{"id":"https://openalex.org/W4403446637","doi":"https://doi.org/10.1109/tim.2024.3481555","title":"Evaluation of Random Errors for Vector Network Analyzers Based on a Residual Model","display_name":"Evaluation of Random Errors for Vector Network Analyzers Based on a Residual Model","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4403446637","doi":"https://doi.org/10.1109/tim.2024.3481555"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3481555","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3481555","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064983376","display_name":"Chihyun Cho","orcid":"https://orcid.org/0000-0003-2506-576X"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chihyun Cho","raw_affiliation_strings":["Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-2506-576X","affiliations":[{"raw_affiliation_string":"Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033332663","display_name":"Tae\u2010Weon Kang","orcid":"https://orcid.org/0000-0002-7457-6585"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Tae-Weon Kang","raw_affiliation_strings":["Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-7457-6585","affiliations":[{"raw_affiliation_string":"Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044079252","display_name":"Hyunji Koo","orcid":"https://orcid.org/0000-0002-8337-1821"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunji Koo","raw_affiliation_strings":["Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-8337-1821","affiliations":[{"raw_affiliation_string":"Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101616837","display_name":"Woohyun Chung","orcid":"https://orcid.org/0000-0002-1541-0745"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Woohyun Chung","raw_affiliation_strings":["Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-1541-0745","affiliations":[{"raw_affiliation_string":"Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2913,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.5706651,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14420","display_name":"Advanced Research in Systems and Signal Processing","score":0.7771999835968018,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14420","display_name":"Advanced Research in Systems and Signal Processing","score":0.7771999835968018,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.7151229381561279},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5548525452613831},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.4628637731075287},{"id":"https://openalex.org/keywords/random-error","display_name":"Random error","score":0.4244052469730377},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.41154131293296814},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.37604182958602905},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3371132016181946},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.3121367394924164},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2435547411441803},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23507651686668396}],"concepts":[{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.7151229381561279},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5548525452613831},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.4628637731075287},{"id":"https://openalex.org/C73782692","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Random error","level":2,"score":0.4244052469730377},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.41154131293296814},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37604182958602905},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3371132016181946},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3121367394924164},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2435547411441803},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23507651686668396}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3481555","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3481555","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1480468152","display_name":null,"funder_award_id":"KRISS-2024-GP2024-0002","funder_id":"https://openalex.org/F4320322103","funder_display_name":"Korea Research Institute of Standards and Science"}],"funders":[{"id":"https://openalex.org/F4320322103","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1595800361","https://openalex.org/W2006899480","https://openalex.org/W2012661568","https://openalex.org/W2060635605","https://openalex.org/W2111068907","https://openalex.org/W2147240558","https://openalex.org/W2593396819","https://openalex.org/W2983525171","https://openalex.org/W3128604560","https://openalex.org/W4205332009","https://openalex.org/W4205492715","https://openalex.org/W4296916594","https://openalex.org/W4382999332","https://openalex.org/W4390970115"],"related_works":["https://openalex.org/W2220451197","https://openalex.org/W2370122455","https://openalex.org/W1825457241","https://openalex.org/W1989588780","https://openalex.org/W2473790374","https://openalex.org/W4284698423","https://openalex.org/W1600397729","https://openalex.org/W2360832559","https://openalex.org/W2379668504","https://openalex.org/W3128781877"],"abstract_inverted_index":{"The":[0,71],"residual":[1,23,69,148],"model":[2,24,149],"is":[3],"widely":[4],"used":[5],"to":[6,39,134,137,158],"calculate":[7],"the":[8,19,22,40,68,88,124,129,138,147,152,168],"measurement":[9,36,77],"uncertainty":[10,37,105,136],"of":[11,78,107,128,146,160,167],"vector":[12],"network":[13],"analyzers":[14],"(VNAs).":[15],"However,":[16],"precisely":[17],"evaluating":[18,53],"parameters":[20,54],"within":[21,67],"can":[25,155],"be":[26,156],"challenging.":[27],"As":[28],"a":[29,49],"result,":[30],"it":[31,132],"often":[32],"overestimates":[33],"or":[34],"underestimates":[35],"compared":[38],"VNA":[41],"error":[42],"model.":[43,70],"In":[44],"this":[45],"article,":[46],"we":[47,141],"propose":[48],"new":[50],"method":[51,73,154],"for":[52,75,104],"such":[55],"as":[56],"drift,":[57],"test":[58],"port":[59],"cable":[60],"stability":[61],"(CA),":[62],"and":[63,81,90,109],"connection":[64],"repeatability":[65],"(CO)":[66],"proposed":[72,153],"allows":[74],"precise":[76],"each":[79,144],"parameter":[80,126],"easily":[82],"captures":[83],"correlations":[84],"not":[85],"only":[86],"between":[87,95],"real":[89],"imaginary":[91],"parts":[92],"but":[93],"also":[94,99],"cross":[96],"frequencies.":[97],"We":[98],"analytically":[100],"computed":[101],"Jacobian":[102,116],"matrices":[103,117],"calculations":[106],"1-port":[108],"2-port":[110],"device":[111],"under":[112],"tests":[113],"(DUTs).":[114],"These":[115],"(or":[118],"sensitivity":[119],"coefficients)":[120],"depend":[121],"solely":[122],"on":[123],"scattering":[125],"values":[127],"DUT,":[130],"making":[131],"easy":[133],"propagate":[135],"DUT.":[139],"Finally,":[140],"demonstrate":[142],"that":[143],"covariance":[145],"obtained":[150],"using":[151],"reduced":[157],"1.3%":[159],"its":[161],"original":[162],"size":[163],"while":[164],"retaining":[165],"99.99%":[166],"variation":[169],"through":[170],"principal":[171],"component":[172],"analysis":[173],"(PCAs).":[174]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}