{"id":"https://openalex.org/W4403446291","doi":"https://doi.org/10.1109/tim.2024.3481573","title":"Transformer-Based Multiscale Reconstruction Network for Defect Detection of Infrared Images","display_name":"Transformer-Based Multiscale Reconstruction Network for Defect Detection of Infrared Images","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4403446291","doi":"https://doi.org/10.1109/tim.2024.3481573"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3481573","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3481573","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://orca.cardiff.ac.uk/id/eprint/172655/1/Revised%20Manuscript%20with%20Changes%20Highlighted.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066950886","display_name":"Changyun Wei","orcid":"https://orcid.org/0000-0002-5788-6573"},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Changyun Wei","raw_affiliation_strings":["College of Mechanical and Electrical Engineering, Hohai University, Nanjing, China","College of Mechanical and Electrical Engineering, Hohai University, China"],"affiliations":[{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Hohai University, Nanjing, China","institution_ids":["https://openalex.org/I163340411"]},{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Hohai University, China","institution_ids":["https://openalex.org/I163340411"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083956702","display_name":"Hui Han","orcid":"https://orcid.org/0009-0009-7223-8804"},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Han","raw_affiliation_strings":["College of Mechanical and Electrical Engineering, Hohai University, Nanjing, China","College of Mechanical and Electrical Engineering, Hohai University, China"],"affiliations":[{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Hohai University, Nanjing, China","institution_ids":["https://openalex.org/I163340411"]},{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Hohai University, China","institution_ids":["https://openalex.org/I163340411"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100313432","display_name":"Zhichao Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhichao Wu","raw_affiliation_strings":["College of Mechanical and Electrical Engineering, Hohai University, Nanjing, China","College of Mechanical and Electrical Engineering, Hohai University, China"],"affiliations":[{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Hohai University, Nanjing, China","institution_ids":["https://openalex.org/I163340411"]},{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Hohai University, China","institution_ids":["https://openalex.org/I163340411"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100831093","display_name":"Yu Xia","orcid":"https://orcid.org/0009-0005-7892-7943"},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Xia","raw_affiliation_strings":["College of Mechanical and Electrical Engineering, Hohai University, Nanjing, China","College of Mechanical and Electrical Engineering, Hohai University, China"],"affiliations":[{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Hohai University, Nanjing, China","institution_ids":["https://openalex.org/I163340411"]},{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Hohai University, China","institution_ids":["https://openalex.org/I163340411"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068175770","display_name":"Ze Ji","orcid":"https://orcid.org/0000-0002-8968-9902"},"institutions":[{"id":"https://openalex.org/I79510175","display_name":"Cardiff University","ror":"https://ror.org/03kk7td41","country_code":"GB","type":"education","lineage":["https://openalex.org/I79510175"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Ze Ji","raw_affiliation_strings":["School of Engineering, Cardiff University, Cardiff, U.K","School of Engineering, Cardiff University, Cardiff, United Kingdom"],"affiliations":[{"raw_affiliation_string":"School of Engineering, Cardiff University, Cardiff, U.K","institution_ids":["https://openalex.org/I79510175"]},{"raw_affiliation_string":"School of Engineering, Cardiff University, Cardiff, United Kingdom","institution_ids":["https://openalex.org/I79510175"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5066950886"],"corresponding_institution_ids":["https://openalex.org/I163340411"],"apc_list":null,"apc_paid":null,"fwci":1.8117,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.86749994,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9782999753952026,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9574000239372253,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.4981677532196045},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.4528360068798065},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.4472990334033966},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.377693772315979},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3702273964881897},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3506886661052704},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3353380858898163},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.26807886362075806},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2600472569465637},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.23612555861473083},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.20426547527313232},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1502629518508911}],"concepts":[{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.4981677532196045},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.4528360068798065},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.4472990334033966},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.377693772315979},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3702273964881897},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3506886661052704},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3353380858898163},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26807886362075806},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2600472569465637},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.23612555861473083},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.20426547527313232},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1502629518508911},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2024.3481573","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3481573","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:https://orca.cardiff.ac.uk:172655","is_oa":true,"landing_page_url":null,"pdf_url":"https://orca.cardiff.ac.uk/id/eprint/172655/1/Revised%20Manuscript%20with%20Changes%20Highlighted.pdf","source":{"id":"https://openalex.org/S4306401195","display_name":"ORCA