{"id":"https://openalex.org/W4401879316","doi":"https://doi.org/10.1109/tim.2024.3449954","title":"Detecting Series Arc Faults Using High-Frequency Components of Branch Voltage Coupling Signal","display_name":"Detecting Series Arc Faults Using High-Frequency Components of Branch Voltage Coupling Signal","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4401879316","doi":"https://doi.org/10.1109/tim.2024.3449954"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3449954","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3449954","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001849615","display_name":"Zhipeng He","orcid":"https://orcid.org/0000-0002-5622-0067"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhipeng He","raw_affiliation_strings":["School of Automation, Northwestern Polytechnical University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-5622-0067","affiliations":[{"raw_affiliation_string":"School of Automation, Northwestern Polytechnical University, Xi’an, China","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009558811","display_name":"Zixiao Xu","orcid":"https://orcid.org/0000-0002-3985-6792"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zixiao Xu","raw_affiliation_strings":["School of Automation, Northwestern Polytechnical University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-3985-6792","affiliations":[{"raw_affiliation_string":"School of Automation, Northwestern Polytechnical University, Xi’an, China","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010873032","display_name":"Hu Zhao","orcid":null},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hu Zhao","raw_affiliation_strings":["School of Automation, Northwestern Polytechnical University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0001-8801-5554","affiliations":[{"raw_affiliation_string":"School of Automation, Northwestern Polytechnical University, Xi’an, China","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100690565","display_name":"Weilin Li","orcid":"https://orcid.org/0000-0002-7319-3611"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weilin Li","raw_affiliation_strings":["School of Automation, Northwestern Polytechnical University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-7319-3611","affiliations":[{"raw_affiliation_string":"School of Automation, Northwestern Polytechnical University, Xi’an, China","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101465258","display_name":"Yan Zhen","orcid":"https://orcid.org/0000-0002-2376-6645"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan Zhen","raw_affiliation_strings":["Beijing SmartChip Microelectronics Technology Company Ltd., Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-2376-6645","affiliations":[{"raw_affiliation_string":"Beijing SmartChip Microelectronics Technology Company Ltd., Beijing, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043522097","display_name":"Wenjun Ning","orcid":"https://orcid.org/0000-0002-7137-6377"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenjun Ning","raw_affiliation_strings":["College of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-7137-6377","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5001849615"],"corresponding_institution_ids":["https://openalex.org/I17145004"],"apc_list":null,"apc_paid":null,"fwci":2.4035,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.89256532,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9876000285148621,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10809","display_name":"Occupational Health and Safety Research","score":0.9769999980926514,"subfield":{"id":"https://openalex.org/subfields/3614","display_name":"Radiological and Ultrasound Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.5927179455757141},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.45878034830093384},{"id":"https://openalex.org/keywords/coupling","display_name":"Coupling (piping)","score":0.44821280241012573},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43330201506614685},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4257243871688843},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.42411568760871887},{"id":"https://openalex.org/keywords/arc-fault-circuit-interrupter","display_name":"Arc-fault circuit interrupter","score":0.4166051745414734},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3595883548259735},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.349634051322937},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.33722615242004395},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3341764211654663},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.276995450258255},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.13142132759094238},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.131276935338974}],"concepts":[{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.5927179455757141},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.45878034830093384},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.44821280241012573},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43330201506614685},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4257243871688843},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.42411568760871887},{"id":"https://openalex.org/C157069517","wikidata":"https://www.wikidata.org/wiki/Q132172","display_name":"Arc-fault