{"id":"https://openalex.org/W4407937751","doi":"https://doi.org/10.1109/tim.2025.3545202","title":"Circular Dichroism Analysis and Ellipticity Measurement in SERF Atom Ensemble","display_name":"Circular Dichroism Analysis and Ellipticity Measurement in SERF Atom Ensemble","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4407937751","doi":"https://doi.org/10.1109/tim.2025.3545202"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3545202","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3545202","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053660929","display_name":"Haoran Lv","orcid":"https://orcid.org/0000-0002-1120-4645"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Haoran Lv","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Haidian, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Haidian, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058837665","display_name":"Bozheng Xing","orcid":"https://orcid.org/0000-0003-1820-9091"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bozheng Xing","raw_affiliation_strings":["Hangzhou Institute of Extremely-Weak Magnetic Field Major National Science and Technology Infrastructure, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"Hangzhou Institute of Extremely-Weak Magnetic Field Major National Science and Technology Infrastructure, Hangzhou, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058414282","display_name":"Xiujie Fang","orcid":"https://orcid.org/0000-0002-1389-6593"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiujie Fang","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Haidian, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Haidian, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038682974","display_name":"Danyue Ma","orcid":"https://orcid.org/0000-0002-1633-9012"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Danyue Ma","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Haidian, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Haidian, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054099755","display_name":"Hongtao Lu","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongtao Lu","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Haidian, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Haidian, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5053660929"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":5.0065,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.94338253,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11177","display_name":"Spectroscopy and Quantum Chemical Studies","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11177","display_name":"Spectroscopy and Quantum Chemical Studies","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11993","display_name":"Atomic and Subatomic Physics Research","score":0.982699990272522,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/circular-dichroism","display_name":"Circular dichroism","score":0.5185216665267944},{"id":"https://openalex.org/keywords/atom","display_name":"Atom (system on chip)","score":0.5159381031990051},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5072047710418701},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3422943353652954},{"id":"https://openalex.org/keywords/atomic-physics","display_name":"Atomic physics","score":0.33540913462638855},{"id":"https://openalex.org/keywords/crystallography","display_name":"Crystallography","score":0.1845760941505432},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.1722957193851471},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.16300815343856812}],"concepts":[{"id":"https://openalex.org/C133571119","wikidata":"https://www.wikidata.org/wiki/Q899102","display_name":"Circular dichroism","level":2,"score":0.5185216665267944},{"id":"https://openalex.org/C58312451","wikidata":"https://www.wikidata.org/wiki/Q4817200","display_name":"Atom (system on chip)","level":2,"score":0.5159381031990051},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5072047710418701},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3422943353652954},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.33540913462638855},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.1845760941505432},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.1722957193851471},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.16300815343856812},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3545202","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3545202","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2322938847","display_name":null,"funder_award_id":"2024M754055","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320321543","display_name":"China Postdoctoral Science Foundation","ror":"https://ror.org/0426zh255"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1507237916","https://openalex.org/W1963919378","https://openalex.org/W1964104555","https://openalex.org/W1970446059","https://openalex.org/W1982966275","https://openalex.org/W1991525340","https://openalex.org/W1998320990","https://openalex.org/W2000198282","https://openalex.org/W2016718650","https://openalex.org/W2019820057","https://openalex.org/W2024814797","https://openalex.org/W2030766566","https://openalex.org/W2034978403","https://openalex.org/W2036292188","https://openalex.org/W2077493497","https://openalex.org/W2077767829","https://openalex.org/W2131775935","https://openalex.org/W2494964211","https://openalex.org/W2590581529","https://openalex.org/W2766839228","https://openalex.org/W2791548393","https://openalex.org/W2883424472","https://openalex.org/W2897318428","https://openalex.org/W3119286944","https://openalex.org/W4205312974","https://openalex.org/W4205368735","https://openalex.org/W4205820652","https://openalex.org/W4206209713","https://openalex.org/W4285305818","https://openalex.org/W4386813356","https://openalex.org/W4400985423","https://openalex.org/W4404688600","https://openalex.org/W6634875939"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036","https://openalex.org/W2271181815"],"abstract_inverted_index":{"In":[0,21,44],"the":[1,4,16,33,51,62,102,122,147,155,162,165,169,188,191,195],"research":[2,146,201],"of":[3,15,105,142,149,181,187],"interaction":[5,34,63,123,163],"between":[6,35,64,124,164,190],"light":[7,137],"and":[8,18,38,49,58,69,111,127,154,168,194,208],"atoms,":[9],"ellipticity":[10,29,86,106,159],"is":[11,133,138,174,179,198],"an":[12,81,175],"important":[13],"characterization":[14],"pump":[17],"absorption":[19],"rates.":[20],"previous":[22],"researches,":[23],"it":[24],"was":[25],"generally":[26],"believed":[27],"that":[28,121,158],"only":[30],"originated":[31],"from":[32,107,114],"magnetic":[36,65,125,166],"fields":[37],"polarized":[39,134],"alkali":[40,70,128,170],"metal":[41,71,129,171],"atomic":[42,72,130,172],"ensembles.":[43],"this":[45],"article,":[46],"we":[47,100,145],"derive":[48],"analyze":[50],"circular":[52,108,115],"dichroism":[53,109],"based":[54,87],"on":[55,88],"density":[56],"matrix":[57],"Maxwell":[59],"equations":[60],"during":[61],"fields,":[66],"probe":[67,136],"light,":[68],"ensembles":[73],"in":[74],"spin-exchange":[75],"relaxation-free":[76],"(SERF)":[77],"regime.":[78],"We":[79],"construct":[80],"optical":[82],"path":[83],"for":[84],"measuring":[85],"photo":[89],"elastic":[90],"modulator":[91],"(PEM)":[92],"to":[93,152,205],"measure":[94],"ellipticity.":[95,143],"Under":[96],"different":[97],"experimental":[98,192],"conditions,":[99],"compare":[101],"measurement":[103],"results":[104,119,156,193],"effect":[110],"rotation":[112,150],"angle":[113,151],"birefringence":[116],"effect.":[117],"The":[118,184],"indicates":[120,157],"field":[126,167],"ensemble":[131,173],"which":[132,178],"by":[135,161],"a":[139],"new":[140],"source":[141],"Then,":[144],"ratio":[148],"ellipticity,":[153],"generated":[160],"intrinsic":[176],"characteristic,":[177],"independent":[180],"external":[182],"conditions.":[183],"confidence":[185],"level":[186],"fitting":[189],"theoretical":[196],"equation":[197],"99.7%.":[199],"This":[200],"can":[202],"be":[203],"applied":[204],"SERF":[206],"magnetometers":[207],"co-magnetometers.":[209]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3}],"updated_date":"2026-03-28T08:17:26.163206","created_date":"2025-10-10T00:00:00"}