{"id":"https://openalex.org/W4408092227","doi":"https://doi.org/10.1109/tim.2025.3547500","title":"Effects of Temperature and Pressure on the Geometry of Micro Wineglass Resonators During the Fabrication Process","display_name":"Effects of Temperature and Pressure on the Geometry of Micro Wineglass Resonators During the Fabrication Process","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4408092227","doi":"https://doi.org/10.1109/tim.2025.3547500"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3547500","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3547500","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5104267583","display_name":"Ang Li","orcid":"https://orcid.org/0009-0000-1797-2656"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ang Li","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0000-1797-2656","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058126788","display_name":"Fuyu Gao","orcid":"https://orcid.org/0000-0002-2129-1842"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fuyu Gao","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-2129-1842","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113120725","display_name":"Shilei Zhang","orcid":"https://orcid.org/0009-0007-5470-4563"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shilei Zhang","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0007-5470-4563","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103420768","display_name":"Junlin Luo","orcid":"https://orcid.org/0009-0004-7496-0730"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junlin Luo","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0004-7496-0730","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081450073","display_name":"Pengfu Lu","orcid":"https://orcid.org/0009-0001-0933-984X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengfu Lu","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0001-0933-984X","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032071026","display_name":"Tianxuan Feng","orcid":"https://orcid.org/0000-0001-8566-8621"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianxuan Feng","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8566-8621","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101593907","display_name":"Xiaobin Xu","orcid":"https://orcid.org/0000-0001-8363-5092"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaobin Xu","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8363-5092","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5104267583"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":7.4448,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.94159641,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11212","display_name":"Cultural Heritage Materials Analysis","score":0.6592000126838684,"subfield":{"id":"https://openalex.org/subfields/1204","display_name":"Archeology"},"field":{"id":"https://openalex.org/fields/12","display_name":"Arts and Humanities"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11212","display_name":"Cultural Heritage Materials Analysis","score":0.6592000126838684,"subfield":{"id":"https://openalex.org/subfields/1204","display_name":"Archeology"},"field":{"id":"https://openalex.org/fields/12","display_name":"Arts and Humanities"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","score":0.6589000225067139,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10188","display_name":"Advanced machining processes and optimization","score":0.6121000051498413,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.8155338764190674},{"id":"https://openalex.org/keywords/resonator","display_name":"Resonator","score":0.7339069247245789},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6372741460800171},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.559637188911438},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3550836145877838},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3444725275039673},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.3374176025390625},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22526761889457703},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.16920995712280273},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15097996592521667}],"concepts":[{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.8155338764190674},{"id":"https://openalex.org/C97126364","wikidata":"https://www.wikidata.org/wiki/Q349669","display_name":"Resonator","level":2,"score":0.7339069247245789},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6372741460800171},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.559637188911438},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3550836145877838},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3444725275039673},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.3374176025390625},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22526761889457703},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.16920995712280273},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15097996592521667},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3547500","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3547500","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2171548065","display_name":null,"funder_award_id":"12404315","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6933151925","display_name":null,"funder_award_id":"12700002024117009","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1956683270","https://openalex.org/W1976038629","https://openalex.org/W2016491153","https://openalex.org/W2076070130","https://openalex.org/W2148876377","https://openalex.org/W2168503722","https://openalex.org/W2303814870","https://openalex.org/W2327039264","https://openalex.org/W2570222914","https://openalex.org/W2610484883","https://openalex.org/W2610659987","https://openalex.org/W2799155014","https://openalex.org/W2800254930","https://openalex.org/W2802151730","https://openalex.org/W2807143605","https://openalex.org/W2886026748","https://openalex.org/W2903584936","https://openalex.org/W2910641551","https://openalex.org/W2980507954","https://openalex.org/W2982482154","https://openalex.org/W3015405771","https://openalex.org/W3024410927","https://openalex.org/W3034585029","https://openalex.org/W3038049121","https://openalex.org/W3041273658","https://openalex.org/W3120860182","https://openalex.org/W3137991811","https://openalex.org/W3181298645","https://openalex.org/W4200074344","https://openalex.org/W4289950788","https://openalex.org/W4360976053","https://openalex.org/W4377235323","https://openalex.org/W4384303932","https://openalex.org/W4386453783","https://openalex.org/W4396906376"],"related_works":["https://openalex.org/W2082914599","https://openalex.org/W2756570351","https://openalex.org/W2059751975","https://openalex.org/W2606427896","https://openalex.org/W2580504822","https://openalex.org/W2007805353","https://openalex.org/W2765328031","https://openalex.org/W2132500134","https://openalex.org/W2030471483","https://openalex.org/W2390622580"],"abstract_inverted_index":{"Micro":[0],"hemispherical":[1],"resonant":[2],"gyroscopes":[3],"(mHRGs)":[4],"are":[5,133],"characterized":[6,91],"by":[7,92],"high":[8,10,164],"precision,":[9],"reliability,":[11],"small":[12],"size,":[13],"low":[14,146],"cost,":[15],"and":[16,35,57,63,86,95,102,112,128,142,149,163],"long":[17],"life,":[18],"thus":[19],"providing":[20],"a":[21,29,68,145,160],"wide":[22],"range":[23],"of":[24,67,79,110,131],"applications.":[25],"The":[26],"resonator":[27,71,83,98,153],"is":[28,39,61,72,100,157],"core":[30],"component":[31],"in":[32],"an":[33],"mHRG,":[34],"its":[36],"fabrication":[37,99],"process":[38,66,94],"crucial":[40],"for":[41,97],"improving":[42],"performance.":[43],"A":[44,88],"finite":[45],"element":[46],"model":[47],"(FEM)":[48],"based":[49],"on":[50,84,114],"three":[51],"fundamental":[52],"conservation":[53],"laws":[54],"using":[55],"thermodynamic":[56],"hydrodynamic":[58],"physical":[59],"fields":[60],"developed,":[62],"the":[64,76,80,103,108,115,119,123,136],"blowing":[65,89],"micro":[69,81],"wineglass":[70,82],"simulated":[73],"to":[74],"obtain":[75],"geometric":[77,116],"dependence":[78],"temperature":[85,111,141],"pressure.":[87],"setup":[90],"simple":[93],"low-cost":[96],"established,":[101],"experimental":[104],"results":[105],"reveal":[106],"that":[107],"effects":[109],"pressure":[113,143],"parameters,":[117,144],"including":[118],"curvature":[120],"radius":[121],"at":[122],"transition":[124],"region,":[125],"shell":[126],"radius,":[127],"thickness":[129],"distribution":[130],"resonators,":[132],"consistent":[134],"with":[135,154,159],"simulation":[137],"analysis.":[138],"Using":[139],"optimized":[140,155],"support":[147],"loss":[148],"reduced":[150],"internal":[151],"stress":[152],"geometry":[156],"produced":[158],"controllable":[161],"rate":[162],"efficiency.":[165]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}