{"id":"https://openalex.org/W4401453527","doi":"https://doi.org/10.1109/tim.2024.3441018","title":"DEO-Net: Joint Density Estimation and Object Detection for Crowd Counting","display_name":"DEO-Net: Joint Density Estimation and Object Detection for Crowd Counting","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4401453527","doi":"https://doi.org/10.1109/tim.2024.3441018"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3441018","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3441018","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053046364","display_name":"Duc Tri Phan","orcid":"https://orcid.org/0000-0002-1042-5032"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Duc Tri Phan","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore"],"raw_orcid":"https://orcid.org/0000-0002-1042-5032","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034411608","display_name":"Jianjun Gao","orcid":"https://orcid.org/0009-0004-9137-2869"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Jianjun Gao","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore"],"raw_orcid":"https://orcid.org/0009-0004-9137-2869","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101138518","display_name":"Ye Lu","orcid":"https://orcid.org/0009-0009-4948-9680"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Ye Lu","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore"],"raw_orcid":"https://orcid.org/0009-0009-4948-9680","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022468480","display_name":"Kim\u2013Hui Yap","orcid":"https://orcid.org/0000-0003-1933-4986"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Kim-Hui Yap","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore"],"raw_orcid":"https://orcid.org/0000-0003-1933-4986","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071376919","display_name":"Kratika Garg","orcid":"https://orcid.org/0000-0003-3937-4395"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Kratika Garg","raw_affiliation_strings":["Schaeffler Hub for Advanced Research, Nanyang Technological University, Jurong West, Singapore"],"raw_orcid":"https://orcid.org/0000-0003-3937-4395","affiliations":[{"raw_affiliation_string":"Schaeffler Hub for Advanced Research, Nanyang Technological University, Jurong West, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037005256","display_name":"Boon Siew Han","orcid":"https://orcid.org/0000-0003-1707-2855"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Boon Siew Han","raw_affiliation_strings":["Schaeffler Hub for Advanced Research, Nanyang Technological University, Jurong West, Singapore"],"raw_orcid":"https://orcid.org/0000-0003-1707-2855","affiliations":[{"raw_affiliation_string":"Schaeffler Hub for Advanced Research, Nanyang Technological University, Jurong West, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":2.6568,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.91154773,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10331","display_name":"Video Surveillance and Tracking Methods","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10331","display_name":"Video Surveillance and Tracking Methods","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12597","display_name":"Fire Detection and Safety Systems","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/joint","display_name":"Joint (building)","score":0.7308675050735474},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.609670102596283},{"id":"https://openalex.org/keywords/object-detection","display_name":"Object detection","score":0.6052402257919312},{"id":"https://openalex.org/keywords/object","display_name":"Object (grammar)","score":0.5496670603752136},{"id":"https://openalex.org/keywords/net","display_name":"Net (polyhedron)","score":0.45343366265296936},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.44202369451522827},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4343038499355316},{"id":"https://openalex.org/keywords/density-estimation","display_name":"Density estimation","score":0.43218088150024414},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.2791655659675598},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2010895311832428},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20059025287628174},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17698654532432556}],"concepts":[{"id":"https://openalex.org/C18555067","wikidata":"https://www.wikidata.org/wiki/Q8375051","display_name":"Joint (building)","level":2,"score":0.7308675050735474},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.609670102596283},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.6052402257919312},{"id":"https://openalex.org/C2781238097","wikidata":"https://www.wikidata.org/wiki/Q175026","display_name":"Object (grammar)","level":2,"score":0.5496670603752136},{"id":"https://openalex.org/C14166107","wikidata":"https://www.wikidata.org/wiki/Q253829","display_name":"Net (polyhedron)","level":2,"score":0.45343366265296936},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.44202369451522827},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4343038499355316},{"id":"https://openalex.org/C189508267","wikidata":"https://www.wikidata.org/wiki/Q17088227","display_name":"Density estimation","level":3,"score":0.43218088150024414},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.2791655659675598},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2010895311832428},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20059025287628174},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17698654532432556},{"id":"https://openalex.org/C185429906","wikidata":"https://www.wikidata.org/wiki/Q1130160","display_name":"Estimator","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C170154142","wikidata":"https://www.wikidata.org/wiki/Q150737","display_name":"Architectural engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2024.3441018","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3441018","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:dr.ntu.edu.sg:10356/180575","is_oa":false,"landing_page_url":"https://hdl.handle.net/10356/180575","pdf_url":null,"source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5565881823","display_name":null,"funder_award_id":"IAF-ICP Programme I2001E0067","funder_id":"https://openalex.org/F4320320696","funder_display_name":"Agency for Science, Technology and Research"}],"funders":[{"id":"https://openalex.org/F4320320696","display_name":"Agency for Science, Technology and Research","ror":"https://ror.org/036wvzt09"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":62,"referenced_works":["https://openalex.org/W1981781955","https://openalex.org/W2060022598","https://openalex.org/W2099474155","https://openalex.org/W2150319071","https://openalex.org/W2463631526","https://openalex.org/W2541389513","https://openalex.org/W2621315482","https://openalex.org/W2729018917","https://openalex.org/W2741077351","https://openalex.org/W2798490576","https://openalex.org/W2798781811","https://openalex.org/W2884960332","https://openalex.org/W2886443245","https://openalex.org/W2895051362","https://openalex.org/W2949333977","https://openalex.org/W2954567092","https://openalex.org/W2963035940","https://openalex.org/W2963901365","https://openalex.org/W2964203052","https://openalex.org/W2964209782","https://openalex.org/W2966926453","https://openalex.org/W2967069910","https://openalex.org/W2969079301","https://openalex.org/W2969620138","https://openalex.org/W2982021328","https://openalex.org/W2995582330","https://openalex.org/W3003381204","https://openalex.org/W3004672782","https://openalex.org/W3015469128","https://openalex.org/W3034785991","https://openalex.org/W3047585969","https://openalex.org/W3097305524","https://openalex.org/W3107554785","https://openalex.org/W3132588545","https://openalex.org/W3142849873","https://openalex.org/W3155536271","https://openalex.org/W3164972083","https://openalex.org/W3175676754","https://openalex.org/W3176458063","https://openalex.org/W3196749167","https://openalex.org/W3203845557","https://openalex.org/W4206389547","https://openalex.org/W4224072402","https://openalex.org/W4292102446","https://openalex.org/W4294310792","https://openalex.org/W4309903996","https://openalex.org/W4312391253","https://openalex.org/W4312658000","https://openalex.org/W4313254646","https://openalex.org/W4318478414","https://openalex.org/W4318570474","https://openalex.org/W4319300985","https://openalex.org/W4319996179","https://openalex.org/W4321380878","https://openalex.org/W4321505055","https://openalex.org/W4372265915","https://openalex.org/W4382567984","https://openalex.org/W4385257175","https://openalex.org/W4385757103","https://openalex.org/W6783507135","https://openalex.org/W6795728921","https://openalex.org/W6842538345"],"related_works":["https://openalex.org/W2912321008","https://openalex.org/W1998607122","https://openalex.org/W2324368075","https://openalex.org/W2972124131","https://openalex.org/W338149487","https://openalex.org/W4403012196","https://openalex.org/W2972032537","https://openalex.org/W150363521","https://openalex.org/W4292830139","https://openalex.org/W4319309705"],"abstract_inverted_index":{"Automated":[0],"crowd":[1,11,71,90],"counting":[2],"has":[3],"emerged":[4],"as":[5,80],"a":[6,40],"vision-based":[7],"measurement":[8],"method":[9],"for":[10,87],"analysis":[12],"and":[13,30,48,66,105,114,118,142,149],"management.":[14],"However,":[15],"current":[16],"methods":[17,69],"based":[18],"on":[19,144],"density":[20,46,57,67],"maps":[21],"still":[22],"suffer":[23],"from":[24],"challenges":[25],"related":[26],"to":[27,54,108],"background":[28],"noise":[29],"blurring":[31],"effects.":[32],"To":[33],"address":[34],"the":[35,62,93,120,124,129,145],"limitations,":[36],"this":[37,77],"work":[38],"proposes":[39],"deep":[41],"neural":[42],"network,":[43],"named":[44],"joint":[45],"estimation":[47,58],"object":[49,85],"detection":[50,65,86],"(DEO-Net),":[51],"specifically":[52],"designed":[53],"generate":[55],"high-quality":[56],"maps.":[59],"DEO-Net":[60,83,131],"bridges":[61],"gap":[63],"between":[64],"estimation-based":[68],"in":[70],"counting.":[72],"The":[73],"key":[74],"contributions":[75],"of":[76,128,138],"research":[78],"are":[79],"follows:":[81],"1)":[82],"incorporates":[84],"more":[88],"accurate":[89],"localization;":[91],"2)":[92],"network":[94],"training":[95],"is":[96],"optimized":[97],"with":[98,132],"an":[99],"independent":[100],"structural":[101,112],"similarity":[102],"index":[103],"(I-SSIM)":[104],"curriculum":[106],"losses":[107],"better":[109],"learn":[110],"local":[111,116],"information":[113],"recognize":[115],"maxima;":[117],"3)":[119],"experimental":[121],"results":[122],"demonstrate":[123],"state-of-the-art":[125],"(SOTA)":[126],"performance":[127],"proposed":[130],"mean":[133],"absolute":[134],"error":[135],"(MAE)":[136],"values":[137],"54.2,":[139],"6.2,":[140],"83.1,":[141],"57.3":[143],"ShangHaiTechA,":[146],"ShanghaiTechB,":[147],"UCF_QNRF,":[148],"JHU-CROWD++":[150],"public":[151],"datasets,":[152],"respectively.":[153]},"counts_by_year":[{"year":2026,"cited_by_count":6},{"year":2025,"cited_by_count":7}],"updated_date":"2025-12-23T23:11:35.936235","created_date":"2025-10-10T00:00:00"}