{"id":"https://openalex.org/W4406858529","doi":"https://doi.org/10.1109/tim.2025.3534224","title":"Correction of Failure Data Under Electrode Disconnection for Accurate Electrical Impedance Tomography","display_name":"Correction of Failure Data Under Electrode Disconnection for Accurate Electrical Impedance Tomography","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4406858529","doi":"https://doi.org/10.1109/tim.2025.3534224"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3534224","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3534224","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013551265","display_name":"Yanyan Shi","orcid":"https://orcid.org/0000-0003-2759-0015"},"institutions":[{"id":"https://openalex.org/I75955062","display_name":"Henan Normal University","ror":"https://ror.org/00s13br28","country_code":"CN","type":"education","lineage":["https://openalex.org/I75955062"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanyan Shi","raw_affiliation_strings":["College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China"],"raw_orcid":"https://orcid.org/0000-0003-2759-0015","affiliations":[{"raw_affiliation_string":"College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China","institution_ids":["https://openalex.org/I75955062"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059976325","display_name":"L. Wang","orcid":"https://orcid.org/0009-0001-9986-5615"},"institutions":[{"id":"https://openalex.org/I75955062","display_name":"Henan Normal University","ror":"https://ror.org/00s13br28","country_code":"CN","type":"education","lineage":["https://openalex.org/I75955062"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Luanjun Wang","raw_affiliation_strings":["College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China"],"raw_orcid":"https://orcid.org/0009-0001-9986-5615","affiliations":[{"raw_affiliation_string":"College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China","institution_ids":["https://openalex.org/I75955062"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069742831","display_name":"Meng Wang","orcid":"https://orcid.org/0000-0002-2470-792X"},"institutions":[{"id":"https://openalex.org/I75955062","display_name":"Henan Normal University","ror":"https://ror.org/00s13br28","country_code":"CN","type":"education","lineage":["https://openalex.org/I75955062"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Meng Wang","raw_affiliation_strings":["College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China"],"raw_orcid":"https://orcid.org/0000-0002-2470-792X","affiliations":[{"raw_affiliation_string":"College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China","institution_ids":["https://openalex.org/I75955062"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025428519","display_name":"Bin Yang","orcid":"https://orcid.org/0000-0001-9687-5968"},"institutions":[{"id":"https://openalex.org/I9916479","display_name":"Air Force Medical University","ror":"https://ror.org/00ms48f15","country_code":"CN","type":"education","lineage":["https://openalex.org/I9916479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Yang","raw_affiliation_strings":["School of Biomedical Engineering, Fourth Military Medical University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0001-9687-5968","affiliations":[{"raw_affiliation_string":"School of Biomedical Engineering, Fourth Military Medical University, Xi’an, China","institution_ids":["https://openalex.org/I9916479"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Meng Dai","orcid":"https://orcid.org/0000-0002-8562-8889"},"institutions":[{"id":"https://openalex.org/I9916479","display_name":"Air Force Medical University","ror":"https://ror.org/00ms48f15","country_code":"CN","type":"education","lineage":["https://openalex.org/I9916479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Meng Dai","raw_affiliation_strings":["School of Biomedical Engineering, Fourth Military Medical University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-8562-8889","affiliations":[{"raw_affiliation_string":"School of Biomedical Engineering, Fourth Military Medical University, Xi’an, China","institution_ids":["https://openalex.org/I9916479"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109923853","display_name":"Feng Fu","orcid":"https://orcid.org/0000-0003-2115-9750"},"institutions":[{"id":"https://openalex.org/I9916479","display_name":"Air Force Medical University","ror":"https://ror.org/00ms48f15","country_code":"CN","type":"education","lineage":["https://openalex.org/I9916479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Fu","raw_affiliation_strings":["School of Biomedical Engineering, Fourth Military Medical University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0003-2115-9750","affiliations":[{"raw_affiliation_string":"School of Biomedical Engineering, Fourth Military Medical University, Xi’an, China","institution_ids":["https://openalex.org/I9916479"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5352,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.62698469,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.8190658092498779},{"id":"https://openalex.org/keywords/disconnection","display_name":"Disconnection","score":0.6503762006759644},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.5442975759506226},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5382162928581238},{"id":"https://openalex.org/keywords/electrical-resistivity-tomography","display_name":"Electrical resistivity tomography","score":0.5283960700035095},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.5048533082008362},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4351543188095093},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.36521434783935547},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3255213797092438},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25232213735580444},{"id":"https://openalex.org/keywords/electrical-resistivity-and-conductivity","display_name":"Electrical resistivity and