{"id":"https://openalex.org/W4403446730","doi":"https://doi.org/10.1109/tim.2024.3481529","title":"Mechanical Stress Wave Noncontact Laser Detection Method of Power Semiconductor Devices\u2014Observation of Low-Frequency Signals","display_name":"Mechanical Stress Wave Noncontact Laser Detection Method of Power Semiconductor Devices\u2014Observation of Low-Frequency Signals","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4403446730","doi":"https://doi.org/10.1109/tim.2024.3481529"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3481529","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3481529","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056954818","display_name":"Qiying Li","orcid":"https://orcid.org/0000-0002-4485-5022"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qiying Li","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-4485-5022","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081305539","display_name":"Yunze He","orcid":"https://orcid.org/0000-0002-7081-8225"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunze He","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-7081-8225","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053688243","display_name":"Mengchuan Li","orcid":"https://orcid.org/0000-0001-6917-7013"},"institutions":[{"id":"https://openalex.org/I4210122501","display_name":"Hunan Xiangdian Test Research Institute (China)","ror":"https://ror.org/0391pty66","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210122501"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mengchuan Li","raw_affiliation_strings":["State Grid Hunan Extra High Voltage Substation Company, Changsha, China","State grid Hunan extra high voltage substation company, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0001-6917-7013","affiliations":[{"raw_affiliation_string":"State Grid Hunan Extra High Voltage Substation Company, Changsha, China","institution_ids":[]},{"raw_affiliation_string":"State grid Hunan extra high voltage substation company, Changsha, China","institution_ids":["https://openalex.org/I4210122501"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115604918","display_name":"Ping Yang","orcid":"https://orcid.org/0009-0006-6737-069X"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Ping","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0009-0006-6737-069X","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011685978","display_name":"Longhai Tang","orcid":"https://orcid.org/0000-0003-3996-2349"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longhai Tang","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0003-3996-2349","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052731522","display_name":"Xuefeng Geng","orcid":"https://orcid.org/0000-0003-3088-5199"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuefeng Geng","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0003-3088-5199","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019644529","display_name":"Guangxin Wang","orcid":"https://orcid.org/0000-0002-1231-2832"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangxin Wang","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-1231-2832","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064705315","display_name":"Shan Chang","orcid":"https://orcid.org/0009-0007-9385-0619"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shan Chang","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0009-0007-9385-0619","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100593082","display_name":"Jie Zhang","orcid":"https://orcid.org/0009-0009-5542-9836"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Zhang","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0009-0009-5542-9836","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5056954818"],"corresponding_institution_ids":["https://openalex.org/I16609230"],"apc_list":null,"apc_paid":null,"fwci":1.8026,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.85628678,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9609000086784363,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9609000086784363,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9567000269889832,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12510","display_name":"Magneto-Optical Properties and Applications","score":0.949400007724762,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6494813561439514},{"id":"https://openalex.org/keywords/semiconductor-laser-theory","display_name":"Semiconductor laser theory","score":0.6015483140945435},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.5696415305137634},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.5587664842605591},{"id":"https://openalex.org/keywords/semiconductor","display_name":"Semiconductor","score":0.4925430715084076},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.46892648935317993},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.44744497537612915},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3853859603404999},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3609042167663574},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32468920946121216},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2381746470928192},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18433907628059387}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6494813561439514},{"id":"https://openalex.org/C121477167","wikidata":"https://www.wikidata.org/wiki/Q17154002","display_name":"Semiconductor laser theory","level":3,"score":0.6015483140945435},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.5696415305137634},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5587664842605591},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.4925430715084076},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.46892648935317993},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.44744497537612915},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3853859603404999},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3609042167663574},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32468920946121216},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2381746470928192},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18433907628059387},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3481529","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3481529","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6100000143051147,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G3070218285","display_name":null,"funder_award_id":"JCYJ20220530160409022","funder_id":"https://openalex.org/F4320329836","funder_display_name":"Chuzhou Science and Technology Program"},{"id":"https://openalex.org/G4801606222","display_name":null,"funder_award_id":"52077063","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320329836","display_name":"Chuzhou Science and Technology Program","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1999910075","https://openalex.org/W3006739771","https://openalex.org/W3026863035","https://openalex.org/W3088354950","https://openalex.org/W3177581089","https://openalex.org/W3211855514","https://openalex.org/W4205365955","https://openalex.org/W4312629386","https://openalex.org/W4313030853","https://openalex.org/W4313121673"],"related_works":["https://openalex.org/W4376108071","https://openalex.org/W1492457393","https://openalex.org/W2148296488","https://openalex.org/W2037101501","https://openalex.org/W2330199576","https://openalex.org/W2053174874","https://openalex.org/W816692272","https://openalex.org/W2313201005","https://openalex.org/W4247849052","https://openalex.org/W4249695842"],"abstract_inverted_index":{"Power":[0],"semiconductor":[1,85,101,143],"device":[2,19,24,46],"condition":[3],"monitoring":[4],"technology":[5],"based":[6,77],"on":[7,78],"the":[8,45,49,53,90,96,104,111,119,123,132,139,149,156],"mechanical":[9],"stress":[10],"wave":[11],"(MSW)":[12],"is":[13],"an":[14,71],"important":[15],"means":[16],"to":[17,63,126,147],"study":[18,130],"failure":[20],"mechanisms":[21,153],"and":[22,52,135,151],"evaluate":[23],"reliability.":[25],"However,":[26],"MSW":[27,56,74,92,124,140],"signals":[28],"have":[29],"mainly":[30],"been":[31],"detected":[32],"through":[33],"acoustic":[34],"emission":[35],"(AE)":[36],"sensors":[37],"for":[38,83,138],"contact":[39,127],"detection.":[40,128],"The":[41],"operating":[42],"temperature":[43],"of":[44,55,99,122,155],"will":[47],"affect":[48],"detection":[50,133],"results,":[51],"presence":[54],"low-frequency":[57,105],"components":[58,106,121],"may":[59],"be":[60],"overlooked":[61],"due":[62],"limitations":[64],"in":[65,117,141],"sensor":[66],"performance.":[67],"This":[68,87,129],"article":[69],"proposes":[70],"offline,":[72],"noncontact":[73],"measurement":[75],"method":[76,88,113],"a":[79],"laser":[80],"Doppler":[81],"vibrometer":[82],"power":[84,100,142],"devices.":[86],"obtained":[89],"complete":[91],"signal":[93],"generated":[94],"during":[95],"switching":[97],"process":[98],"devices,":[102,144],"especially":[103],"below":[107],"20":[108],"kHz.":[109],"Moreover,":[110],"proposed":[112],"exhibits":[114],"greater":[115],"sensitivity":[116],"detecting":[118],"high-frequency":[120],"compared":[125],"extends":[131],"methods":[134],"frequency":[136],"ranges":[137],"thereby":[145],"expecting":[146],"facilitate":[148],"generation":[150],"propagation":[152],"research":[154],"MSW.":[157]},"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}