{"id":"https://openalex.org/W4405787195","doi":"https://doi.org/10.1109/tim.2024.3522620","title":"Identification of the Early Degradation of Bond Wire via Multidimensional Data Fusion Based on RMT","display_name":"Identification of the Early Degradation of Bond Wire via Multidimensional Data Fusion Based on RMT","publication_year":2024,"publication_date":"2024-12-25","ids":{"openalex":"https://openalex.org/W4405787195","doi":"https://doi.org/10.1109/tim.2024.3522620"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3522620","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3522620","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110374101","display_name":"Xiaoyu Shen","orcid":"https://orcid.org/0000-0001-6859-2864"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaoyu Shen","raw_affiliation_strings":["State Key Laboratory of Alternate Electrical Power System with Renewable Energy Source, North China Electric Power University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-6859-2864","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Source, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100362456","display_name":"Xiangyu Zhang","orcid":"https://orcid.org/0000-0002-4858-5429"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangyu Zhang","raw_affiliation_strings":["State Key Laboratory of Alternate Electrical Power System with Renewable Energy Source, North China Electric Power University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-4858-5429","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Source, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087904339","display_name":"Hong Shen","orcid":"https://orcid.org/0000-0002-2509-7297"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hong Shen","raw_affiliation_strings":["State Key Laboratory of Alternate Electrical Power System with Renewable Energy Source, North China Electric Power University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-2509-7297","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Source, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050575273","display_name":"Zhonghao Dongye","orcid":"https://orcid.org/0000-0001-5961-2608"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhonghao Dongye","raw_affiliation_strings":["State Key Laboratory of Alternate Electrical Power System with Renewable Energy Source, North China Electric Power University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-5961-2608","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Source, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100991617","display_name":"Bowen Gu","orcid":"https://orcid.org/0009-0003-8905-7977"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bowen Gu","raw_affiliation_strings":["State Key Laboratory of Alternate Electrical Power System with Renewable Energy Source, North China Electric Power University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0003-8905-7977","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Source, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041144914","display_name":"Lei Qi","orcid":"https://orcid.org/0000-0002-5175-7607"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Qi","raw_affiliation_strings":["State Key Laboratory of Alternate Electrical Power System with Renewable Energy Source, North China Electric Power University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-5175-7607","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Source, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5110374101"],"corresponding_institution_ids":["https://openalex.org/I153473198"],"apc_list":null,"apc_paid":null,"fwci":0.2003,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.54886211,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9860000014305115,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6532766222953796},{"id":"https://openalex.org/keywords/fusion","display_name":"Fusion","score":0.5398444533348083},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5119979977607727},{"id":"https://openalex.org/keywords/sensor-fusion","display_name":"Sensor fusion","score":0.4448419511318207},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40540552139282227},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3970670700073242},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36137688159942627},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.297834187746048},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12989288568496704}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6532766222953796},{"id":"https://openalex.org/C158525013","wikidata":"https://www.wikidata.org/wiki/Q2593739","display_name":"Fusion","level":2,"score":0.5398444533348083},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5119979977607727},{"id":"https://openalex.org/C33954974","wikidata":"https://www.wikidata.org/wiki/Q486494","display_name":"Sensor