786},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3149346113204956}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4379495680332184},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.42172253131866455},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41726475954055786},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3149346113204956}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3550640","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3550640","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3007342658","display_name":null,"funder_award_id":"2024GX-YBXM-231","funder_id":"https://openalex.org/F4320327780","funder_display_name":"Key Research and Development Program of Jiangxi Province"},{"id":"https://openalex.org/G7898502789","display_name":null,"funder_award_id":"61902302","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320327780","display_name":"Key Research and Development Program of Jiangxi Province","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":55,"referenced_works":["https://openalex.org/W1901129140","https://openalex.org/W2028852396","https://openalex.org/W2316830070","https://openalex.org/W2787091153","https://openalex.org/W2794825826","https://openalex.org/W2888407265","https://openalex.org/W2890747436","https://openalex.org/W2895572611","https://openalex.org/W2907750714","https://openalex.org/W2916798096","https://openalex.org/W2928133111","https://openalex.org/W2937534293","https://openalex.org/W2948982773","https://openalex.org/W2953129827","https://openalex.org/W2963156262","https://openalex.org/W2964308596","https://openalex.org/W2971018391","https://openalex.org/W2973678481","https://openalex.org/W3023224696","https://openalex.org/W3031794591","https://openalex.org/W3090974769","https://openalex.org/W3096617446","https://openalex.org/W3110878409","https://openalex.org/W3111404230","https://openalex.org/W3119769313","https://openalex.org/W3119943851","https://openalex.org/W3133394016","https://openalex.org/W3165012668","https://openalex.org/W3168491317","https://openalex.org/W3209850942","https://openalex.org/W3216724652","https://openalex.org/W4213436958","https://openalex.org/W4221101697","https://openalex.org/W4283450732","https://openalex.org/W4288715327","https://openalex.org/W4289523530","https://openalex.org/W4304166167","https://openalex.org/W4320476215","https://openalex.org/W4321495255","https://openalex.org/W4321495414","https://openalex.org/W4322707121","https://openalex.org/W4382701166","https://openalex.org/W4386350424","https://openalex.org/W4386352888","https://openalex.org/W4387885947","https://openalex.org/W4390604394","https://openalex.org/W4395449885","https://openalex.org/W6739696289","https://openalex.org/W6753182481","https://openalex.org/W6766495335","https://openalex.org/W6776492765","https://openalex.org/W6846395082","https://openalex.org/W6855723728","https://openalex.org/W6862363860","https://openalex.org/W6863518767"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W4404995717","https://openalex.org/W2016187641","https://openalex.org/W4404725684","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W2898370298","https://openalex.org/W2137437058"],"abstract_inverted_index":{"The":[0,59,143],"contrast":[1],"between":[2],"printed":[3,38,98,135,157],"defects":[4,13],"and":[5,11,19,73,90,125,130,138,152,162,191],"background":[6],"texture":[7],"is":[8,150],"extremely":[9],"low,":[10],"the":[12,17,48,53,68,102,116,134,156,182],"are":[14,25],"concealed":[15],"within":[16],"patterns":[18],"colors,":[20],"most":[21],"existing":[22],"detection":[23,172],"methods":[24],"often":[26],"unable":[27],"to":[28,115,181],"achieve":[29],"promising":[30],"results.":[31],"This":[32],"article":[33],"proposes":[34],"PUNet,":[35],"a":[36,63,80],"robust":[37],"fabric":[39,158],"defect":[40,87,107,136,141,159,165,178],"network":[41],"based":[42],"on":[43,133,155,174],"UNet.":[44,58],"First,":[45],"we":[46,78],"designed":[47],"P1":[49,60],"block":[50,61],"instead":[51],"of":[52,57,97],"original":[54,117],"convolutional":[55],"layer":[56],"applies":[62],"multiscale":[64],"dilated":[65],"convolution,":[66],"enabling":[67],"model":[69],"with":[70],"stronger":[71],"generalization":[72],"be":[74],"more":[75],"lightweight.":[76],"Second,":[77],"introduced":[79],"polarized":[81],"self-attention":[82],"(PSA)":[83],"mechanism,":[84],"which":[85],"enhances":[86],"detail":[88],"extraction":[89],"captures":[91],"sensitive":[92],"information":[93],"about":[94],"defective":[95],"regions":[96],"fabrics,":[99],"thereby":[100],"improving":[101],"model\u2019s":[103],"performance":[104,173],"for":[105],"small-sized":[106],"segmentation.":[108],"Extensive":[109],"experimental":[110],"results":[111],"demonstrate":[112],"that,":[113],"compared":[114],"UNet,":[118],"our":[119],"proposed":[120],"method":[121],"significantly":[122],"reduces":[123],"parameters":[124],"computational":[126],"costs":[127],"by":[128],"63.7%":[129],"58.5%,":[131],"respectively,":[132,154],"dataset":[137,160,166],"ceramic":[139],"tile":[140,163],"dataset.":[142],"mean":[144],"intersection":[145],"over":[146],"union":[147],"(mIOU)":[148],"achieved":[149],"80.66%":[151],"85.75%,":[153],"(PFDD)":[161],"surface":[164],"(TSDD).":[167],"Furthermore,":[168],"PUNet":[169,186],"exhibits":[170],"good":[171],"various":[175],"representative":[176],"industrial":[177],"datasets.":[179],"Compared":[180],"selected":[183],"state-of-the-art":[184],"methods,":[185],"outperforms":[187],"them":[188],"both":[189],"qualitatively":[190],"quantitatively.":[192]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}