{"id":"https://openalex.org/W4406094036","doi":"https://doi.org/10.1109/tim.2024.3522431","title":"Distinguishing Between Internal and External Defects Based on Stepped Array Sensor in Thick-Walled Ferromagnetic Components","display_name":"Distinguishing Between Internal and External Defects Based on Stepped Array Sensor in Thick-Walled Ferromagnetic Components","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4406094036","doi":"https://doi.org/10.1109/tim.2024.3522431"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3522431","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3522431","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069290428","display_name":"Zhiyang Deng","orcid":"https://orcid.org/0000-0002-1299-6314"},"institutions":[{"id":"https://openalex.org/I74525822","display_name":"Hubei University of Technology","ror":"https://ror.org/02d3fj342","country_code":"CN","type":"education","lineage":["https://openalex.org/I74525822"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhiyang Deng","raw_affiliation_strings":["Key Laboratory of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China","Key Lab of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0002-1299-6314","affiliations":[{"raw_affiliation_string":"Key Laboratory of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China","institution_ids":["https://openalex.org/I74525822"]},{"raw_affiliation_string":"Key Lab of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China","institution_ids":["https://openalex.org/I74525822"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083717162","display_name":"Tingyi Li","orcid":"https://orcid.org/0000-0001-7191-3251"},"institutions":[{"id":"https://openalex.org/I74525822","display_name":"Hubei University of Technology","ror":"https://ror.org/02d3fj342","country_code":"CN","type":"education","lineage":["https://openalex.org/I74525822"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tingyi Li","raw_affiliation_strings":["Key Laboratory of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China","Key Lab of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0001-7191-3251","affiliations":[{"raw_affiliation_string":"Key Laboratory of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China","institution_ids":["https://openalex.org/I74525822"]},{"raw_affiliation_string":"Key Lab of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China","institution_ids":["https://openalex.org/I74525822"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022458013","display_name":"Tingfeng Ming","orcid":"https://orcid.org/0000-0003-4175-7280"},"institutions":[{"id":"https://openalex.org/I74525822","display_name":"Hubei University of Technology","ror":"https://ror.org/02d3fj342","country_code":"CN","type":"education","lineage":["https://openalex.org/I74525822"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tingfeng Ming","raw_affiliation_strings":["Key Laboratory of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China","Key Lab of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0003-4175-7280","affiliations":[{"raw_affiliation_string":"Key Laboratory of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China","institution_ids":["https://openalex.org/I74525822"]},{"raw_affiliation_string":"Key Lab of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China","institution_ids":["https://openalex.org/I74525822"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001466013","display_name":"Xiaochun Song","orcid":"https://orcid.org/0000-0002-2746-4580"},"institutions":[{"id":"https://openalex.org/I74525822","display_name":"Hubei University of Technology","ror":"https://ror.org/02d3fj342","country_code":"CN","type":"education","lineage":["https://openalex.org/I74525822"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaochun Song","raw_affiliation_strings":["Key Laboratory of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China","Key Lab of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0002-2746-4580","affiliations":[{"raw_affiliation_string":"Key Laboratory of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China","institution_ids":["https://openalex.org/I74525822"]},{"raw_affiliation_string":"Key Lab of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, China","institution_ids":["https://openalex.org/I74525822"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025126717","display_name":"Yihua Kang","orcid":"https://orcid.org/0000-0003-2622-4769"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yihua Kang","raw_affiliation_strings":["Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0003-2622-4769","affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5069290428"],"corresponding_institution_ids":["https://openalex.org/I74525822"],"apc_list":null,"apc_paid":null,"fwci":1.9026,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.82100404,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9840999841690063,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ferromagnetism","display_name":"Ferromagnetism","score":0.6523849964141846},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.575896680355072},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4683223366737366},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.41725942492485046},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.37972086668014526},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37742772698402405},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2584816