{"id":"https://openalex.org/W4407566427","doi":"https://doi.org/10.1109/tim.2025.3542148","title":"A Simultaneous Detection and Tolerant Control Method for Current- and Speed-Sensor Faults in Induction Motor","display_name":"A Simultaneous Detection and Tolerant Control Method for Current- and Speed-Sensor Faults in Induction Motor","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4407566427","doi":"https://doi.org/10.1109/tim.2025.3542148"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3542148","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3542148","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054254540","display_name":"Shuiqing Xu","orcid":"https://orcid.org/0000-0003-3081-3726"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shuiqing Xu","raw_affiliation_strings":["School of State Key Laboratory of High-Efficiency and High-Quality Conversion for Electric Power, Hefei University of Technology, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of State Key Laboratory of High-Efficiency and High-Quality Conversion for Electric Power, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065086896","display_name":"Jiaxin Wang","orcid":"https://orcid.org/0000-0001-9007-2259"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiaxin Wang","raw_affiliation_strings":["School of State Key Laboratory of High-Efficiency and High-Quality Conversion for Electric Power, Hefei University of Technology, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of State Key Laboratory of High-Efficiency and High-Quality Conversion for Electric Power, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110852824","display_name":"H Chai","orcid":"https://orcid.org/0009-0003-7391-943X"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Chai","raw_affiliation_strings":["School of State Key Laboratory of High-Efficiency and High-Quality Conversion for Electric Power, Hefei University of Technology, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of State Key Laboratory of High-Efficiency and High-Quality Conversion for Electric Power, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103037128","display_name":"Yi Chai","orcid":"https://orcid.org/0000-0002-8637-8682"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Chai","raw_affiliation_strings":["School of Electrical Engineering and Automation, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108050907","display_name":"Wei Xing Zheng","orcid":"https://orcid.org/0000-0002-0572-5938"},"institutions":[{"id":"https://openalex.org/I63525965","display_name":"Western Sydney University","ror":"https://ror.org/03t52dk35","country_code":"AU","type":"education","lineage":["https://openalex.org/I63525965"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Wei Xing Zheng","raw_affiliation_strings":["School of Computer, Data and Mathematical Sciences, Western Sydney University, Penrith, NSW, Australia"],"affiliations":[{"raw_affiliation_string":"School of Computer, Data and Mathematical Sciences, Western Sydney University, Penrith, NSW, Australia","institution_ids":["https://openalex.org/I63525965"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5054254540"],"corresponding_institution_ids":["https://openalex.org/I16365422"],"apc_list":null,"apc_paid":null,"fwci":0.7151,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.64131471,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.9700999855995178,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.9700999855995178,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9639999866485596,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13093","display_name":"Electric Power Systems and Control","score":0.9532999992370605,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/induction-motor","display_name":"Induction motor","score":0.7831419110298157},{"id":"https://openalex.org/keywords/current-sensor","display_name":"Current sensor","score":0.5248268246650696},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.515291690826416},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5021994113922119},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4439869523048401},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4395657479763031},{"id":"https://openalex.org/keywords/machine-control","display_name":"Machine control","score":0.4139099419116974},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.3705376386642456},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.33597439527511597},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3319869637489319},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.3033973276615143},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.23804593086242676},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21091896295547485},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.1866828203201294},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1054193377494812}],"concepts":[{"id":"https://openalex.org/C80962145","wikidata":"https://www.wikidata.org/wiki/Q207450","display_name":"Induction