{"id":"https://openalex.org/W4401416696","doi":"https://doi.org/10.1109/tim.2024.3440392","title":"An Intrascene Wide Dynamic Range CMOS Image Sensor Using Dual-Gain Ramp Generator for Machine Vision Applications","display_name":"An Intrascene Wide Dynamic Range CMOS Image Sensor Using Dual-Gain Ramp Generator for Machine Vision Applications","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4401416696","doi":"https://doi.org/10.1109/tim.2024.3440392"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3440392","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3440392","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065415678","display_name":"Hyeon\u2010June Kim","orcid":"https://orcid.org/0000-0002-0516-5811"},"institutions":[{"id":"https://openalex.org/I118373667","display_name":"Seoul National University of Science and Technology","ror":"https://ror.org/00chfja07","country_code":"KR","type":"education","lineage":["https://openalex.org/I118373667"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Hyeon-June Kim","raw_affiliation_strings":["Department of Semiconductor Engineering, Seoul National University of Science and Technology, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-0516-5811","affiliations":[{"raw_affiliation_string":"Department of Semiconductor Engineering, Seoul National University of Science and Technology, Seoul, South Korea","institution_ids":["https://openalex.org/I118373667"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102910763","display_name":"Soon-Kyu Kwon","orcid":null},"institutions":[{"id":"https://openalex.org/I118373667","display_name":"Seoul National University of Science and Technology","ror":"https://ror.org/00chfja07","country_code":"KR","type":"education","lineage":["https://openalex.org/I118373667"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Soon-Kyu Kwon","raw_affiliation_strings":["Department of Semiconductor Engineering, Seoul National University of Science and Technology, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0002-8274-6000","affiliations":[{"raw_affiliation_string":"Department of Semiconductor Engineering, Seoul National University of Science and Technology, Seoul, South Korea","institution_ids":["https://openalex.org/I118373667"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053008124","display_name":"T.B. Eom","orcid":null},"institutions":[{"id":"https://openalex.org/I118373667","display_name":"Seoul National University of Science and Technology","ror":"https://ror.org/00chfja07","country_code":"KR","type":"education","lineage":["https://openalex.org/I118373667"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Tae-Hoon Eom","raw_affiliation_strings":["Department of Semiconductor Engineering, Seoul National University of Science and Technology, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0002-5713-6753","affiliations":[{"raw_affiliation_string":"Department of Semiconductor Engineering, Seoul National University of Science and Technology, Seoul, South Korea","institution_ids":["https://openalex.org/I118373667"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5065415678"],"corresponding_institution_ids":["https://openalex.org/I118373667"],"apc_list":null,"apc_paid":null,"fwci":0.6009,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.67242315,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9635999798774719,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.646483302116394},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6040908098220825},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5726380348205566},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.5726377964019775},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.5590810775756836},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.5431716442108154},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5362545847892761},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5030547976493835},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.4919426143169403},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43705514073371887},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.4291020333766937},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.42755988240242004},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35267192125320435},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.3192550539970398},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28589871525764465},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1361633539199829},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.11297234892845154}],"concepts":[{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.646483302116394},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6040908098220825},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5726380348205566},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.5726377964019775},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.5590810775756836},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.5431716442108154},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5362545847892761},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5030547976493835},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.4919426143169403},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43705514073371887},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.4291020333766937},