{"id":"https://openalex.org/W4407563627","doi":"https://doi.org/10.1109/tim.2025.3534225","title":"Noncontinuous Scanning Method for Cooperative Targets Based on Correlated Double Sampling","display_name":"Noncontinuous Scanning Method for Cooperative Targets Based on Correlated Double Sampling","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4407563627","doi":"https://doi.org/10.1109/tim.2025.3534225"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3534225","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3534225","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112165362","display_name":"Kun Wu","orcid":"https://orcid.org/0009-0008-4051-095X"},"institutions":[{"id":"https://openalex.org/I106645853","display_name":"Changchun University of Science and Technology","ror":"https://ror.org/007mntk44","country_code":"CN","type":"education","lineage":["https://openalex.org/I106645853"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Kun Wu","raw_affiliation_strings":["Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun, China","College of Optoelectronic Engineering, Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, Changchun University of Science and Technology, Changchun, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun, China","institution_ids":["https://openalex.org/I106645853"]},{"raw_affiliation_string":"College of Optoelectronic Engineering, Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, Changchun University of Science and Technology, Changchun, China","institution_ids":["https://openalex.org/I106645853"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115594487","display_name":"Hongtao Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I106645853","display_name":"Changchun University of Science and Technology","ror":"https://ror.org/007mntk44","country_code":"CN","type":"education","lineage":["https://openalex.org/I106645853"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongtao Zhang","raw_affiliation_strings":["Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun, China","College of Optoelectronic Engineering, Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, Changchun University of Science and Technology, Changchun, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun, China","institution_ids":["https://openalex.org/I106645853"]},{"raw_affiliation_string":"College of Optoelectronic Engineering, Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, Changchun University of Science and Technology, Changchun, China","institution_ids":["https://openalex.org/I106645853"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Maosheng Hou","orcid":"https://orcid.org/0009-0009-1465-6696"},"institutions":[{"id":"https://openalex.org/I106645853","display_name":"Changchun University of Science and Technology","ror":"https://ror.org/007mntk44","country_code":"CN","type":"education","lineage":["https://openalex.org/I106645853"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Maosheng Hou","raw_affiliation_strings":["Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun, China","College of Optoelectronic Engineering, Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, Changchun University of Science and Technology, Changchun, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun, China","institution_ids":["https://openalex.org/I106645853"]},{"raw_affiliation_string":"College of Optoelectronic Engineering, Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, Changchun University of Science and Technology, Changchun, China","institution_ids":["https://openalex.org/I106645853"]}]},{"author_position":"last","author":{"id":null,"display_name":"Jianli Zheng","orcid":"https://orcid.org/0000-0001-5903-8458"},"institutions":[{"id":"https://openalex.org/I106645853","display_name":"Changchun University of Science and Technology","ror":"https://ror.org/007mntk44","country_code":"CN","type":"education","lineage":["https://openalex.org/I106645853"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianli Zheng","raw_affiliation_strings":["Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun, China","College of Optoelectronic Engineering, Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, Changchun University of Science and Technology, Changchun, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun, China","institution_ids":["https://openalex.org/I106645853"]},{"raw_affiliation_string":"College of Optoelectronic Engineering, Key Laboratory of Optoelectronic Measurement and Optical Information Transmission Technology of Ministry of Education, Changchun University of Science and Technology, Changchun, China","institution_ids":["https://openalex.org/I106645853"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5112165362"],"corresponding_institution_ids":["https://openalex.org/I106645853"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0357302,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9190000295639038,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9190000295639038,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5242814421653748},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4467846155166626},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3520257771015167},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.254385769367218},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1539294719696045},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.14564654231071472}],"concepts":[{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5242814421653748},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4467846155166626},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3520257771015167},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.254385769367218},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1539294719696045},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.14564654231071472}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3534225","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3534225","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Zero hunger","score":0.4300000071525574,"id":"https://metadata.un.org/sdg/2"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W2180760736","https://openalex.org/W2891197392","https://openalex.org/W2898828403","https://openalex.org/W2907814795","https://openalex.org/W2964796906","https://openalex.org/W2994174397","https://openalex.org/W3011909298","https://openalex.org/W3118439840","https://openalex.org/W3158749110","https://openalex.org/W4281667646","https://openalex.org/W4319018104","https://openalex.org/W4323908123","https://openalex.org/W4379389960","https://openalex.org/W4385864180","https://openalex.org/W4387515113","https://openalex.org/W4387642728","https://openalex.org/W4390669219"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"The":[0,135,159],"laser":[1,34,59,88,155],"scanning":[2,60,121,156,165,179],"projection":[3,29,35,61,157],"systems":[4],"scan":[5,143],"to":[6,37,125,140],"determine":[7,127],"the":[8,11,20,24,28,33,40,48,55,87,93,98,103,113,116,128,132,163,168,177],"position":[9,130],"of":[10,13,44,50,57,97,115,131,149,170,185],"center":[12,129],"a":[14,58,66,119,147,153,182],"cooperative":[15,99,133,144],"target":[16],"and":[17,27,42,142],"then":[18],"calculate":[19],"coordinate":[21],"transformation":[22],"between":[23],"projected":[25],"surface":[26],"instrument.":[30],"This":[31],"enables":[32],"system":[36],"accurately":[38,84],"project":[39],"positions":[41],"contours":[43],"components.":[45],"To":[46],"solve":[47],"problem":[49],"ambient":[51],"light":[52],"interference":[53,105],"during":[54],"calibration":[56],"system,":[62],"this":[63,80],"study":[64],"proposes":[65],"detection":[67,81],"module":[68,82],"that":[69,79,162],"uses":[70],"correlated":[71],"double":[72],"sampling":[73,171],"(CDS)":[74],"technology.":[75],"Experimental":[76],"verification":[77],"shows":[78],"can":[83],"identify":[85],"whether":[86],"spot":[89],"is":[90,107],"located":[91],"in":[92],"highly":[94],"reflective":[95],"region":[96],"target,":[100],"even":[101],"when":[102],"signal":[104],"ratio":[106],"\u221229.5":[108],"dB.":[109],"In":[110],"accordance":[111],"with":[112,176,181],"features":[114],"CDS":[117],"technique,":[118],"noncontinuous":[120,164],"method":[122,166],"was":[123],"developed":[124],"quickly":[126],"target.":[134],"proposed":[136],"methods":[137],"were":[138],"used":[139],"detect":[141],"targets":[145],"at":[146],"distance":[148],"5000":[150],"mm":[151],"using":[152],"self-constructed":[154],"system.":[158],"results":[160],"show":[161],"reduces":[167],"number":[169],"points":[172],"by":[173],"97.5%":[174],"compared":[175],"raster":[178],"method,":[180],"positioning":[183],"deviation":[184],"0.052":[186],"mm.":[187]},"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}