motor","level":3,"score":0.7831419110298157},{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.5248268246650696},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.515291690826416},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5021994113922119},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4439869523048401},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4395657479763031},{"id":"https://openalex.org/C2777718703","wikidata":"https://www.wikidata.org/wiki/Q6723706","display_name":"Machine control","level":2,"score":0.4139099419116974},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.3705376386642456},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.33597439527511597},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3319869637489319},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.3033973276615143},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.23804593086242676},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21091896295547485},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.1866828203201294},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1054193377494812}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3542148","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3542148","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G1556994328","display_name":null,"funder_award_id":"61803140","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8892919414","display_name":null,"funder_award_id":"U2034209","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G898493330","display_name":null,"funder_award_id":"62273128","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1984786788","https://openalex.org/W2013315179","https://openalex.org/W2087857372","https://openalex.org/W2414889553","https://openalex.org/W2557219108","https://openalex.org/W2595086263","https://openalex.org/W2597057696","https://openalex.org/W2621628992","https://openalex.org/W2625360904","https://openalex.org/W2739701033","https://openalex.org/W2753174481","https://openalex.org/W2891512198","https://openalex.org/W2912655713","https://openalex.org/W2956467153","https://openalex.org/W2997344151","https://openalex.org/W3013177357","https://openalex.org/W3024005278","https://openalex.org/W3036378184","https://openalex.org/W3109390845","https://openalex.org/W3134715455","https://openalex.org/W3164444015","https://openalex.org/W3194661270","https://openalex.org/W3214823476","https://openalex.org/W4220673407","https://openalex.org/W4285253639","https://openalex.org/W4285282366","https://openalex.org/W4313030247","https://openalex.org/W4361792082","https://openalex.org/W4364321982","https://openalex.org/W4367597604","https://openalex.org/W4376607451","https://openalex.org/W4381785647","https://openalex.org/W4384080240","https://openalex.org/W4393140324","https://openalex.org/W4398152734","https://openalex.org/W4399146420","https://openalex.org/W4400526127","https://openalex.org/W4403464690","https://openalex.org/W4404238696"],"related_works":["https://openalex.org/W1644808516","https://openalex.org/W2951960179","https://openalex.org/W2004189302","https://openalex.org/W2374401487","https://openalex.org/W2991569731","https://openalex.org/W2047091966","https://openalex.org/W1841845823","https://openalex.org/W2001663813","https://openalex.org/W2355937260","https://openalex.org/W4389695262"],"abstract_inverted_index":{"To":[0],"enable":[1],"simultaneous":[2,151],"fault":[3,70,89,95],"detection":[4,90],"and":[5,12,43,48,76,106,141,153,156,174],"fault-tolerant":[6,143],"control":[7,102,144],"for":[8,83,103,145],"current":[9],"sensor":[10,14,69],"(CS)":[11],"speed":[13],"(SS)":[15],"in":[16,139],"induction":[17],"motors":[18],"(IMs),":[19],"this":[20],"article":[21],"proposes":[22],"a":[23,28,35,58,77,126],"novel":[24,78],"method":[25,138,162],"based":[26],"on":[27,125],"reduced-order":[29,79],"sliding":[30],"mode":[31],"observer":[32],"(SMO).":[33],"First,":[34],"model":[36],"of":[37,67,135],"the":[38,68,73,84,94,99,104,113,117,133,136,161],"IM":[39],"system":[40,51,59],"incorporating":[41],"CS":[42,105,147,152,158],"SS":[44,107,149,154],"faults":[45],"is":[46,52,61,81,91,108,123],"established,":[47],"an":[49],"augmented":[50],"constructed":[53],"through":[54],"state":[55,74],"augmentation.":[56],"Then,":[57],"transformation":[60],"applied":[62],"to":[63],"achieve":[64],"complete":[65],"decoupling":[66],"variables":[71],"from":[72,98],"variables,":[75],"SMO":[80],"designed":[82],"decoupled":[85],"system.":[86],"Subsequently,":[87],"accurate":[88],"performed":[92],"using":[93],"estimates":[96],"obtained":[97],"observer.":[100],"Fault-tolerant":[101],"then":[109],"realized":[110],"by":[111],"compensating":[112],"measured":[114],"values":[115],"with":[116],"estimated":[118],"faults.":[119,159],"Finally,":[120],"experimental":[121],"verification":[122],"conducted":[124],"hardware-in-the-loop":[127],"(HIL)":[128],"platform.":[129],"The":[130],"results":[131],"demonstrate":[132],"effectiveness":[134],"proposed":[137],"detecting":[140],"implementing":[142],"single":[146],"or":[148],"faults,":[150,155],"multiple":[157],"Additionally,":[160],"shows":[163],"robust":[164],"performance":[165],"under":[166],"adverse":[167],"conditions,":[168],"such":[169],"as":[170],"dc-side":[171],"voltage":[172],"fluctuations":[173],"sudden":[175],"load":[176],"torque":[177],"variations.":[178]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}