fusion","level":2,"score":0.4448419511318207},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40540552139282227},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3970670700073242},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36137688159942627},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.297834187746048},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12989288568496704},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3522620","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3522620","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1798130787","display_name":null,"funder_award_id":"52225701","funder_id":"https://openalex.org/F4320336125","funder_display_name":"National Science Fund for Distinguished Young Scholars"},{"id":"https://openalex.org/G7122002052","display_name":null,"funder_award_id":"2023YQ003","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"}],"funders":[{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null},{"id":"https://openalex.org/F4320336125","display_name":"National Science Fund for Distinguished Young Scholars","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1973857030","https://openalex.org/W1979238143","https://openalex.org/W1982599175","https://openalex.org/W2464895101","https://openalex.org/W2577274964","https://openalex.org/W2582421809","https://openalex.org/W2601711304","https://openalex.org/W2792914234","https://openalex.org/W2793535831","https://openalex.org/W2794508159","https://openalex.org/W2897037852","https://openalex.org/W2901771207","https://openalex.org/W2967658260","https://openalex.org/W2971173827","https://openalex.org/W2980842047","https://openalex.org/W3037949166","https://openalex.org/W3097066912","https://openalex.org/W3117395369","https://openalex.org/W3125460377","https://openalex.org/W3200564286","https://openalex.org/W4214810275","https://openalex.org/W4224536760","https://openalex.org/W4285189373","https://openalex.org/W4383428620","https://openalex.org/W4390481236","https://openalex.org/W4392114212"],"related_works":["https://openalex.org/W2534928293","https://openalex.org/W2150099345","https://openalex.org/W2160318243","https://openalex.org/W1490077415","https://openalex.org/W2898732673","https://openalex.org/W3004580327","https://openalex.org/W2132659060","https://openalex.org/W2031992971","https://openalex.org/W3214791684","https://openalex.org/W2152662039"],"abstract_inverted_index":{"Insulated-gate":[0],"bipolar":[1],"transistor":[2],"(IGBT)":[3],"modules":[4],"are":[5,44,50,212],"the":[6,19,22,31,62,91,97,105,110,120,128,133,137,144,156,162,165,172,175],"core":[7],"components":[8],"of":[9,21,30,35,109,122,136,164,174,186],"modular":[10],"multilevel":[11],"converters":[12],"(MMCs),":[13],"and":[14,38,42,127,132],"their":[15],"health":[16],"state":[17,163],"affects":[18],"reliability":[20],"whole":[23],"system.":[24],"Bond":[25],"wire":[26,79],"degradation":[27,40,80,181],"is":[28,65,117,140,152,182,202],"one":[29],"main":[32],"failure":[33],"modes":[34],"IGBT":[36,98],"modules,":[37],"initial":[39,180],"monitoring":[41,189],"identification":[43,74],"highly":[45],"important.":[46],"Traditional":[47],"detection":[48],"methods":[49],"based":[51],"on":[52,119],"a":[53,72,198],"single":[54,199],"electrical":[55,106,200],"parameter,":[56],"which":[57,85],"cannot":[58],"be":[59],"recognized":[60],"when":[61,197],"monitored":[63],"quantity":[64,107,159,201],"disturbed.":[66,203],"In":[67],"this":[68],"article,":[69],"we":[70],"propose":[71],"feature":[73,158],"method":[75,177],"for":[76],"identifying":[77],"bond":[78,166],"using":[81],"multidimensional":[82],"data":[83,108],"fusion,":[84],"does":[86],"not":[87],"need":[88],"to":[89,142,154,160],"analyze":[90],"complex":[92],"physical":[93],"coupling":[94],"relationships":[95],"inside":[96],"but":[99],"only":[100],"mines":[101],"potential":[102],"information":[103],"from":[104],"external":[111],"port.":[112],"A":[113],"high-dimensional":[114],"random":[115,123],"matrix":[116,124],"constructed":[118],"basis":[121],"theory":[125],"(RMT)":[126],"sliding":[129],"window":[130],"method,":[131],"distribution":[134],"law":[135],"empirical":[138],"spectrum":[139],"used":[141,153],"extract":[143],"linear":[145],"eigenvalue":[146],"statistics.":[147],"Principal":[148],"component":[149],"analysis":[150],"(PCA)":[151],"construct":[155],"fusion":[157],"monitor":[161],"wire.":[167],"The":[168],"results":[169],"show":[170],"that":[171,185],"sensitivity":[173],"proposed":[176],"in":[178],"recognizing":[179],"greater":[183],"than":[184],"other":[187],"common":[188],"methods.":[190],"Moreover,":[191],"it":[192],"can":[193],"still":[194],"recognize":[195],"accurately":[196],"Compared":[204],"with":[205],"traditional":[206],"methods,":[207],"significantly":[208],"lower":[209],"sampling":[210],"frequencies":[211],"needed.":[213]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-21T01:58:51.020947","created_date":"2025-10-10T00:00:00"}