{"id":"https://openalex.org/W4407451612","doi":"https://doi.org/10.1109/tim.2025.3541806","title":"High-Performance Rotational Shearography System Based on Dove Prism for Nondestructive Testing","display_name":"High-Performance Rotational Shearography System Based on Dove Prism for Nondestructive Testing","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4407451612","doi":"https://doi.org/10.1109/tim.2025.3541806"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3541806","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3541806","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083398254","display_name":"Yanfeng Yao","orcid":"https://orcid.org/0000-0002-3510-2491"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanfeng Yao","raw_affiliation_strings":["School of Instrument Science and Optoelectronic Engineering, Hefei University of Technology, Hefei, China","School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-3510-2491","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Optoelectronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106977764","display_name":"Zhuoyan Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhuoyan Wang","raw_affiliation_strings":["School of Instrument Science and Optoelectronic Engineering, Hefei University of Technology, Hefei, China","School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0009-0004-1870-3844","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Optoelectronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112125972","display_name":"Peizheng Yan","orcid":"https://orcid.org/0009-0009-2682-1302"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peizheng Yan","raw_affiliation_strings":["School of Instrument Science and Optoelectronic Engineering, Hefei University of Technology, Hefei, China","School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0009-0009-2682-1302","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Optoelectronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Mohan Ding","orcid":"https://orcid.org/0009-0008-6383-3719"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mohan Ding","raw_affiliation_strings":["School of Instrument Science and Optoelectronic Engineering, Hefei University of Technology, Hefei, China","School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0009-0008-6383-3719","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Optoelectronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100643754","display_name":"Yonghong Wang","orcid":"https://orcid.org/0000-0003-1232-8305"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]},{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yonghong Wang","raw_affiliation_strings":["School of Instrument Science and Optoelectronic Engineering and Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei, China","School of Instrument Science and Optoelectronic Engineering and the Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-1232-8305","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Optoelectronic Engineering and Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422","https://openalex.org/I126520041"]},{"raw_affiliation_string":"School of Instrument Science and Optoelectronic Engineering and the Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7655,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.67000539,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9531999826431274,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9531999826431274,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9257000088691711,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11569","display_name":"Optical Coherence Tomography Applications","score":0.9222000241279602,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/shearography","display_name":"Shearography","score":0.7616884112358093},{"id":"https://openalex.org/keywords/prism","display_name":"Prism","score":0.5205619931221008},{"id":"https://openalex.org/keywords/combing","display_name":"Combing","score":0.4736907482147217},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4145227074623108},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39005035161972046},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38028573989868164},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.33290910720825195},{"id":"https://openalex.org/keywords/interferometry","display_name":"Interferometry","score":0.2049245834350586},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19140365719795227}],"concepts":[{"id":"https://openalex.org/C138246806","wikidata":"https://www.wikidata.org/wiki/Q638475","display_name":"Shearography","level":3,"score":0.7616884112358093},{"id":"https://openalex.org/C67666897","wikidata":"https://www.wikidata.org/wiki/Q165896","display_name":"Prism","level":2,"score":0.5205619931221008},{"id":"https://openalex.org/C2778952367","wikidata":"https://www.wikidata.org/wiki/Q3491532","display_name":"Combing","level":2,"score":0.4736907482147217},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4145227074623108},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39005035161972046},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38028573989868164},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.33290910720825195},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.2049245834350586},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19140365719795227},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3541806","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3541806","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.7900000214576721}],"awards":[{"id":"https://openalex.org/G1738078862","display_name":null,"funder_award_id":"52375536","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2555900132","display_name":null,"funder_award_id":"52375535","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G365687088","display_name":null,"funder_award_id":"20223BBE51010","funder_id":"https://openalex.org/F4320327780","funder_display_name":"Key Research and Development Program of Jiangxi Province"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320327780","display_name":"Key Research and Development Program of Jiangxi Province","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W2020429710","https://openalex.org/W2021796992","https://openalex.org/W2035206284","https://openalex.org/W2068404824","https://openalex.org/W2077091799","https://openalex.org/W2080717545","https://openalex.org/W2887216438","https://openalex.org/W2889426815","https://openalex.org/W2946860500","https://openalex.org/W2947699124","https://openalex.org/W3083838810","https://openalex.org/W3103068669","https://openalex.org/W3114785185","https://openalex.org/W3172199855","https://openalex.org/W4283644514","https://openalex.org/W4285162586","https://openalex.org/W4286254650","https://openalex.org/W4360994014","https://openalex.org/W4383500772","https://openalex.org/W4394010999","https://openalex.org/W4394595945"],"related_works":["https://openalex.org/W2382950503","https://openalex.org/W2374316087","https://openalex.org/W2058186977","https://openalex.org/W118328020","https://openalex.org/W2037081915","https://openalex.org/W2023964449","https://openalex.org/W1999948698","https://openalex.org/W2157705994","https://openalex.org/W2744035829","https://openalex.org/W2037383605"],"abstract_inverted_index":{"Digital":[0],"shearography":[1,72],"(DS)":[2],"is":[3,116],"a":[4,69,81,94,142],"nondestructive":[5],"testing":[6],"method":[7],"that":[8,74],"provides":[9],"full-field":[10],"measurement,":[11,65],"with":[12,79],"its":[13,22,179],"sensitive":[14],"direction":[15,20],"closely":[16],"related":[17,24],"to":[18,25,47,109,122,139,152],"shearing":[19,27,91,111],"and":[21,52,62,173,184],"sensitivity":[23],"the":[26,33,104,110,119,124,131,137,154,157,166],"amount.":[28],"Conventional":[29],"single-direction":[30],"DS":[31,45],"carries":[32],"risk":[34],"of":[35,38,60,106,133,145,156],"missed":[36,58,100],"detection":[37,59,78],"defects,":[39],"while":[40],"conventional":[41],"two-":[42],"or":[43],"multidirectional":[44],"struggles":[46],"balance":[48],"both":[49,182],"rapid":[50],"measurement":[51,54,120,161],"high-quality":[53],"results.":[55],"To":[56],"avoid":[57],"defects":[61],"achieve":[63],"high-performance":[64],"we":[66],"have":[67],"designed":[68],"novel":[70],"rotational":[71,90],"system":[73,88,115,121,138],"can":[75],"perform":[76],"defect":[77,107,174],"just":[80],"single":[82],"temporal":[83],"phase":[84],"shift":[85],"(TPS).":[86],"The":[87,160],"introduces":[89],"amount":[92],"using":[93],"dove":[95],"prism":[96],"(D),":[97],"effectively":[98],"preventing":[99],"detections":[101],"caused":[102],"by":[103,127],"insensitivity":[105],"shapes":[108,175],"direction.":[112],"A":[113],"4f":[114],"embedded":[117],"in":[118,141,181],"overcome":[123],"limitations":[125],"imposed":[126],"optical":[128],"components":[129],"on":[130],"field":[132],"view":[134],"(FOV),":[135],"allowing":[136],"work":[140],"large":[143,183],"range":[144],"FOV.":[146],"We":[147],"constructed":[148],"an":[149],"experimental":[150],"setup":[151],"evaluate":[153],"performance":[155],"proposed":[158],"system.":[159],"results":[162],"not":[163],"only":[164],"demonstrate":[165],"system\u2019s":[167],"applicability":[168],"for":[169],"various":[170],"loading":[171],"conditions":[172],"but":[176],"also":[177],"verify":[178],"feasibility":[180],"tiny":[185],"FOV":[186],"measurements.":[187]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}