{"id":"https://openalex.org/W4408852290","doi":"https://doi.org/10.1109/tim.2025.3548192","title":"An Improved Multimode TRL Calibration Method to 110 GHz Based on Coplanar Grounded Waveguides","display_name":"An Improved Multimode TRL Calibration Method to 110 GHz Based on Coplanar Grounded Waveguides","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4408852290","doi":"https://doi.org/10.1109/tim.2025.3548192"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3548192","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3548192","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5114752547","display_name":"Yuxuan Jiang","orcid":"https://orcid.org/0000-0002-0143-8579"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuxuan Jiang","raw_affiliation_strings":["State Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0143-8579","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089106354","display_name":"Changming Liu","orcid":"https://orcid.org/0009-0006-1274-5677"},"institutions":[{"id":"https://openalex.org/I2250955327","display_name":"Huawei Technologies (China)","ror":"https://ror.org/00cmhce21","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250955327"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changming Liu","raw_affiliation_strings":["Huawei Technologies Company Ltd., Wuhan, China"],"raw_orcid":"https://orcid.org/0009-0006-1274-5677","affiliations":[{"raw_affiliation_string":"Huawei Technologies Company Ltd., Wuhan, China","institution_ids":["https://openalex.org/I2250955327"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081982957","display_name":"Shirong Lv","orcid":"https://orcid.org/0000-0002-1378-1497"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shirong Lv","raw_affiliation_strings":["State Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-1378-1497","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019033016","display_name":"Congbiao Lei","orcid":"https://orcid.org/0000-0002-9271-7214"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Congbiao Lei","raw_affiliation_strings":["State Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-9271-7214","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042898476","display_name":"Guangcheng Zhong","orcid":"https://orcid.org/0000-0002-7296-0938"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangcheng Zhong","raw_affiliation_strings":["State Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-7296-0938","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Ping Gong","orcid":"https://orcid.org/0000-0002-5280-9261"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ping Gong","raw_affiliation_strings":["State Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-5280-9261","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Shengli Zhang","orcid":"https://orcid.org/0000-0002-8528-7324"},"institutions":[{"id":"https://openalex.org/I4210152380","display_name":"Shenzhen Technology University","ror":"https://ror.org/04qzpec27","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210152380"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shengli Zhang","raw_affiliation_strings":["College of Integrated Circuit and Optoelectronic Chips, Shenzhen Technology University, Shenzhen, China"],"raw_orcid":"https://orcid.org/0000-0002-8528-7324","affiliations":[{"raw_affiliation_string":"College of Integrated Circuit and Optoelectronic Chips, Shenzhen Technology University, Shenzhen, China","institution_ids":["https://openalex.org/I4210152380"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024871348","display_name":"Liang Xie","orcid":"https://orcid.org/0000-0003-4576-0225"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liang Xie","raw_affiliation_strings":["State Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-4576-0225","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.2961,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.77954165,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11175","display_name":"Gyrotron and Vacuum Electronics Research","score":0.978600025177002,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7331836223602295},{"id":"https://openalex.org/keywords/multi-mode-optical-fiber","display_name":"Multi-mode optical fiber","score":0.6671915054321289},{"id":"https://openalex.org/keywords/coplanar-waveguide","display_name":"Coplanar waveguide","score":0.5568397045135498},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4415140450000763},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4152683913707733},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.38420388102531433},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37826821208000183},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.34484344720840454},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3409082889556885},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3266480565071106},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3265071213245392},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.25207072496414185},{"id":"https://openalex.org/keywords/optical-fiber","display_name":"Optical