{"id":"https://openalex.org/W4407461722","doi":"https://doi.org/10.1109/tim.2025.3541712","title":"Semisupervised Kernel Independent Component Analysis and Its Application for Fault Diagnosis","display_name":"Semisupervised Kernel Independent Component Analysis and Its Application for Fault Diagnosis","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4407461722","doi":"https://doi.org/10.1109/tim.2025.3541712"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3541712","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3541712","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033624629","display_name":"Xiangyu Kong","orcid":"https://orcid.org/0000-0003-2084-7826"},"institutions":[{"id":"https://openalex.org/I4210130660","display_name":"Xi'an High Tech University","ror":"https://ror.org/03vt7za95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210130660"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiangyu Kong","raw_affiliation_strings":["High-Tech Institute of Xi’an, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0003-2084-7826","affiliations":[{"raw_affiliation_string":"High-Tech Institute of Xi’an, Xi’an, China","institution_ids":["https://openalex.org/I4210130660"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026443022","display_name":"Meizhi Liu","orcid":"https://orcid.org/0000-0003-0219-3056"},"institutions":[{"id":"https://openalex.org/I4210130660","display_name":"Xi'an High Tech University","ror":"https://ror.org/03vt7za95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210130660"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Meizhi Liu","raw_affiliation_strings":["High-Tech Institute of Xi’an, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0003-0219-3056","affiliations":[{"raw_affiliation_string":"High-Tech Institute of Xi’an, Xi’an, China","institution_ids":["https://openalex.org/I4210130660"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Qi Zhang","orcid":"https://orcid.org/0000-0003-4541-420X"},"institutions":[{"id":"https://openalex.org/I4210130660","display_name":"Xi'an High Tech University","ror":"https://ror.org/03vt7za95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210130660"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Zhang","raw_affiliation_strings":["High-Tech Institute of Xi’an, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0003-4541-420X","affiliations":[{"raw_affiliation_string":"High-Tech Institute of Xi’an, Xi’an, China","institution_ids":["https://openalex.org/I4210130660"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011262638","display_name":"Jiayu Luo","orcid":"https://orcid.org/0000-0003-3453-2286"},"institutions":[{"id":"https://openalex.org/I4210130660","display_name":"Xi'an High Tech University","ror":"https://ror.org/03vt7za95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210130660"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiayu Luo","raw_affiliation_strings":["High-Tech Institute of Xi’an, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0003-3453-2286","affiliations":[{"raw_affiliation_string":"High-Tech Institute of Xi’an, Xi’an, China","institution_ids":["https://openalex.org/I4210130660"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100374195","display_name":"Chen Zhang","orcid":"https://orcid.org/0009-0001-1310-8390"},"institutions":[{"id":"https://openalex.org/I4210130660","display_name":"Xi'an High Tech University","ror":"https://ror.org/03vt7za95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210130660"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chen Zhang","raw_affiliation_strings":["High-Tech Institute of Xi’an, Xi’an, China"],"raw_orcid":"https://orcid.org/0009-0001-1310-8390","affiliations":[{"raw_affiliation_string":"High-Tech Institute of Xi’an, Xi’an, China","institution_ids":["https://openalex.org/I4210130660"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5033624629"],"corresponding_institution_ids":["https://openalex.org/I4210130660"],"apc_list":null,"apc_paid":null,"fwci":3.2997,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.90614738,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9675999879837036,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","score":0.9416000247001648,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.6877428293228149},{"id":"https://openalex.org/keywords/independent-component-analysis","display_name":"Independent component analysis","score":0.6718554496765137},{"id":"https://openalex.org/keywords/kernel","display_name":"Kernel (algebra)","score":0.5908370614051819},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5473048090934753},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.45035064220428467},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.40595048666000366},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3669678568840027},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.36287418007850647},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.3246513903141022},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2546061873435974},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23232510685920715},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08827388286590576}],"concepts":[{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.6877428293228149},{"id":"https://openalex.org/C51432778","wikidata":"https://www.wikidata.org/wiki/Q1259145","display_name":"Independent component analysis","level":2,"score":0.6718554496765137},{"id":"https://openalex.org/C74193536","wikidata":"https://www.wikidata.org/wiki/Q574844","display_name":"Kernel (algebra)","level":2,"score":0.5908370614051819},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5473048090934753},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.45035064220428467},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.40595048666000366},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3669678568840027},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.36287418007850647},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3246513903141022},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2546061873435974},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23232510685920715},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08827388286590576},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3541712","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3541712","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","score":0.41999998688697815,"id":"https://metadata.un.org/sdg/13"}],"awards":[{"id":"https://openalex.org/G115575238","display_name":null,"funder_award_id":"62273354","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3600301408","display_name":null,"funder_award_id":"2022L434","funder_id":"https://openalex.org/F4320329338","funder_display_name":"Independent Innovation Foundation of Higher Education of China"},{"id":"https://openalex.org/G4873899384","display_name":null,"funder_award_id":"62227814","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320329338","display_name":"Independent Innovation Foundation of Higher Education of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W1994505190","https://openalex.org/W2014668787","https://openalex.org/W2051821221","https://openalex.org/W2085893454","https://openalex.org/W2088032561","https://openalex.org/W2100590173","https://openalex.org/W2103110513","https://openalex.org/W2110507720","https://openalex.org/W2110527401","https://openalex.org/W2123649031","https://openalex.org/W2188500676","https://openalex.org/W2288086126","https://openalex.org/W2397271794","https://openalex.org/W2792056293","https://openalex.org/W2808221493","https://openalex.org/W2890595311","https://openalex.org/W2912000072","https://openalex.org/W2912703623","https://openalex.org/W2916669334","https://openalex.org/W2946132563","https://openalex.org/W2973694455","https://openalex.org/W2979584253","https://openalex.org/W2991319018","https://openalex.org/W3097066912","https://openalex.org/W3192472660","https://openalex.org/W3196865791","https://openalex.org/W3206811040","https://openalex.org/W4205093092","https://openalex.org/W4205778870","https://openalex.org/W4206182782","https://openalex.org/W4220848166","https://openalex.org/W4285121196","https://openalex.org/W4285209201","https://openalex.org/W4303987279","https://openalex.org/W4312228307","https://openalex.org/W4312605913","https://openalex.org/W4317796746","https://openalex.org/W4378697341","https://openalex.org/W4379740963","https://openalex.org/W4391069971"],"related_works":["https://openalex.org/W2121429698","https://openalex.org/W2182042810","https://openalex.org/W4252230435","https://openalex.org/W55679925","https://openalex.org/W3080404860","https://openalex.org/W2046761971","https://openalex.org/W3144722888","https://openalex.org/W2364896863","https://openalex.org/W2389189059","https://openalex.org/W4288804231"],"abstract_inverted_index":{"Fault":[0],"reconstruction,":[1],"a":[2,47,88,133,150],"common":[3],"approach":[4],"for":[5,119,164,195,202],"fault":[6,10,24,34,41,60,135,143,152],"diagnosis,":[7],"involves":[8],"extracting":[9],"subspaces":[11],"from":[12],"measurement":[13],"data":[14],"and":[15,36,57,75,100,110,123,167,180,198],"using":[16],"them":[17],"to":[18,115,145],"identify":[19],"the":[20,73,78,94,103,124,146,175,181,188],"type":[21],"of":[22,77,97,126],"online":[23],"samples.":[25],"These":[26],"subspaces,":[27],"however,":[28],"are":[29,113],"often":[30],"challenged":[31],"by":[32,141],"insufficient":[33],"representation":[35],"weak":[37],"discriminability":[38,76],"among":[39],"different":[40],"types.":[42],"To":[43],"address":[44],"these":[45,127],"issues,":[46],"semisupervised":[48],"kernel":[49],"independent":[50],"component":[51],"analysis":[52],"(SsKICA)":[53],"algorithm":[54],"is":[55,68,85,130,139,158],"proposed":[56,189],"applied":[58],"in":[59,80],"diagnosis.":[61],"First,":[62],"an":[63],"innovative":[64],"feature":[65],"extraction":[66,137],"method":[67,138,190],"developed":[69],"that":[70,92,160,187],"considers":[71],"both":[72],"non-Gaussianity":[74],"features":[79],"parallel.":[81],"Its":[82],"objective":[83],"function":[84,91],"reformulated":[86],"into":[87,102],"dual-maximization":[89,121],"criterion":[90],"incorporates":[93],"supervised":[95],"information":[96],"sample":[98],"categories":[99],"independence":[101],"same":[104],"mathematical":[105],"frame.":[106],"Second,":[107],"Newton\u2019s":[108],"methods":[109],"fixed-point":[111],"iteration":[112],"employed":[114],"derive":[116],"iterative":[117,128],"solutions":[118,129],"this":[120],"function,":[122],"convergence":[125],"analyzed.":[131],"Third,":[132],"fine-grained":[134],"subspace":[136],"investigated":[140],"extending":[142],"reconstruction":[144],"Hilbert":[147],"space.":[148],"Finally,":[149],"complete":[151],"diagnosis":[153],"strategy":[154],"based":[155],"on":[156,174],"SsKICA":[157],"designed":[159],"can":[161],"provide":[162],"feedback":[163,193],"unseen":[165,196],"faults":[166,197],"easily":[168],"interpretable":[169],"diagnostics.":[170],"The":[171],"simulation":[172],"results,":[173],"Tennessee":[176],"Eastman":[177],"process":[178],"(TEP)":[179],"PROcess":[182],"Networks":[183],"Optimization":[184],"(PRONTO),":[185],"demonstrate":[186],"provides":[191],"effective":[192],"mechanisms":[194],"enhanced":[199],"diagnostic":[200],"accuracy":[201],"known":[203],"faults.":[204]},"counts_by_year":[{"year":2025,"cited_by_count":3}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}