813468933},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2513728141784668},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.17485728859901428}],"concepts":[{"id":"https://openalex.org/C82217956","wikidata":"https://www.wikidata.org/wiki/Q184207","display_name":"Ferromagnetism","level":2,"score":0.6523849964141846},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.575896680355072},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4683223366737366},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.41725942492485046},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.37972086668014526},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37742772698402405},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2584816813468933},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2513728141784668},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.17485728859901428}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3522431","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3522431","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3986240108","display_name":null,"funder_award_id":"52105550","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4807361591","display_name":null,"funder_award_id":"2022YFF0605600","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G4899977537","display_name":null,"funder_award_id":"GCC2024001","funder_id":"https://openalex.org/F4320329228","funder_display_name":"Science Research Foundation of Xijing University"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320329228","display_name":"Science Research Foundation of Xijing University","ror":null},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W652891905","https://openalex.org/W1524283818","https://openalex.org/W1980221648","https://openalex.org/W2007483636","https://openalex.org/W2014190796","https://openalex.org/W2023217473","https://openalex.org/W2066220685","https://openalex.org/W2135896044","https://openalex.org/W2171333869","https://openalex.org/W2312645347","https://openalex.org/W2607285487","https://openalex.org/W2781880163","https://openalex.org/W2806609794","https://openalex.org/W2890989246","https://openalex.org/W2947354205","https://openalex.org/W3048728748","https://openalex.org/W3049213403","https://openalex.org/W3089936038","https://openalex.org/W3096210426","https://openalex.org/W3097436317","https://openalex.org/W3102502655","https://openalex.org/W3124938515","https://openalex.org/W3138698531","https://openalex.org/W3165484477","https://openalex.org/W3184307231","https://openalex.org/W3190533868","https://openalex.org/W3195692252","https://openalex.org/W3217763037","https://openalex.org/W4214926231","https://openalex.org/W4283322805","https://openalex.org/W4285131199","https://openalex.org/W4312994111","https://openalex.org/W4313186340","https://openalex.org/W4317797023","https://openalex.org/W4362722482","https://openalex.org/W4365801675","https://openalex.org/W4365801683","https://openalex.org/W4367721690","https://openalex.org/W4377030816","https://openalex.org/W4377261907","https://openalex.org/W4381051443","https://openalex.org/W4385421576","https://openalex.org/W4386918676","https://openalex.org/W4390481140"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2069401981","https://openalex.org/W2769433570","https://openalex.org/W2035332206","https://openalex.org/W2060905199","https://openalex.org/W2027212519","https://openalex.org/W1971744850","https://openalex.org/W2093096914","https://openalex.org/W3104331764","https://openalex.org/W288324372"],"abstract_inverted_index":{"Distinguishing":[0],"between":[1,21,88],"internal":[2,22,46,69,92],"and":[3,23,47,56,70,93,123,125,157,175],"external":[4,24,48,71,94],"defects":[5,25,49,72,95,144],"is":[6,14,42,137,181],"extremely":[7],"important":[8],"for":[9,16,44,165],"defect":[10],"evaluation,":[11],"but":[12],"it":[13,141],"difficult":[15],"traditional":[17],"methods":[18],"to":[19,114],"distinguish":[20,87,143],"in":[26,50,96],"thick-walled":[27,51],"ferromagnetic":[28,52,97,115,173],"components":[29,116,174],"effectively.":[30],"In":[31,104],"this":[32,106],"paper,":[33],"a":[34,38,100,146],"method":[35,85,107,161],"based":[36],"on":[37,132],"stepped":[39],"array":[40],"sensors":[41],"proposed":[43],"distinguishing":[45],"components.":[53],"Theoretical":[54],"modeling":[55],"simulation":[57],"analysis":[58],"show":[59,73,82],"that":[60,83,140],"the":[61,77,84,126,133,151,169,172,176],"magnetic":[62],"permeability":[63],"perturbation":[64],"testing":[65],"(MPPT)":[66],"signals":[67],"of":[68,102,117,148,150,168,171,182],"different":[74,118],"trends":[75],"as":[76],"sensor":[78],"size":[79],"increases.":[80],"Experiments":[81],"can":[86,142],"1":[89],"\u00d7":[90],"1mm":[91],"plate":[98,153],"with":[99,145],"thickness":[101],"12mm.":[103],"addition,":[105],"has":[108,129,162],"shown":[109],"good":[110],"performance":[111],"when":[112],"applied":[113],"thicknesses":[119],"(including":[120],"8mm,":[121],"10mm,":[122],"12mm),":[124],"magnetization":[127,178],"state":[128],"no":[130,163],"effect":[131],"change":[134],"trend.":[135],"It":[136],"worth":[138],"noting":[139],"depth":[147],"8.3%":[149],"total":[152],"thickness,":[154],"ensuring":[155],"accurate":[156],"reliable":[158],"detection.":[159],"This":[160],"need":[164],"prior":[166],"knowledge":[167],"parameters":[170],"optimum":[177],"strength,":[179],"which":[180],"greater":[183],"practical":[184],"value.":[185]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}