{"id":"https://openalex.org/W4408594691","doi":"https://doi.org/10.1109/tim.2025.3547502","title":"Multicriteria Decision-Making Model for Assessing the Aging Condition of Composite Insulators Using AHP-Entroped TOPSIS","display_name":"Multicriteria Decision-Making Model for Assessing the Aging Condition of Composite Insulators Using AHP-Entroped TOPSIS","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4408594691","doi":"https://doi.org/10.1109/tim.2025.3547502"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3547502","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3547502","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031427679","display_name":"Bingkun Li","orcid":"https://orcid.org/0009-0006-8319-9458"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Bingkun Li","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0006-8319-9458","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100775323","display_name":"Xueqin Zhang","orcid":"https://orcid.org/0000-0003-3270-0899"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xueqin Zhang","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-3270-0899","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114047496","display_name":"Bo Wang","orcid":"https://orcid.org/0000-0002-1298-8672"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Wang","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-1298-8672","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110685819","display_name":"Chenguang Yang","orcid":"https://orcid.org/0000-0002-1342-5329"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenguang Yang","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-1342-5329","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029337225","display_name":"Yujun Guo","orcid":"https://orcid.org/0000-0003-3289-9471"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yujun Guo","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-3289-9471","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034389405","display_name":"Song Xiao","orcid":"https://orcid.org/0000-0002-2281-0480"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Song Xiao","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-2281-0480","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089985594","display_name":"Wenfu Wei","orcid":"https://orcid.org/0000-0003-2514-2243"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenfu Wei","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-2514-2243","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041737286","display_name":"Guangning Wu","orcid":"https://orcid.org/0000-0002-7920-6129"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangning Wu","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-7920-6129","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5031427679"],"corresponding_institution_ids":["https://openalex.org/I4800084"],"apc_list":null,"apc_paid":null,"fwci":1.7976,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.82683296,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"15"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11006","display_name":"BIM and Construction Integration","score":0.8136000037193298,"subfield":{"id":"https://openalex.org/subfields/2215","display_name":"Building and Construction"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11006","display_name":"BIM and Construction Integration","score":0.8136000037193298,"subfield":{"id":"https://openalex.org/subfields/2215","display_name":"Building and Construction"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/analytic-hierarchy-process","display_name":"Analytic hierarchy process","score":0.8146107792854309},{"id":"https://openalex.org/keywords/topsis","display_name":"TOPSIS","score":0.7987465858459473},{"id":"https://openalex.org/keywords/composite-number","display_name":"Composite number","score":0.5342769622802734},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5240412354469299},{"id":"https://openalex.org/keywords/decision-making-models","display_name":"Decision-making models","score":0.41992810368537903},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41619983315467834},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33545777201652527},{"id":"https://openalex.org/keywords/operations-research","display_name":"Operations research","score":0.30416882038116455},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1790957748889923},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.08511790633201599}],"concepts":[{"id":"https://openalex.org/C87345402","wikidata":"https://www.wikidata.org/wiki/Q485202","display_name":"Analytic hierarchy process","level":2,"score":0.8146107792854309},{"id":"https://openalex.org/C51566761","wikidata":"https://www.wikidata.org/wiki/Q1235853","display_name":"TOPSIS","level":2,"score":0.7987465858459473},{"id":"https://openalex.org/C104779481","wikidata":"https://www.wikidata.org/wiki/Q50707","display_name":"Composite