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.42755988240242004},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35267192125320435},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3192550539970398},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28589871525764465},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1361633539199829},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.11297234892845154},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3440392","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3440392","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6600000262260437,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W594546823","https://openalex.org/W1861492603","https://openalex.org/W2031533823","https://openalex.org/W2078933705","https://openalex.org/W2175009324","https://openalex.org/W2292489093","https://openalex.org/W2744769585","https://openalex.org/W2801260409","https://openalex.org/W2914578648","https://openalex.org/W2993883558","https://openalex.org/W2996765167","https://openalex.org/W3012438093","https://openalex.org/W3036519573","https://openalex.org/W3081339852","https://openalex.org/W3096649732","https://openalex.org/W3112867989","https://openalex.org/W3125010583","https://openalex.org/W3126311595","https://openalex.org/W3134599322","https://openalex.org/W3176380480","https://openalex.org/W3207541598","https://openalex.org/W3211569159","https://openalex.org/W4285182062","https://openalex.org/W4285280748","https://openalex.org/W4304732085","https://openalex.org/W4362563509","https://openalex.org/W6950310954"],"related_works":["https://openalex.org/W4385733096","https://openalex.org/W1966415111","https://openalex.org/W2093540298","https://openalex.org/W2160828022","https://openalex.org/W2129163123","https://openalex.org/W2136888551","https://openalex.org/W2562583481","https://openalex.org/W2139639880","https://openalex.org/W2058488758","https://openalex.org/W2028348614"],"abstract_inverted_index":{"This":[0,83,161],"study":[1],"presents":[2,113],"an":[3,114],"advanced":[4],"dual-imaging":[5,145],"CMOS":[6],"image":[7,109],"sensor":[8],"(CIS)":[9],"optimized":[10],"for":[11,153,158],"intrascene":[12,155],"wide":[13],"dynamic":[14],"range":[15],"(WDR)":[16],"machine":[17,159],"vision":[18],"applications.":[19],"Based":[20],"on":[21],"examining":[22],"the":[23,44,64,68,78,108,123,134,165,224],"operational":[24],"characteristic":[25],"and":[26,59,209,240],"structure":[27],"of":[28,47,71,92,187,206,214,226,229],"traditional":[29],"ramp":[30,48,139],"signal":[31,41,81],"generator":[32],"used":[33],"in":[34,138],"CISs,":[35],"we":[36],"proposed":[37,65,79,166],"a":[38,57,142,150,173,184,203,211],"new":[39],"dual-ramp":[40,80],"generator,":[42],"enabling":[43],"concurrent":[45],"generation":[46],"signals":[49],"with":[50,74,164,183,202],"diverse":[51],"analog":[52],"gains":[53],"(AGs).":[54],"By":[55],"employing":[56],"top":[58],"bottom":[60],"readout":[61],"array":[62],"configuration,":[63],"CIS":[66,146,163,181,200,222],"enables":[67,85],"simultaneous":[69],"conversion":[70],"pixel":[72,94,185],"data":[73],"differing":[75],"AGs":[76],"using":[77,172],"generator.":[82],"approach":[84],"real-time":[86],"dual":[87],"imaging":[88,157],"without":[89],"any":[90],"modification":[91],"standard":[93],"structures,":[95],"effectively":[96,121],"accommodating":[97],"varying":[98],"light":[99],"intensities":[100],"while":[101],"avoiding":[102],"motion":[103],"artifacts.":[104],"To":[105],"further":[106],"enhance":[107],"quality,":[110],"this":[111,144],"work":[112],"efficient":[115],"two-step":[116],"pre-emphasis":[117],"ramping":[118],"technique.":[119],"It":[120],"minimizes":[122],"column":[124],"fixed":[125],"pattern":[126],"noise":[127],"(CFPN)":[128],"that":[129],"typically":[130],"arises":[131],"due":[132],"to":[133],"inherent":[135],"gain":[136],"changes":[137],"generators.":[140],"As":[141],"result,":[143],"can":[147],"serve":[148],"as":[149],"promising":[151],"solution":[152],"effective":[154],"WDR":[156],"vision.":[160],"prototype":[162,199,221],"edge":[167],"detection":[168],"counter":[169],"was":[170],"fabricated":[171],"0.11-<inline-formula":[174],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[175,191,233,242,249],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[176,192,234,243,250],"<tex-math":[177,193,235,244,251],"notation=\"LaTeX\">$\\mu":[178],"$":[179],"</tex-math></inline-formula>m":[180],"process":[182],"resolution":[186],"1280":[188],"(H)":[189],"<inline-formula":[190,232,241],"notation=\"LaTeX\">$\\times":[194],"720$":[195],"</tex-math></inline-formula>":[196],"(V).":[197],"The":[198,220],"operates":[201],"power":[204],"consumption":[205],"6.31":[207],"mW":[208],"achieves":[210],"frame":[212],"rate":[213],"59":[215],"frames":[216],"per":[217],"second":[218],"(fps).":[219],"demonstrated":[223],"figures":[225],"merits":[227],"(FoMs)":[228],"116.1":[230],"pJ/frame/pixel,":[231],"notation=\"LaTeX\">$36.04{\\%}\\cdot":[236],"\\text":[237,246],"{fJ}$":[238,247],"</tex-math></inline-formula>/frame/pixel,":[239],"notation=\"LaTeX\">$0.035{\\%}\\cdot":[245],"</tex-math></inline-formula>/frame/pixel/<inline-formula":[248],"notation=\"LaTeX\">$2^{\\text":[252],"{N}}$":[253],"</tex-math></inline-formula>.":[254]},"counts_by_year":[{"year":2025,"cited_by_count":3}],"updated_date":"2025-12-26T23:08:49.675405","created_date":"2025-10-10T00:00:00"}