{"id":"https://openalex.org/W4408017464","doi":"https://doi.org/10.1109/tim.2025.3546400","title":"Highly Sensitive CO/O\u2082 Sensor for In Situ Measurement in Industrial Heating Furnace Based on Calibration-Free Wavelength Modulation Spectroscopy","display_name":"Highly Sensitive CO/O\u2082 Sensor for In Situ Measurement in Industrial Heating Furnace Based on Calibration-Free Wavelength Modulation Spectroscopy","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4408017464","doi":"https://doi.org/10.1109/tim.2025.3546400"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3546400","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3546400","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102960398","display_name":"Chao Huang","orcid":"https://orcid.org/0009-0005-1207-8256"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Huang","raw_affiliation_strings":["Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing, China","Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology & Instruments, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0005-1207-8256","affiliations":[{"raw_affiliation_string":"Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology & Instruments, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017194938","display_name":"Xiangchen Kong","orcid":"https://orcid.org/0009-0002-9234-5614"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangchen Kong","raw_affiliation_strings":["Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing, China","Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology & Instruments, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0002-9234-5614","affiliations":[{"raw_affiliation_string":"Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology & Instruments, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109375627","display_name":"Chun Li","orcid":"https://orcid.org/0009-0009-2610-4661"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chun Li","raw_affiliation_strings":["Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing, China","Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology & Instruments, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0009-2610-4661","affiliations":[{"raw_affiliation_string":"Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology & Instruments, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100756626","display_name":"Yan Li","orcid":"https://orcid.org/0000-0003-0207-9739"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan Li","raw_affiliation_strings":["Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing, China","Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology & Instruments, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-0207-9739","affiliations":[{"raw_affiliation_string":"Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology & Instruments, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006163301","display_name":"Haoyun Wei","orcid":"https://orcid.org/0000-0003-1859-4874"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haoyun Wei","raw_affiliation_strings":["Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing, China","Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology & Instruments, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-1859-4874","affiliations":[{"raw_affiliation_string":"Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology & Instruments, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I99065089"],"apc_list":null,"apc_paid":null,"fwci":1.3857,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.77197547,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","score":0.9710000157356262,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","score":0.9710000157356262,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9682000279426575,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14249","display_name":"Water Quality Monitoring and Analysis","score":0.9448000192642212,"subfield":{"id":"https://openalex.org/subfields/2311","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6796717643737793},{"id":"https://openalex.org/keywords/spectroscopy","display_name":"Spectroscopy","score":0.6175372004508972},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5986610054969788},{"id":"https://openalex.org/keywords/wavelength","display_name":"Wavelength","score":0.5218345522880554},{"id":"https://openalex.org/keywords/in-situ","display_name":"In situ","score":0.4803089499473572},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.46885237097740173},{"id":"https://openalex.org/keywords/modulation","display_name":"Modulation (music)","score":0.4677557945251465},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.42859211564064026},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.42361658811569214},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3652358055114746},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.2486136555671692},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14799654483795166}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6796717643737793},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.6175372004508972},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5986610054969788},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.5218345522880554},{"id":"https://openalex.org/C2777822432","wikidata":"https://www.wikidata.org/wiki/Q216681","display_name":"In