{"id":"https://openalex.org/W4405787683","doi":"https://doi.org/10.1109/tim.2024.3522398","title":"A Noncontact PCB Multifault Diagnosis Algorithm Based on Scalar Magnetic Field Fusion Feature and Transformer Architecture","display_name":"A Noncontact PCB Multifault Diagnosis Algorithm Based on Scalar Magnetic Field Fusion Feature and Transformer Architecture","publication_year":2024,"publication_date":"2024-12-25","ids":{"openalex":"https://openalex.org/W4405787683","doi":"https://doi.org/10.1109/tim.2024.3522398"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3522398","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3522398","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013481747","display_name":"Chengxin Liu","orcid":"https://orcid.org/0000-0003-3723-4209"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chengxin Liu","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-3723-4209","affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035316912","display_name":"Haiwen Yuan","orcid":"https://orcid.org/0000-0002-9667-8363"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiwen Yuan","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-9667-8363","affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082868278","display_name":"Michele Ferlauto","orcid":"https://orcid.org/0000-0002-7477-2172"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Michele Ferlauto","raw_affiliation_strings":["Department of Mechanical and Aerospace Engineering, Politecnico di Turin, Turin, Italy","Department of Mechanical and Aerospace Engineering, Politecnico di Torino, Turin, Italy"],"raw_orcid":"https://orcid.org/0000-0002-7477-2172","affiliations":[{"raw_affiliation_string":"Department of Mechanical and Aerospace Engineering, Politecnico di Turin, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Department of Mechanical and Aerospace Engineering, Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075753301","display_name":"Jianxun Lv","orcid":"https://orcid.org/0000-0002-6840-3485"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianxun Lv","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-6840-3485","affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101877813","display_name":"Yingyi Liu","orcid":"https://orcid.org/0000-0002-3262-2088"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingyi Liu","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-3262-2088","affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5040940480","display_name":"Hai Xu","orcid":"https://orcid.org/0000-0001-5209-3497"},"institutions":[{"id":"https://openalex.org/I4210147760","display_name":"Wuhu Institute of Technology","ror":"https://ror.org/055hnk386","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210147760"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hai Xu","raw_affiliation_strings":["Wuhu Machinery Factory, Wuhu, China"],"raw_orcid":"https://orcid.org/0000-0001-5209-3497","affiliations":[{"raw_affiliation_string":"Wuhu Machinery Factory, Wuhu, China","institution_ids":["https://openalex.org/I4210147760"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5013481747"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":0.3331,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.67328058,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9408000111579895,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9408000111579895,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13717","display_name":"Advanced Algorithms and Applications","score":0.9138000011444092,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.4910447597503662},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.4749869406223297},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.45749199390411377},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4503357708454132},{"id":"https://openalex.org/keywords/fusion","display_name":"Fusion","score":0.43177229166030884},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4126984477043152},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3357654809951782},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2884029150009155},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2760756313800812},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1599215865135193}],"concepts":[{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.4910447597503662},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.4749869406223297},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.45749199390411377},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4503357708454132},{"id":"https://openalex.org/C158525013","wikidata":"https://www.wikidata.org/wiki/Q2593739","display_name":"Fusion","level":2,"score":0.43177229166030884},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4126984477