{"id":"https://openalex.org/W4407566418","doi":"https://doi.org/10.1109/tim.2025.3542111","title":"Soft Fault Location and Imaging Using Residual Voltage Inversion in Cable Networks","display_name":"Soft Fault Location and Imaging Using Residual Voltage Inversion in Cable Networks","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4407566418","doi":"https://doi.org/10.1109/tim.2025.3542111"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3542111","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3542111","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103131456","display_name":"Chuanxu Chen","orcid":"https://orcid.org/0009-0007-7112-4149"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chuanxu Chen","raw_affiliation_strings":["School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012805347","display_name":"Quansheng Guan","orcid":"https://orcid.org/0000-0001-6159-3194"},"institutions":[{"id":"https://openalex.org/I157773358","display_name":"Sun Yat-sen University","ror":"https://ror.org/0064kty71","country_code":"CN","type":"education","lineage":["https://openalex.org/I157773358"]},{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Quansheng Guan","raw_affiliation_strings":["School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China","School of Intelligent Systems Engineering, Sun Yat-sen University, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]},{"raw_affiliation_string":"School of Intelligent Systems Engineering, Sun Yat-sen University, Guangzhou, China","institution_ids":["https://openalex.org/I157773358"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026966155","display_name":"Quanxue Guan","orcid":"https://orcid.org/0000-0002-1379-620X"},"institutions":[{"id":"https://openalex.org/I157773358","display_name":"Sun Yat-sen University","ror":"https://ror.org/0064kty71","country_code":"CN","type":"education","lineage":["https://openalex.org/I157773358"]},{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Quanxue Guan","raw_affiliation_strings":["School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China","School of Intelligent Systems Engineering, Sun Yat-sen University, Guangzhou, China","School of Intelligent Systems Engineering, Sun Yat-Sen University, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]},{"raw_affiliation_string":"School of Intelligent Systems Engineering, Sun Yat-sen University, Guangzhou, China","institution_ids":["https://openalex.org/I157773358"]},{"raw_affiliation_string":"School of Intelligent Systems Engineering, Sun Yat-Sen University, Guangzhou, China","institution_ids":["https://openalex.org/I157773358"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100641353","display_name":"Xin Jin","orcid":"https://orcid.org/0009-0001-7592-0448"},"institutions":[{"id":"https://openalex.org/I74872605","display_name":"China Southern Power Grid (China)","ror":"https://ror.org/03hkh9419","country_code":"CN","type":"company","lineage":["https://openalex.org/I74872605"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Jin","raw_affiliation_strings":["Electric Power Research Institute, China Southern Power Grid Company Ltd., Guangzhou, China","Electric Power Research Institute, China Southern Power Grid Co., Ltd, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"Electric Power Research Institute, China Southern Power Grid Company Ltd., Guangzhou, China","institution_ids":["https://openalex.org/I74872605"]},{"raw_affiliation_string":"Electric Power Research Institute, China Southern Power Grid Co., Ltd, Guangzhou, China","institution_ids":["https://openalex.org/I74872605"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101644114","display_name":"Zhan Shi","orcid":"https://orcid.org/0009-0005-5148-1902"},"institutions":[{"id":"https://openalex.org/I74872605","display_name":"China Southern Power Grid (China)","ror":"https://ror.org/03hkh9419","country_code":"CN","type":"company","lineage":["https://openalex.org/I74872605"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhan Shi","raw_affiliation_strings":["Electric Power Dispatch and Control Center, Guangdong Power Grid Company Ltd., Guangzhou, China","Electric Power Dispatch & Control Center, Guangdong Power Grid Co., Ltd, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"Electric Power Dispatch and Control Center, Guangdong Power Grid Company Ltd., Guangzhou, China","institution_ids":["https://openalex.org/I74872605"]},{"raw_affiliation_string":"Electric Power Dispatch & Control Center, Guangdong Power Grid