number","level":2,"score":0.5342769622802734},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5240412354469299},{"id":"https://openalex.org/C2888476","wikidata":"https://www.wikidata.org/wiki/Q5249202","display_name":"Decision-making models","level":2,"score":0.41992810368537903},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41619983315467834},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33545777201652527},{"id":"https://openalex.org/C42475967","wikidata":"https://www.wikidata.org/wiki/Q194292","display_name":"Operations research","level":1,"score":0.30416882038116455},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1790957748889923},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.08511790633201599}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3547502","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3547502","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1780143067","display_name":null,"funder_award_id":"52477161","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W2252541962","https://openalex.org/W2289630383","https://openalex.org/W2577292610","https://openalex.org/W2796825843","https://openalex.org/W3004939235","https://openalex.org/W3190927553","https://openalex.org/W3200605425","https://openalex.org/W4206158979","https://openalex.org/W4210707573","https://openalex.org/W4283366554","https://openalex.org/W4285106931","https://openalex.org/W4292972665","https://openalex.org/W4293589224","https://openalex.org/W4297310205","https://openalex.org/W4312521472","https://openalex.org/W4313419586","https://openalex.org/W4375929152","https://openalex.org/W4386736828","https://openalex.org/W4387609092","https://openalex.org/W4388430690","https://openalex.org/W4388819619","https://openalex.org/W4391164341","https://openalex.org/W4392859611","https://openalex.org/W6851559277","https://openalex.org/W6941045808"],"related_works":["https://openalex.org/W3006483227","https://openalex.org/W4235282010","https://openalex.org/W2322700324","https://openalex.org/W2385413488","https://openalex.org/W2355536739","https://openalex.org/W2295782676","https://openalex.org/W2351959113","https://openalex.org/W4381430929","https://openalex.org/W2191080415","https://openalex.org/W2042562112"],"abstract_inverted_index":{"Current":[0],"multidimensional":[1],"parameter":[2],"evaluation":[3,84,93,128],"methods":[4],"for":[5,69,185],"assessing":[6,186],"the":[7,47,51,57,61,67,70,81,95,126,166,187],"aging":[8,96,99,118,140,144,188],"condition":[9,141],"of":[10,50,60,94,134,190],"composite":[11,103,191],"insulators":[12],"face":[13],"challenges":[14],"such":[15],"as":[16],"subjective":[17,48],"bias,":[18],"objective":[19,58],"absolutism,":[20],"and":[21,30,86,107,137,143,182],"data":[22],"correlation":[23,131],"interference,":[24],"leading":[25],"to":[26,75,79,124,163],"unscientific":[27],"weight":[28],"allocation":[29],"inaccurate":[31],"outcomes.":[32],"To":[33],"address":[34],"these":[35],"issues,":[36],"this":[37],"study":[38],"proposes":[39],"a":[40,147,154,170],"multicriteria":[41],"decision-making":[42],"(MCDM)":[43],"model":[44,65,155,178],"that":[45],"combines":[46],"weights":[49,59],"analytic":[52],"hierarchy":[53],"process":[54],"(AHP)":[55],"with":[56],"entropy":[62],"method.":[63],"The":[64],"employs":[66],"technique":[68],"order":[71],"preference":[72],"by":[73],"similarity":[74],"ideal":[76,87],"solution":[77],"(TOPSIS)":[78],"calculate":[80],"distance":[82],"between":[83,139],"indicators":[85,111,121],"positive/negative":[88],"solutions,":[89],"enabling":[90],"precise":[91],"quantitative":[92,110],"condition.":[97],"Accelerated":[98],"experiments":[100],"on":[101],"three":[102],"formulations":[104],"were":[105,112,122],"conducted,":[106],"12":[108],"key":[109],"extracted":[113],"from":[114],"samples":[115],"at":[116],"various":[117],"stages.":[119],"These":[120],"used":[123],"develop":[125],"MCDM-TOPSIS":[127],"model.":[129],"Pearson":[130],"coefficients":[132],"(PCCs)":[133],"-0.95,":[135],"-0.93,":[136],"-0.94":[138],"scores":[142],"time":[145],"demonstrated":[146],"strong":[148],"negative":[149],"correlation.":[150],"Sensitivity":[151],"analysis":[152],"showed":[153],"error":[156],"below":[157],"3%,":[158],"highlighting":[159],"its":[160,175],"robustness.":[161],"Compared":[162],"other":[164],"models,":[165],"proposed":[167],"approach":[168],"achieved":[169],"92%":[171],"accuracy":[172],"rate,":[173],"confirming":[174],"effectiveness.":[176],"This":[177],"provides":[179],"theoretical":[180],"insights":[181],"practical":[183],"guidance":[184],"conditions":[189],"insulators.":[192]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}