{"id":"https://openalex.org/W4401608558","doi":"https://doi.org/10.1109/tim.2024.3441023","title":"FPGA-Based Planar Sensor Electrical Impedance Tomography (FPGA-psEIT) System Characterized by Double Feedback Howland Constant- Current Pump and Programmable Front-End Measurement","display_name":"FPGA-Based Planar Sensor Electrical Impedance Tomography (FPGA-psEIT) System Characterized by Double Feedback Howland Constant- Current Pump and Programmable Front-End Measurement","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4401608558","doi":"https://doi.org/10.1109/tim.2024.3441023"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3441023","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3441023","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028932748","display_name":"Isnan Nur Rifai","orcid":"https://orcid.org/0000-0002-0014-5045"},"institutions":[{"id":"https://openalex.org/I165230279","display_name":"Universitas Gadjah Mada","ror":"https://ror.org/03ke6d638","country_code":"ID","type":"education","lineage":["https://openalex.org/I165230279"]}],"countries":["ID"],"is_corresponding":false,"raw_author_name":"Isnan Nur Rifai","raw_affiliation_strings":["Department of Electrical Engineering and Informatics, Vocational College, Universitas Gadjah Mada, Yogyakarta, Indonesia"],"raw_orcid":"https://orcid.org/0000-0002-0014-5045","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Informatics, Vocational College, Universitas Gadjah Mada, Yogyakarta, Indonesia","institution_ids":["https://openalex.org/I165230279"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041699913","display_name":"Prima Asmara Sejati","orcid":"https://orcid.org/0000-0002-0509-841X"},"institutions":[{"id":"https://openalex.org/I165230279","display_name":"Universitas Gadjah Mada","ror":"https://ror.org/03ke6d638","country_code":"ID","type":"education","lineage":["https://openalex.org/I165230279"]}],"countries":["ID"],"is_corresponding":false,"raw_author_name":"Prima Asmara Sejati","raw_affiliation_strings":["Department of Electrical Engineering and Informatics, Vocational College, Universitas Gadjah Mada, Yogyakarta, Indonesia"],"raw_orcid":"https://orcid.org/0000-0002-0509-841X","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Informatics, Vocational College, Universitas Gadjah Mada, Yogyakarta, Indonesia","institution_ids":["https://openalex.org/I165230279"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043480761","display_name":"Shinsuke Akita","orcid":"https://orcid.org/0000-0001-7075-6602"},"institutions":[{"id":"https://openalex.org/I159385669","display_name":"Chiba University","ror":"https://ror.org/01hjzeq58","country_code":"JP","type":"education","lineage":["https://openalex.org/I159385669"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shinsuke Akita","raw_affiliation_strings":["Department of Plastic, Reconstructive, and Esthetic Surgery, Graduate School of Medicine, Chiba University, Chiba, Japan"],"raw_orcid":"https://orcid.org/0000-0001-7075-6602","affiliations":[{"raw_affiliation_string":"Department of Plastic, Reconstructive, and Esthetic Surgery, Graduate School of Medicine, Chiba University, Chiba, Japan","institution_ids":["https://openalex.org/I159385669"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091856593","display_name":"Masahiro Takei","orcid":"https://orcid.org/0000-0003-3855-7202"},"institutions":[{"id":"https://openalex.org/I159385669","display_name":"Chiba University","ror":"https://ror.org/01hjzeq58","country_code":"JP","type":"education","lineage":["https://openalex.org/I159385669"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro Takei","raw_affiliation_strings":["Department of Mechanical Engineering, Division of Fundamental Engineering, Graduate School of Science and Engineering, Chiba University, Chiba, Japan"],"raw_orcid":"https://orcid.org/0000-0003-3855-7202","affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Division of Fundamental Engineering, Graduate School of Science and Engineering, Chiba University, Chiba, Japan","institution_ids":["https://openalex.org/I159385669"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4978,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.57992012,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.968500018119812,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.9384764432907104},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6651248931884766},{"id":"https://openalex.org/keywords/planar","display_name":"Planar","score":0.6546511054039001},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5756663084030151},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.567038893699646},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.474413126707077},{"id":"https://openalex.org/keywords/front-and-back-ends","display_name":"Front and back ends","score":0.47379204630851746},{"id":"https://openalex.org/keywords/current-source","display_name":"Current source","score":0.42946699261665344},{"id":"https://openalex.org/keywords/constant","display_name":"Constant (computer programming)","score":0.41671550273895264},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.39667651057243347},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.31943604350090027},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2725663483142853},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2429056167602539},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.09041103720664978},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.07555446028709412}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.9384764432907104},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6651248931884766},{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.6546511054039001},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5756663084030151},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.567038893699646},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.474413126707077},{"id":"https://openalex.org/C53016008","wikidata":"https://www.wikidata.org/wiki/Q620167","display_name":"Front