circuit interrupter","level":4,"score":0.4166051745414734},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3595883548259735},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.349634051322937},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.33722615242004395},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3341764211654663},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.276995450258255},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.13142132759094238},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.131276935338974},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3449954","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3449954","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2370639986","display_name":null,"funder_award_id":"52272403","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5261373769","display_name":null,"funder_award_id":"20210408","funder_id":"https://openalex.org/F4320326962","funder_display_name":"Macau University of Science and Technology Foundation"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320326962","display_name":"Macau University of Science and Technology Foundation","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W2296747478","https://openalex.org/W2322357398","https://openalex.org/W2572569838","https://openalex.org/W2575581781","https://openalex.org/W2585885232","https://openalex.org/W2800598202","https://openalex.org/W2903738303","https://openalex.org/W2903983890","https://openalex.org/W2963568967","https://openalex.org/W2980153045","https://openalex.org/W2996455563","https://openalex.org/W3090166999","https://openalex.org/W3119697583","https://openalex.org/W3170516065","https://openalex.org/W3177367985","https://openalex.org/W3192032765","https://openalex.org/W4213433538","https://openalex.org/W4226068325","https://openalex.org/W4226367113","https://openalex.org/W4226476518","https://openalex.org/W4285214202","https://openalex.org/W4312762236","https://openalex.org/W4317038568","https://openalex.org/W4377231429","https://openalex.org/W4388966751","https://openalex.org/W4389946093"],"related_works":["https://openalex.org/W3139959406","https://openalex.org/W1965012205","https://openalex.org/W1919101720","https://openalex.org/W4390822878","https://openalex.org/W96888382","https://openalex.org/W4386126592","https://openalex.org/W2041308758","https://openalex.org/W2034955596","https://openalex.org/W4392529072","https://openalex.org/W4317419672"],"abstract_inverted_index":{"Series":[0],"arc":[1,122,132],"faults":[2,123],"(SAFs)":[3],"are":[4,20,26],"important":[5],"safety":[6],"issues":[7],"in":[8,47],"low-voltage":[9],"ac":[10],"distribution":[11],"networks.":[12],"However,":[13],"the":[14,62,69,73,80,84,90,106,114,125,141,144,155],"load":[15,52,168],"type":[16],"and":[17,22,54,121,124,147,170],"circuit":[18,56,171],"topology":[19],"increasing,":[21],"arcing":[23],"current":[24],"features":[25],"easily":[27],"affected":[28],"by":[29],"these":[30],"factors,":[31],"which":[32],"makes":[33],"SAF":[34],"detection":[35,70,108,134,160],"very":[36],"challenging.":[37],"This":[38],"article":[39],"proposes":[40],"a":[41],"new":[42],"method":[43,60,146,157],"for":[44],"detecting":[45],"SAFs":[46],"real":[48],"scenarios":[49],"containing":[50],"multiple":[51,167],"types":[53,169],"complex":[55,163],"topologies.":[57,172],"The":[58,151],"proposed":[59,145,156],"uses":[61],"branch":[63],"voltage":[64],"coupling":[65],"signal":[66],"(BVCS)":[67],"as":[68],"signal.":[71],"First,":[72],"wavelet":[74,95],"transform":[75,96],"is":[76,100,110,137],"employed":[77],"to":[78,82,102,139],"preprocess":[79],"BVCS":[81],"simplify":[83],"representation":[85],"of":[86,94,116,127,143],"fault":[87,133],"components.":[88],"Second,":[89],"absolute":[91],"value":[92],"sum":[93],"detail":[97],"coefficients":[98],"(AVSDCs)":[99],"utilized":[101],"characterize":[103],"them.":[104],"Then,":[105],"complete":[107],"algorithm":[109],"designed":[111],"based":[112],"on":[113],"difference":[115],"AVSDC":[117],"between":[118],"normal":[119],"conditions":[120,165],"continuity":[126],"SAFs.":[128],"Finally,":[129],"an":[130],"online":[131],"device":[135],"(AFDD)":[136],"developed":[138],"validate":[140],"accuracy":[142,161],"its":[148],"generalization":[149],"ability.":[150],"results":[152],"show":[153],"that":[154],"has":[158],"good":[159],"under":[162],"working":[164],"with":[166]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":2}],"updated_date":"2025-12-21T01:58:51.020947","created_date":"2025-10-10T00:00:00"}