situ","level":2,"score":0.4803089499473572},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.46885237097740173},{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.4677557945251465},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.42859211564064026},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.42361658811569214},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3652358055114746},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2486136555671692},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14799654483795166},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3546400","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3546400","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1730176701","display_name":null,"funder_award_id":"62275138","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2636345437","display_name":null,"funder_award_id":"2022YFC2204001","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G6437225150","display_name":null,"funder_award_id":"2022YFC2204001","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W1967440217","https://openalex.org/W1967749618","https://openalex.org/W1971108535","https://openalex.org/W1976680513","https://openalex.org/W1987083486","https://openalex.org/W1997608408","https://openalex.org/W2009307261","https://openalex.org/W2010579662","https://openalex.org/W2011666814","https://openalex.org/W2020952718","https://openalex.org/W2024212284","https://openalex.org/W2028603517","https://openalex.org/W2057837754","https://openalex.org/W2073190082","https://openalex.org/W2088095612","https://openalex.org/W2088433563","https://openalex.org/W2089238781","https://openalex.org/W2093384665","https://openalex.org/W2118423259","https://openalex.org/W2121692976","https://openalex.org/W2290927243","https://openalex.org/W2515205986","https://openalex.org/W2552037068","https://openalex.org/W2591682036","https://openalex.org/W2760212797","https://openalex.org/W2791568701","https://openalex.org/W2796705419","https://openalex.org/W2884799384","https://openalex.org/W3006437906","https://openalex.org/W3008956712","https://openalex.org/W3047138378","https://openalex.org/W3090185439","https://openalex.org/W3105765900","https://openalex.org/W3133477526","https://openalex.org/W3169971944","https://openalex.org/W3192591766","https://openalex.org/W4200599926","https://openalex.org/W4205562484","https://openalex.org/W4226383397","https://openalex.org/W4285065798","https://openalex.org/W4362663414"],"related_works":["https://openalex.org/W2335669366","https://openalex.org/W2582639636","https://openalex.org/W4362710790","https://openalex.org/W2071845691","https://openalex.org/W1969285554","https://openalex.org/W2334792489","https://openalex.org/W2090580684","https://openalex.org/W4399208091","https://openalex.org/W2112572293","https://openalex.org/W2134474334"],"abstract_inverted_index":{"The":[0,64,116],"continuous":[1,60],"catalytic":[2,18],"reforming":[3,61],"heating":[4,62,114,189],"furnace":[5,190],"is":[6,33],"a":[7,42,57,73,90,93,108],"large-scale":[8,59,113],"system":[9],"that":[10],"provides":[11],"consistent":[12],"and":[13,23,30,72,92,124,128,151,199],"stable":[14],"heat":[15],"support":[16],"for":[17,35,54,111,126,165],"reactions.":[19],"Real-time,":[20],"in":[21,56,141,148,171],"situ":[22,142],"simultaneous":[24],"measurement":[25],"of":[26,82,121,160,180],"carbon":[27],"monoxide":[28],"(CO)":[29],"oxygen":[31],"(O2)":[32],"essential":[34],"optimizing":[36],"its":[37],"performance.":[38],"Here,":[39],"we":[40],"present":[41],"highly":[43],"sensitive":[44],"CO/O2":[45],"sensor":[46,105,117,186],"based":[47],"on":[48],"calibration-free":[49],"wavelength":[50],"modulation":[51],"spectroscopy":[52],"(WMS)":[53],"application":[55],"10-m-long":[58],"furnace.":[63],"first":[65],"harmonic-normalized":[66],"second":[67],"harmonic":[68],"WMS":[69],"(WMS-2f/1f)":[70],"technique":[71],"time-division-multiplexed":[74],"strategy":[75],"were":[76],"employed":[77],"to":[78,187,193],"address":[79],"the":[80,99,104,145,177,181],"challenges":[81],"harsh":[83],"industrial":[84],"environments.":[85],"A":[86],"single-ended":[87],"configuration":[88],"with":[89],"retroreflector":[91],"through-hole":[94],"parabolic":[95],"mirror":[96],"effectively":[97],"doubled":[98],"optical":[100],"path":[101],"while":[102],"simplifying":[103],"setup,":[106],"providing":[107],"novel":[109],"solution":[110],"monitoring":[112,143],"furnaces.":[115],"demonstrated":[118],"detection":[119],"limits":[120],"0.3":[122],"ppm":[123],"0.04%":[125],"CO":[127,150],"O2,":[129],"respectively,":[130],"achieving":[131],"high":[132,135],"sensitivity":[133],"at":[134],"temperature":[136],"around":[137],"850":[138],"K.":[139],"Long-term":[140],"confirmed":[144],"sensor\u2019s":[146],"reliability":[147],"detecting":[149],"O2":[152],"concentrations.":[153],"Observational":[154],"data":[155],"further":[156],"revealed":[157],"several":[158],"instances":[159],"incomplete":[161],"combustion":[162],"process":[163],"lasting":[164],"1\u20132":[166],"h,":[167],"caused":[168],"by":[169],"fluctuations":[170],"fuel":[172],"supply.":[173],"These":[174],"findings":[175],"highlight":[176],"significant":[178],"potential":[179],"proposed":[182],"laser":[183],"absorption-based":[184],"gas":[185],"enhance":[188],"control,":[191],"contributing":[192],"improved":[194],"economic":[195],"efficiency,":[196],"environmental":[197],"protection,":[198],"operational":[200],"safety.":[201]},"counts_by_year":[{"year":2026,"cited_by_count":3}],"updated_date":"2025-12-22T23:10:17.713674","created_date":"2025-02-28T00:00:00"}