{"id":"https://openalex.org/W4408358240","doi":"https://doi.org/10.1109/tim.2025.3550615","title":"Measurement Uncertainty Estimation Method for Passive Source/Load Pull","display_name":"Measurement Uncertainty Estimation Method for Passive Source/Load Pull","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4408358240","doi":"https://doi.org/10.1109/tim.2025.3550615"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3550615","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3550615","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026725703","display_name":"Ryoko Kishikawa","orcid":"https://orcid.org/0000-0002-5545-4136"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Ryoko Kishikawa","raw_affiliation_strings":["National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan"],"raw_orcid":"https://orcid.org/0000-0002-5545-4136","affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5026725703"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0397585,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11372","display_name":"Hydraulic and Pneumatic Systems","score":0.9401999711990356,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11372","display_name":"Hydraulic and Pneumatic Systems","score":0.9401999711990356,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14225","display_name":"Advanced Sensor and Control Systems","score":0.9359999895095825,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12699","display_name":"Electromagnetic Launch and Propulsion Technology","score":0.9297999739646912,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5145532488822937},{"id":"https://openalex.org/keywords/load-pull","display_name":"Load pull","score":0.47055697441101074},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44781872630119324},{"id":"https://openalex.org/keywords/environmental-science","display_name":"Environmental science","score":0.36595577001571655},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3600033223628998},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2665082812309265},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.19952908158302307},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.17763248085975647},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.13394001126289368},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.12415120005607605}],"concepts":[{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5145532488822937},{"id":"https://openalex.org/C2780141302","wikidata":"https://www.wikidata.org/wiki/Q6663311","display_name":"Load pull","level":4,"score":0.47055697441101074},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44781872630119324},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.36595577001571655},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3600033223628998},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2665082812309265},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.19952908158302307},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.17763248085975647},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.13394001126289368},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12415120005607605},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3550615","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3550615","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2160061651","https://openalex.org/W2162506010","https://openalex.org/W2162514786","https://openalex.org/W2326478571","https://openalex.org/W2478659311","https://openalex.org/W3014948169","https://openalex.org/W3036132286","https://openalex.org/W4248288458"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W2071053467","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2053214877"],"abstract_inverted_index":{"This":[0,114],"article":[1],"presents":[2],"a":[3,16,35,75,90,95],"method":[4,76,115],"for":[5,34,77],"evaluating":[6],"measurement":[7,18,55,80,110,128],"uncertainties":[8,81],"of":[9,45,82,108,122],"passive":[10],"source/load":[11],"pull":[12],"(PSLP),":[13],"which":[14],"is":[15,52,112,116],"nonlinear":[17],"technique":[19],"used":[20],"to":[21,89,94,118],"determine":[22],"the":[23,31,40,46,50,54,62,79,83,120],"source":[24,101],"and":[25,57,100],"load":[26,84],"reflection":[27,85,102],"coefficients":[28],"that":[29,53],"optimize":[30],"output":[32],"power":[33,87,92],"transistor":[36],"under":[37,97],"test":[38,98],"in":[39],"microwave":[41],"frequency":[42],"range.":[43],"One":[44],"significant":[47],"problems":[48],"with":[49],"PSLP":[51,63,127],"principle":[56],"configuration":[58],"are":[59],"complex;":[60],"therefore,":[61],"lacks":[64],"comprehensive":[65],"studies":[66],"on":[67,105],"uncertainty":[68],"evaluation":[69],"techniques.":[70],"To":[71],"solve":[72],"this":[73],"problem,":[74],"analyzing":[78],"coefficient,":[86],"delivered":[88,93],"load,":[91],"device":[96],"(DUT),":[99],"coefficient":[103],"based":[104],"four":[106],"types":[107],"linear":[109],"techniques":[111],"presented.":[113],"expected":[117],"improve":[119],"reliability":[121],"designing":[123],"transistor-based":[124],"amplifiers":[125],"using":[126],"data.":[129]},"counts_by_year":[],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}