and back ends","level":2,"score":0.47379204630851746},{"id":"https://openalex.org/C2781331714","wikidata":"https://www.wikidata.org/wiki/Q1163768","display_name":"Current source","level":3,"score":0.42946699261665344},{"id":"https://openalex.org/C2777027219","wikidata":"https://www.wikidata.org/wiki/Q1284190","display_name":"Constant (computer programming)","level":2,"score":0.41671550273895264},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.39667651057243347},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.31943604350090027},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2725663483142853},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2429056167602539},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.09041103720664978},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.07555446028709412},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3441023","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3441023","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.800000011920929,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W1579297670","https://openalex.org/W1600688475","https://openalex.org/W1768343990","https://openalex.org/W1968735445","https://openalex.org/W1971508657","https://openalex.org/W1976631627","https://openalex.org/W1993702271","https://openalex.org/W2059644152","https://openalex.org/W2081359092","https://openalex.org/W2084557056","https://openalex.org/W2128461556","https://openalex.org/W2137627159","https://openalex.org/W2156919093","https://openalex.org/W2564920208","https://openalex.org/W2565669155","https://openalex.org/W2581885347","https://openalex.org/W2597622026","https://openalex.org/W2797815754","https://openalex.org/W2803433966","https://openalex.org/W2913886006","https://openalex.org/W2963268198","https://openalex.org/W2978084166","https://openalex.org/W3016970093","https://openalex.org/W3039603067","https://openalex.org/W3084204243","https://openalex.org/W3105342263","https://openalex.org/W3113045474","https://openalex.org/W3174610172","https://openalex.org/W3182203998","https://openalex.org/W3208111748","https://openalex.org/W4206718730","https://openalex.org/W4210767125","https://openalex.org/W4220792420","https://openalex.org/W4220970271","https://openalex.org/W4226185965","https://openalex.org/W4315478982","https://openalex.org/W4366420016","https://openalex.org/W4376272134","https://openalex.org/W4379116848","https://openalex.org/W4384500176","https://openalex.org/W4385711988"],"related_works":["https://openalex.org/W2359871536","https://openalex.org/W1992681652","https://openalex.org/W2991320615","https://openalex.org/W2058355111","https://openalex.org/W3210784113","https://openalex.org/W2979500949","https://openalex.org/W2105964106","https://openalex.org/W2537138046","https://openalex.org/W2318544294","https://openalex.org/W2572422521"],"abstract_inverted_index":{"The":[0,66,163],"field-programmable":[1],"gate":[2],"array":[3],"(FPGA)-based":[4],"planar":[5],"sensor":[6],"electrical":[7],"impedance":[8,64,154],"tomography":[9],"(FPGA-psEIT)":[10],"system":[11,71,169],"has":[12],"been":[13],"developed":[14],"for":[15,42],"skin":[16,98],"sodium":[17,107],"content":[18],"imaging,":[19],"which":[20,80],"is":[21,72,81,125,170],"characterized":[22],"by":[23,95],"double":[24],"feedback":[25],"Howland":[26],"constant-current":[27],"pump":[28],"(DFHC)":[29],"and":[30],"programmable":[31],"front-end":[32],"measurement":[33,58],"(PFM).":[34],"In":[35],"order":[36],"to":[37,88,102,143,152,172],"ensure":[38],"the":[39,57,75,90,104,111,115,118,123,134,153,178],"FPGA-psEIT":[40,70,138,168],"suitability":[41],"medical":[43],"application,":[44],"DFHC":[45],"maintains":[46],"current":[47],"stability":[48],"across":[49],"a":[50,140,174],"broad":[51],"frequency":[52],"spectrum,":[53],"while":[54],"PFM":[55],"reduces":[56],"error":[59],"over":[60],"wide":[61],"range":[62],"of":[63,69,99,106,117,121,161,177],"level.":[65],"hardware":[67],"performance":[68,119],"assessed":[73],"through":[74],"signal-to-noise":[76],"ratio":[77],"(SNR)":[78],"evaluation,":[79],"conducted":[82],"at":[83],"various":[84],"load-impedance":[85],"levels.":[86],"Further":[87],"validate":[89],"system,":[91],"experiments":[92],"are":[93],"undertaken":[94],"using":[96],"calf":[97,136,186],"human":[100,135,185],"subjects":[101],"investigate":[103],"level":[105],"content$\\gamma":[108],"^{\\text":[109,182],"{Na}}$in":[110],"dermis":[112],"layer.":[113],"As":[114],"result":[116],"test":[120],"FPGA-psEIT,":[122],"SNR":[124],"achieved":[126],"89":[127],"dB":[128],"at$f_{0}":[129],"=10$\u2013100":[130],"kHz.":[131],"Lastly,":[132],"in":[133,184],"experiments,":[137],"exhibits":[139],"consistent":[141],"tendency":[142],"yield":[144],"higher$\\langle":[145],"^{\\ast":[146],"}":[147],"\\sigma":[148],"\\rangle":[149],"$as":[150],"compared":[151],"analyzer":[155],"(IA)":[156],"with":[157],"an":[158],"average":[159],"difference":[160],"29%.":[162],"aforementioned":[164],"results":[165],"indicate":[166],"that":[167],"capable":[171],"produce":[173],"high-quality":[175],"image":[176],"conductivity":[179],"distribution":[180],"of$\\gamma":[181],"{Na}}$applied":[183],"skin.":[187]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2024-08-16T00:00:00"}