{"id":"https://openalex.org/W4402436816","doi":"https://doi.org/10.1109/tim.2024.3457925","title":"GPSC-GAN: A Data Enhanced Model for Intelligent Fault Diagnosis","display_name":"GPSC-GAN: A Data Enhanced Model for Intelligent Fault Diagnosis","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4402436816","doi":"https://doi.org/10.1109/tim.2024.3457925"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3457925","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3457925","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://publications.aston.ac.uk/id/eprint/46775/1/Accepted_version_-_GPSC-GAN_A_Data_Enhanced_Model_for_Intelligent_Fault_Diagnosis.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113273457","display_name":"Pin Lyu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156189","display_name":"Shanghai Dianji University","ror":"https://ror.org/055fene14","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210156189"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Pin Lyu","raw_affiliation_strings":["School of Electronic Information Engineering, Shanghai Dianji University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information Engineering, Shanghai Dianji University, Shanghai, China","institution_ids":["https://openalex.org/I4210156189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075753962","display_name":"Yihong Cheng","orcid":"https://orcid.org/0009-0006-7586-4817"},"institutions":[{"id":"https://openalex.org/I4210156189","display_name":"Shanghai Dianji University","ror":"https://ror.org/055fene14","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210156189"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yihong Cheng","raw_affiliation_strings":["School of Electronic Information Engineering, Shanghai Dianji University, Shanghai, China","Master degree in Electrical Engineering of School of Electronic Information Engineering, Shanghai Dianji University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information Engineering, Shanghai Dianji University, Shanghai, China","institution_ids":["https://openalex.org/I4210156189"]},{"raw_affiliation_string":"Master degree in Electrical Engineering of School of Electronic Information Engineering, Shanghai Dianji University, Shanghai, China","institution_ids":["https://openalex.org/I4210156189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100753657","display_name":"Ming Zhang","orcid":"https://orcid.org/0000-0001-5202-5574"},"institutions":[{"id":"https://openalex.org/I169199633","display_name":"Aston University","ror":"https://ror.org/05j0ve876","country_code":"GB","type":"education","lineage":["https://openalex.org/I169199633"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Ming Zhang","raw_affiliation_strings":["College of Engineering and Physical Sciences, Aston University, Birmingham, U.K"],"affiliations":[{"raw_affiliation_string":"College of Engineering and Physical Sciences, Aston University, Birmingham, U.K","institution_ids":["https://openalex.org/I169199633"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028331245","display_name":"Wenbing Yu","orcid":"https://orcid.org/0000-0003-4299-5360"},"institutions":[{"id":"https://openalex.org/I4210156189","display_name":"Shanghai Dianji University","ror":"https://ror.org/055fene14","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210156189"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenbing Yu","raw_affiliation_strings":["School of Higher Vocational Technology, Shanghai Dianji University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Higher Vocational Technology, Shanghai Dianji University, Shanghai, China","institution_ids":["https://openalex.org/I4210156189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007995577","display_name":"Liqiao Xia","orcid":"https://orcid.org/0000-0001-8878-7490"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Liqiao Xia","raw_affiliation_strings":["Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hong Kong, SAR, China","Ph.D. degree in the Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Special Administrative Region, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hong Kong, SAR, China","institution_ids":["https://openalex.org/I14243506"]},{"raw_affiliation_string":"Ph.D. degree in the Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Special Administrative Region, Hong Kong, China","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100755357","display_name":"Chao Liu","orcid":"https://orcid.org/0000-0001-7261-3832"},"institutions":[{"id":"https://openalex.org/I169199633","display_name":"Aston University","ror":"https://ror.org/05j0ve876","country_code":"GB","type":"education","lineage":["https://openalex.org/I169199633"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Chao Liu","raw_affiliation_strings":["College of Engineering and Physical Sciences, Aston University, Birmingham, U.K"],"affiliations":[{"raw_affiliation_string":"College of Engineering and Physical Sciences, Aston University, Birmingham, U.K","institution_ids":["https://openalex.org/I169199633"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5113273457"],"corresponding_institution_ids":["https://openalex.org/I4210156189"],"apc_list":null,"apc_paid":null,"fwci":4.553,"has_fulltext":true,"cited_by_count":14,"citation_normalized_percentile":{"value":0.95295806,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"16"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.980400025844574,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.980400025844574,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9358999729156494,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14470","display_name":"Advanced Data Processing Techniques","score":0.9045000076293945,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/data-modeling","display_name":"Data