fiber","score":0.23598042130470276},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.1623648703098297}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7331836223602295},{"id":"https://openalex.org/C101645829","wikidata":"https://www.wikidata.org/wiki/Q1781857","display_name":"Multi-mode optical fiber","level":3,"score":0.6671915054321289},{"id":"https://openalex.org/C3736036","wikidata":"https://www.wikidata.org/wiki/Q15525941","display_name":"Coplanar waveguide","level":3,"score":0.5568397045135498},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4415140450000763},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4152683913707733},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.38420388102531433},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37826821208000183},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34484344720840454},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3409082889556885},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3266480565071106},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3265071213245392},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.25207072496414185},{"id":"https://openalex.org/C194232370","wikidata":"https://www.wikidata.org/wiki/Q162","display_name":"Optical fiber","level":2,"score":0.23598042130470276},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.1623648703098297},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3548192","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3548192","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8100000023841858}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":43,"referenced_works":["https://openalex.org/W259431867","https://openalex.org/W1019765653","https://openalex.org/W2007492147","https://openalex.org/W2025389216","https://openalex.org/W2031801201","https://openalex.org/W2044175881","https://openalex.org/W2044949162","https://openalex.org/W2107829463","https://openalex.org/W2111068907","https://openalex.org/W2112774800","https://openalex.org/W2113641156","https://openalex.org/W2115581897","https://openalex.org/W2116636639","https://openalex.org/W2122584909","https://openalex.org/W2124227244","https://openalex.org/W2130455983","https://openalex.org/W2130887922","https://openalex.org/W2150304841","https://openalex.org/W2160378561","https://openalex.org/W2168854778","https://openalex.org/W2171676995","https://openalex.org/W2247219630","https://openalex.org/W2539563910","https://openalex.org/W2546025362","https://openalex.org/W2755497875","https://openalex.org/W2765410951","https://openalex.org/W2930063151","https://openalex.org/W2942402901","https://openalex.org/W2943193544","https://openalex.org/W2972109786","https://openalex.org/W3006644871","https://openalex.org/W3028318624","https://openalex.org/W3047301857","https://openalex.org/W4285170291","https://openalex.org/W4285329917","https://openalex.org/W4364856292","https://openalex.org/W4379184224","https://openalex.org/W4384518946","https://openalex.org/W4386124057","https://openalex.org/W4387546268","https://openalex.org/W4396853436","https://openalex.org/W4402218494","https://openalex.org/W6774127492"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2352927057","https://openalex.org/W1971958467","https://openalex.org/W1479725918","https://openalex.org/W2158422566","https://openalex.org/W1598570675","https://openalex.org/W2166929170","https://openalex.org/W2100904140","https://openalex.org/W1971708379","https://openalex.org/W2021120938"],"abstract_inverted_index":{"The":[0,40,74],"multimode":[1,76,123],"thru-reflect\u2013line":[2],"(TRL)":[3],"algorithm":[4,43,49,60,78,94,125],"is":[5,44,99,126],"widely":[6],"used":[7],"for":[8,95],"on-wafer":[9],"differential":[10],"circuit":[11],"calibration.":[12],"This":[13],"article":[14],"presents":[15],"the":[16,29,34,48,62,111,118,121],"design":[17],"and":[18,61,86,109,129],"calibration":[19,25,64,68,84,112],"of":[20,114,120],"coplanar":[21],"grounded":[22],"waveguide":[23],"(GCPW)-based":[24],"kits.":[26],"Based":[27],"on":[28],"original":[30],"algorithm,":[31],"we":[32],"optimize":[33],"reflect":[35],"standard":[36],"symbol":[37],"determination":[38],"algorithm.":[39],"impedance":[41],"transformation":[42],"added":[45],"so":[46],"that":[47],"can":[50],"be":[51],"applied":[52],"to":[53,71],"calibrating":[54],"strongly":[55],"coupled":[56],"devices.":[57],"An":[58],"improved":[59,122],"designed":[63],"kits":[65],"enabled":[66],"precise":[67],"from":[69],"0.1":[70],"110":[72],"GHz.":[73],"conventional":[75],"TRL":[77,124],"line":[79,97,104,115],"standards":[80,98,105],"have":[81],"a":[82],"narrow":[83],"range":[85],"require":[87],"manual":[88],"selection.":[89],"In":[90],"this":[91],"article,":[92],"an":[93],"selecting":[96],"proposed,":[100],"which":[101],"automatically":[102],"selects":[103],"with":[106],"minor":[107],"errors":[108],"expands":[110],"frequency":[113],"standards.":[116],"Finally,":[117],"error":[119],"quantitatively":[127],"analyzed":[128],"discussed.":[130]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-17T09:13:05.818461","created_date":"2025-10-10T00:00:00"}