Online Research @Cardiff (Cardiff University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79510175","host_organization_name":"Cardiff University","host_organization_lineage":["https://openalex.org/I79510175"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"}],"best_oa_location":{"id":"pmh:oai:https://orca.cardiff.ac.uk:172655","is_oa":true,"landing_page_url":null,"pdf_url":"https://orca.cardiff.ac.uk/id/eprint/172655/1/Revised%20Manuscript%20with%20Changes%20Highlighted.pdf","source":{"id":"https://openalex.org/S4306401195","display_name":"ORCA Online Research @Cardiff (Cardiff University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79510175","host_organization_name":"Cardiff University","host_organization_lineage":["https://openalex.org/I79510175"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","score":0.4399999976158142,"display_name":"Sustainable cities and communities"}],"awards":[{"id":"https://openalex.org/G1007614233","display_name":null,"funder_award_id":"52371275","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4403446291.pdf","grobid_xml":"https://content.openalex.org/works/W4403446291.grobid-xml"},"referenced_works_count":36,"referenced_works":["https://openalex.org/W1901129140","https://openalex.org/W2089528765","https://openalex.org/W2133665775","https://openalex.org/W2559230302","https://openalex.org/W2599354622","https://openalex.org/W2894811173","https://openalex.org/W2900822495","https://openalex.org/W2907868778","https://openalex.org/W2914570111","https://openalex.org/W2919115771","https://openalex.org/W2944303778","https://openalex.org/W2948982773","https://openalex.org/W2963045681","https://openalex.org/W2978971541","https://openalex.org/W3092704883","https://openalex.org/W3109771882","https://openalex.org/W3128856970","https://openalex.org/W3129082918","https://openalex.org/W3147184966","https://openalex.org/W3152576252","https://openalex.org/W3159648608","https://openalex.org/W3165012668","https://openalex.org/W3169651898","https://openalex.org/W3175515048","https://openalex.org/W3176378302","https://openalex.org/W3211391700","https://openalex.org/W4200597473","https://openalex.org/W4214694907","https://openalex.org/W4221140561","https://openalex.org/W4322707069","https://openalex.org/W4327559126","https://openalex.org/W4379537349","https://openalex.org/W4386065890","https://openalex.org/W4386075837","https://openalex.org/W6741832134","https://openalex.org/W6752554887"],"related_works":["https://openalex.org/W2374614594","https://openalex.org/W2391549584","https://openalex.org/W2362091980","https://openalex.org/W2391203560","https://openalex.org/W2365737984","https://openalex.org/W2375000493","https://openalex.org/W2461118381","https://openalex.org/W2379025356","https://openalex.org/W3115201059","https://openalex.org/W2037405171"],"abstract_inverted_index":{"Bottle":[0],"packaging":[1],"is":[2,14],"extensively":[3],"used":[4],"in":[5,69,87,182],"manufacturing,":[6],"and":[7,75,116,125,139,152,155,166,185,199],"inspecting":[8],"aluminum":[9,176],"foil":[10,177],"sealing":[11,178],"during":[12],"filling":[13],"crucial":[15],"for":[16,84,175],"ensuring":[17],"product":[18],"quality.":[19],"Traditional":[20],"machine":[21],"vision":[22],"methods":[23,50,57],"based":[24],"on":[25,170,188],"supervised":[26],"learning":[27,49],"require":[28],"extensive":[29],"annotated":[30],"data,":[31],"but":[32],"the":[33,39,63,131,161,171,189],"scarcity":[34],"of":[35,41,65,72,149,163],"defective":[36],"samples":[37],"hampers":[38],"effectiveness":[40],"these":[42,56],"methods.":[43],"To":[44],"address":[45],"this":[46],"challenge,":[47],"unsupervised":[48,81],"have":[51],"emerged.":[52],"Despite":[53],"their":[54],"potential,":[55],"often":[58],"struggle":[59],"to":[60,159,202],"accurately":[61,146],"learn":[62],"distribution":[64,165],"normal":[66],"samples,":[67],"resulting":[68],"higher":[70],"rates":[71],"false":[73],"positives":[74],"negatives.":[76],"This":[77],"article":[78],"proposes":[79],"an":[80,117],"learning-based":[82],"approach":[83],"anomaly":[85,118,157,183],"detection":[86,184,200],"infrared":[88,172],"images.":[89],"Specifically,":[90],"we":[91],"construct":[92],"a":[93,102,106,110,113],"transformer-based":[94],"multiscale":[95,144],"image":[96,173],"reconstruction":[97,111,204],"network":[98,128,133],"(TMIRN)":[99],"that":[100],"includes":[101],"feature":[103,107],"extraction":[104],"module,":[105,109,112],"fusion":[108],"discriminator":[114],"network,":[115],"scoring":[119],"module.":[120],"By":[121],"effectively":[122],"combining":[123],"Transformer":[124],"convolutional":[126],"neural":[127],"(CNN)":[129],"techniques,":[130],"proposed":[132],"excels":[134],"at":[135],"capturing":[136],"both":[137],"global":[138],"local":[140],"semantic":[141],"information.":[142],"Its":[143],"structure":[145],"localizes":[147],"defects":[148],"varying":[150],"sizes":[151],"combines":[153],"image-level":[154],"feature-level":[156],"scores":[158],"mitigate":[160],"impact":[162],"nonuniform":[164],"noise.":[167],"Experimental":[168],"results":[169],"dataset":[174],"demonstrate":[179],"high":[180],"accuracy":[181],"localization.":[186],"Furthermore,":[187],"industrial":[190],"MVTec":[191],"AD":[192],"dataset,":[193],"our":[194],"TMIRN":[195],"exhibits":[196],"superior":[197],"generalization":[198],"compared":[201],"state-of-the-art":[203],"networks.":[205]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4}],"updated_date":"2026-03-13T16:22:10.518609","created_date":"2025-10-10T00:00:00"}