modeling","score":0.6005015969276428},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5403199195861816},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4691281318664551},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.43928736448287964},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39807620644569397},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39163678884506226},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2209482491016388},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.08489647507667542}],"concepts":[{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.6005015969276428},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5403199195861816},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4691281318664551},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43928736448287964},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39807620644569397},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39163678884506226},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2209482491016388},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.08489647507667542},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2024.3457925","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3457925","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:publications.aston.ac.uk:46775","is_oa":true,"landing_page_url":"https://publications.aston.ac.uk/view/author/9a6291f242ad56d82a625a4d2bf0036b.html>,","pdf_url":"https://publications.aston.ac.uk/id/eprint/46775/1/Accepted_version_-_GPSC-GAN_A_Data_Enhanced_Model_for_Intelligent_Fault_Diagnosis.pdf","source":{"id":"https://openalex.org/S4306400483","display_name":"Aston Publications Explorer (Aston University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I169199633","host_organization_name":"Aston University","host_organization_lineage":["https://openalex.org/I169199633"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"}],"best_oa_location":{"id":"pmh:oai:publications.aston.ac.uk:46775","is_oa":true,"landing_page_url":"https://publications.aston.ac.uk/view/author/9a6291f242ad56d82a625a4d2bf0036b.html>,","pdf_url":"https://publications.aston.ac.uk/id/eprint/46775/1/Accepted_version_-_GPSC-GAN_A_Data_Enhanced_Model_for_Intelligent_Fault_Diagnosis.pdf","source":{"id":"https://openalex.org/S4306400483","display_name":"Aston Publications Explorer (Aston University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I169199633","host_organization_name":"Aston University","host_organization_lineage":["https://openalex.org/I169199633"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","display_name":"Climate action","score":0.5}],"awards":[{"id":"https://openalex.org/G2858468737","display_name":null,"funder_award_id":"52105534","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4402436816.pdf","grobid_xml":"https://content.openalex.org/works/W4402436816.grobid-xml"},"referenced_works_count":43,"referenced_works":["https://openalex.org/W2133665775","https://openalex.org/W2593414223","https://openalex.org/W2768753204","https://openalex.org/W2797314495","https://openalex.org/W2887767982","https://openalex.org/W2910881901","https://openalex.org/W2963767194","https://openalex.org/W2967625104","https://openalex.org/W2969747056","https://openalex.org/W2970170226","https://openalex.org/W2979450790","https://openalex.org/W2998506103","https://openalex.org/W3000663543","https://openalex.org/W3016159209","https://openalex.org/W3024801014","https://openalex.org/W3046248607","https://openalex.org/W3048988402","https://openalex.org/W3088502892","https://openalex.org/W3096831136","https://openalex.org/W3106914811","https://openalex.org/W3111843301","https://openalex.org/W3119689200","https://openalex.org/W4212861124","https://openalex.org/W4214579459","https://openalex.org/W4225666552","https://openalex.org/W4226423887","https://openalex.org/W4281979258","https://openalex.org/W4285010829","https://openalex.org/W4285134483","https://openalex.org/W4286208077","https://openalex.org/W4286433454","https://openalex.org/W4310497802","https://openalex.org/W4312291109","https://openalex.org/W4312364770","https://openalex.org/W4366190830","https://openalex.org/W4367598753","https://openalex.org/W4387453513","https://openalex.org/W4390346796","https://openalex.org/W6678815747","https://openalex.org/W6718140377","https://openalex.org/W6735913928","https://openalex.org/W6752378368","https://openalex.org/W6779669310"],"related_works":["https://openalex.org/W4402299999","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W2898370298","https://openalex.org/W2137437058","https://openalex.org/W2884249467","https://openalex.org/W4396520874","https://openalex.org/W4390401159","https://openalex.org/W2744391499","https://openalex.org/W2800070131"],"abstract_inverted_index":{"In":[0],"manufacturing,":[1],"accurate":[2],"fault":[3,51,79,95,125,145,183],"diagnosis":[4,184],"is":[5,70,76,86,103],"imperative":[6],"but":[7],"frequently":[8],"impeded":[9],"by":[10,78,170],"the":[11,17,106,110,114,118,129,132,150,167,171,178,194],"scarcity":[12],"of":[13,19,33,109,117,154,180],"data,":[14],"which":[15,75,147],"obstructs":[16],"development":[18],"effective":[20,31],"data-driven":[21],"diagnostic":[22],"models.":[23,196],"Although":[24],"generative":[25],"adversarial":[26],"networks":[27],"(GANs)":[28],"are":[29,142,153,174,190],"an":[30],"means":[32,148],"increasing":[34],"data":[35,59,169],"volume,":[36],"they":[37],"still":[38],"face":[39],"a":[40,57,82],"challenge":[41],"in":[42,72],"concurrently":[43],"generating":[44],"high-quality":[45],"and":[46,124,189],"multimode":[47,94],"samples":[48,123,140,152],"for":[49],"multiple":[50],"categories.":[52],"To":[53],"solve":[54],"this":[55,73],"challenge,":[56],"novel":[58],"enhanced":[60],"model":[61,134,173],"gradient":[62,101],"penalty":[63,102],"separate":[64,84],"classifier":[65,85],"(GPSC)-GAN":[66],"based":[67],"on":[68,160],"GAN":[69,91],"proposed":[71,133,172],"article,":[74],"characterized":[77],"scenario-agnostic.":[80],"First,":[81],"new":[83],"developed":[87],"to":[88,92,112,128,176,193],"integrate":[89],"into":[90,105],"generate":[93],"samples.":[96,126],"Second,":[97],"Wasserstein":[98],"distance":[99],"with":[100,144,186],"introduced":[104],"loss":[107],"function":[108],"discriminator":[111],"handle":[113],"optimization":[115],"problem":[116],"distribution":[119],"similarity":[120],"between":[121],"generated":[122,139,151,168],"Compared":[127],"traditional":[130],"GAN,":[131],"can":[135],"more":[136],"effectively":[137],"produce":[138],"that":[141,149,166],"aggregated":[143],"samples,":[146],"high":[155,187],"quality.":[156],"Meanwhile,":[157],"experimental":[158],"results":[159],"two":[161],"different":[162],"bearing":[163],"datasets":[164],"reveal":[165],"applicable":[175],"assist":[177],"training":[179],"deep":[181],"learning-based":[182],"models":[185],"accuracy":[188],"also":[191],"superior":[192],"state-of-the-art":[195]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":3}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}