conductivity","score":0.18665921688079834},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16961395740509033},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.1496073305606842}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.8190658092498779},{"id":"https://openalex.org/C2780371621","wikidata":"https://www.wikidata.org/wiki/Q3709910","display_name":"Disconnection","level":2,"score":0.6503762006759644},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.5442975759506226},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5382162928581238},{"id":"https://openalex.org/C60591178","wikidata":"https://www.wikidata.org/wiki/Q488986","display_name":"Electrical resistivity tomography","level":3,"score":0.5283960700035095},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.5048533082008362},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4351543188095093},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36521434783935547},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3255213797092438},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25232213735580444},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.18665921688079834},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16961395740509033},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1496073305606842},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3534224","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3534224","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.44999998807907104,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G1428387030","display_name":null,"funder_award_id":"2022YFC2404800","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G4195455818","display_name":null,"funder_award_id":"52277234","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5600199472","display_name":null,"funder_award_id":"52177004","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8111575349","display_name":null,"funder_award_id":"2022YFC2404800","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W359288994","https://openalex.org/W1973264506","https://openalex.org/W2023627147","https://openalex.org/W2052625285","https://openalex.org/W2065664264","https://openalex.org/W2082201463","https://openalex.org/W2095120395","https://openalex.org/W2128648870","https://openalex.org/W2144961133","https://openalex.org/W2158048787","https://openalex.org/W2163674403","https://openalex.org/W2165704742","https://openalex.org/W2170231308","https://openalex.org/W2342572800","https://openalex.org/W2509721612","https://openalex.org/W2550772329","https://openalex.org/W2578286698","https://openalex.org/W2584483805","https://openalex.org/W2592642714","https://openalex.org/W2735337215","https://openalex.org/W2785094812","https://openalex.org/W2796256498","https://openalex.org/W2803200748","https://openalex.org/W2954414184","https://openalex.org/W2971748233","https://openalex.org/W3003741466","https://openalex.org/W3087721441","https://openalex.org/W3097609090","https://openalex.org/W3150085397","https://openalex.org/W3169751171","https://openalex.org/W3175610975","https://openalex.org/W4207052116","https://openalex.org/W4226268736","https://openalex.org/W4312730028","https://openalex.org/W4384197546","https://openalex.org/W4388018930"],"related_works":["https://openalex.org/W4390535186","https://openalex.org/W3195581173","https://openalex.org/W4239884404","https://openalex.org/W2215273690","https://openalex.org/W2060278704","https://openalex.org/W2553917976","https://openalex.org/W2526896022","https://openalex.org/W4401115156","https://openalex.org/W2375739220","https://openalex.org/W759704566"],"abstract_inverted_index":{"In":[0,216],"the":[1,28,34,62,67,71,81,87,91,99,103,116,125,129,133,165,168,187,192,205,210,213,226,252],"dynamic":[2],"monitoring":[3],"with":[4,102,212],"electrical":[5],"impedance":[6],"tomography":[7],"(EIT),":[8],"some":[9],"unavoidable":[10],"factors":[11],"lead":[12],"to":[13,124,171],"electrode":[14,37,92,155,249],"disconnection.":[15],"Failure":[16],"data":[17,45,77,101,136,189],"are":[18,159,183,208,219],"measured":[19,68],"which":[20],"greatly":[21],"affects":[22],"image":[23,140,198,243],"reconstruction":[24,141,244],"quality.":[25],"To":[26,223],"enhance":[27],"accuracy":[29],"of":[30,36,86,132,142,153,167,204,245],"lung":[31,207,253],"imaging":[32],"in":[33,66,251],"presence":[35],"disconnection,":[38],"this":[39],"work":[40,237],"presents":[41],"a":[42,229,239],"novel":[43],"failure":[44,76],"correction":[46,78],"approach":[47],"based":[48],"on":[49],"shallow":[50],"convolutional":[51],"neural":[52],"network":[53],"(sCNN).":[54],"Electrode":[55],"disconnection":[56,152,250],"is":[57,73,93,95,107,119,121,145,195,233],"first":[58],"identified":[59],"by":[60,80,97,191],"calculating":[61],"average":[63],"relative":[64,111],"change":[65],"voltage.":[69],"Then":[70],"method":[72,89,118,170,194],"applied":[74],"for":[75,147,197,241],"caused":[79],"disconnected":[82,94],"electrode.":[83],"The":[84,200],"performance":[85],"proposed":[88,117,169,193,227],"when":[90,115,186],"evaluated":[96],"comparing":[98],"predicted":[100,134],"normal":[104,126],"data.":[105],"It":[106],"found":[108],"that":[109,180],"mean":[110],"boundary":[112],"voltage":[113,135,188],"variation":[114],"used":[120,196],"very":[122],"similar":[123],"case.":[127],"Besides,":[128],"deviation":[130],"rate":[131],"approximates":[137],"0.":[138],"Furthermore,":[139],"conductivity":[143,246],"distribution":[144,247],"investigated":[146],"five":[148],"different":[149],"models,":[150],"and":[151,156,176,202],"one":[154],"two":[157],"electrodes":[158],"considered.":[160],"Also,":[161],"we":[162],"have":[163],"tested":[164],"robustness":[166],"noise":[172],"interruption.":[173],"Both":[174],"quantitative":[175],"qualitative":[177],"evaluations":[178],"show":[179],"reconstructed":[181,206],"images":[182],"much":[184],"better":[185],"corrected":[190],"reconstruction.":[199],"shape":[201],"size":[203],"basically":[209],"same":[211],"true":[214],"object.":[215],"addition,":[217],"there":[218],"almost":[220],"no":[221],"artifacts.":[222],"further":[224],"estimate":[225],"method,":[228],"phantom":[230],"experimental":[231],"validation":[232],"carried":[234],"out.":[235],"This":[236],"offers":[238],"choice":[240],"accurate":[242],"under":[248],"EIT.":[254]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}