043152},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3357654809951782},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2884029150009155},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2760756313800812},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1599215865135193},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3522398","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3522398","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4795938731","display_name":null,"funder_award_id":"62073013","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5894081193","display_name":null,"funder_award_id":"62473024","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322725","display_name":"China Scholarship Council","ror":"https://ror.org/04atp4p48"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W860246511","https://openalex.org/W1969926384","https://openalex.org/W1995722298","https://openalex.org/W1998098486","https://openalex.org/W2010656406","https://openalex.org/W2022669299","https://openalex.org/W2053741029","https://openalex.org/W2130640354","https://openalex.org/W2143756411","https://openalex.org/W2212640431","https://openalex.org/W2549337046","https://openalex.org/W2569610284","https://openalex.org/W2581555918","https://openalex.org/W2728074186","https://openalex.org/W2887122927","https://openalex.org/W2889149129","https://openalex.org/W2972966173","https://openalex.org/W2982112268","https://openalex.org/W3000835335","https://openalex.org/W3094028086","https://openalex.org/W3110040471","https://openalex.org/W3113211899","https://openalex.org/W3126748229","https://openalex.org/W3204615530","https://openalex.org/W4206401991","https://openalex.org/W4285307923","https://openalex.org/W4312578515","https://openalex.org/W4313064927","https://openalex.org/W4388108928","https://openalex.org/W6686561364"],"related_works":["https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2053286651","https://openalex.org/W2181743346","https://openalex.org/W2187401768","https://openalex.org/W2181413294","https://openalex.org/W2989452537","https://openalex.org/W2052122378","https://openalex.org/W2544423928","https://openalex.org/W2062023542"],"abstract_inverted_index":{"Noncontact":[0],"printed":[1],"circuit":[2,25],"board":[3],"(PCB)":[4],"fault":[5,63,75,138],"diagnosis":[6,107,139],"has":[7,58],"been":[8],"widely":[9],"applied":[10],"in":[11,41,61],"PCB":[12,62,74,106,137],"detection":[13],"and":[14,28,36,54,73,86,118,165,208],"maintenance.":[15],"Because":[16],"of":[17,70,95,104,155],"objective":[18],"factors":[19],"such":[20],"as":[21],"invisible":[22],"area,":[23],"low-loss":[24],"structure":[26],"design,":[27],"frequency":[29,56],"insensitivity,":[30],"traditional":[31],"algorithms":[32],"based":[33,46,160],"on":[34,47,66,111,161],"visual":[35],"temperature":[37],"features":[38,49,57,164],"are":[39,200],"limited":[40],"practice;":[42],"therefore,":[43],"the":[44,67,99,105,112,124,153,162],"algorithm":[45],"electromagnetic":[48,71],"containing":[50],"rich":[51],"physical":[52],"connotations":[53],"prominent":[55],"received":[59],"attention":[60],"diagnosis.":[64],"Based":[65],"basic":[68],"principles":[69],"physics":[72],"relationship,":[76],"this":[77],"article":[78,132],"proposes":[79],"a":[80,134],"scalar":[81],"magnetic":[82],"field":[83],"source":[84],"feature":[85,89],"further":[87],"improves":[88],"performance":[90],"by":[91],"adding":[92],"topological":[93],"relationships":[94],"multifaults":[96],"to":[97,122],"generate":[98],"fusion":[100],"feature.":[101,130],"The":[102,131,167],"backbone":[103],"model":[108],"is":[109,158],"established":[110],"Transformer":[113],"architecture,":[114],"effectively":[115],"using":[116],"self-attention":[117],"parallel":[119],"computing":[120],"mechanisms":[121],"explore":[123],"inner":[125],"correlation":[126],"between":[127],"each":[128],"group":[129],"provides":[133],"new":[135],"noncontact":[136],"solution":[140],"that":[141],"enriches":[142],"existing":[143],"methods.":[144],"Besides,":[145],"through":[146],"actual":[147],"experiments":[148],"setting":[149],"up":[150],"multifault":[151],"PCBs,":[152],"feasibility":[154],"our":[156],"process":[157],"proved":[159],"proposed":[163],"models.":[166],"specific":[168],"multiple":[169],"indicators":[170],"overall":[171,178,185],"precision":[172,176,198],"(OP),":[173],"per":[174,181,189],"class":[175,182,190],"(CP),":[177],"recall":[179,183],"(OR),":[180],"(CR),":[184],"F1":[186,191],"measure":[187,192],"(OF1),":[188],"(CF1),":[193],"accuracy":[194],"(ACC),":[195],"mean":[196],"average":[197],"(mAP)":[199],"98.55%,":[201,203,205],"94.89%,":[202],"95.11%,":[204],"95.32%,":[206],"96.01%,":[207],"97.27%.":[209]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-21T01:58:51.020947","created_date":"2025-10-10T00:00:00"}