Co., Ltd, Guangzhou, China","institution_ids":["https://openalex.org/I74872605"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5103131456"],"corresponding_institution_ids":["https://openalex.org/I90610280"],"apc_list":null,"apc_paid":null,"fwci":1.3947,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.79898783,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"16"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9872999787330627,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9765999913215637,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.6434290409088135},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5313392877578735},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41813576221466064},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41648998856544495},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31192708015441895}],"concepts":[{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.6434290409088135},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5313392877578735},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41813576221466064},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41648998856544495},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31192708015441895},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3542111","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3542111","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2932055691","display_name":null,"funder_award_id":"2023B0909050006","funder_id":"https://openalex.org/F4320329801","funder_display_name":"Shenzhen Research and Development Program"},{"id":"https://openalex.org/G5155853250","display_name":null,"funder_award_id":"2023A0505050097","funder_id":"https://openalex.org/F4320335795","funder_display_name":"Science and Technology Planning Project of Guangdong Province"}],"funders":[{"id":"https://openalex.org/F4320329801","display_name":"Shenzhen Research and Development Program","ror":null},{"id":"https://openalex.org/F4320335795","display_name":"Science and Technology Planning Project of Guangdong Province","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1512208174","https://openalex.org/W2006659608","https://openalex.org/W2015962916","https://openalex.org/W2144781999","https://openalex.org/W2148580400","https://openalex.org/W2156859338","https://openalex.org/W2203266581","https://openalex.org/W2462162997","https://openalex.org/W2920331131","https://openalex.org/W3003291827","https://openalex.org/W3016541735","https://openalex.org/W3159189225","https://openalex.org/W3178964350","https://openalex.org/W3195786547","https://openalex.org/W3202511179","https://openalex.org/W4206399587","https://openalex.org/W4240884267","https://openalex.org/W4285059590","https://openalex.org/W4300188899","https://openalex.org/W4360993797","https://openalex.org/W4387448906"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2560215812","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2949601986"],"abstract_inverted_index":{"Locations":[0],"and":[1,22,85,133,171,195,199,208,223],"parameters":[2,41],"monitoring":[3],"for":[4,63,91,173],"soft":[5,74,175,188],"faults":[6,17,37,59,189],"in":[7,42,71],"a":[8,43,99],"cable":[9,45,111,151],"network":[10,112,152],"is":[11,69],"of":[12,26,54,109,149,167,186,225],"importance":[13],"to":[14,47,81,87,105,143,161,219],"prevent":[15],"hard":[16],"at":[18,130],"an":[19,191],"early":[20],"stage":[21],"maintain":[23],"the":[24,27,39,49,52,55,65,72,107,110,118,123,126,131,137,141,145,150,163,168,184,213,221],"stability":[25],"power":[28],"system.":[29],"The":[30,76,154,177],"existing":[31],"fault":[32,83],"detection":[33],"methods":[34],"often":[35],"identify":[36],"using":[38],"fixed":[40],"reference":[44,56],"model":[46,57,61,77,108,156],"locate":[48],"faults.":[50,75,92,115,176],"However,":[51],"changes":[53],"by":[58,136],"bring":[60],"mismatch,":[62],"example,":[64],"signal":[66],"propagation":[67],"speed":[68],"different":[70],"line-like":[73,174,187],"mismatch":[78],"will":[79],"lead":[80],"inaccurate":[82],"location":[84],"not":[86],"mention":[88],"parameter":[89,147],"imaging":[90,166,202],"To":[93],"this":[94,96],"end,":[95],"article":[97],"proposes":[98],"residual":[100,119],"voltage":[101],"inversion":[102],"(RVI)":[103],"method":[104],"learn":[106],"with":[113,190,203],"unknown":[114],"RVI":[116,182],"uses":[117],"voltages,":[120],"that":[121,181],"is,":[122],"difference":[124],"between":[125],"scattering":[127],"voltages":[128],"measured":[129],"ports":[132],"those":[134],"generated":[135],"current":[138],"model,":[139],"as":[140],"gradient":[142],"update":[144],"multiple":[146],"distributions":[148],"iteratively.":[153],"learned":[155],"can":[157],"then":[158],"be":[159],"used":[160],"calculate":[162],"precise":[164],"location,":[165],"length,":[169],"capacitance,":[170],"resistance":[172],"simulation":[178],"results":[179],"show":[180],"locates":[183],"range":[185],"accuracy":[192],"over":[193],"90%,":[194],"achieves":[196],"insulation":[197],"layer":[198],"core":[200],"conductor":[201],"accuracies":[204],"larger":[205],"than":[206],"95%":[207],"80%,":[209],"respectively.":[210],"In":[211],"addition,":[212],"experimental":[214],"tests":[215],"are":[216],"carried":[217],"out":[218],"verify":[220],"feasibility":[222],"performance":[224],"RVI.":[226]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}