{"id":"https://openalex.org/W4401415452","doi":"https://doi.org/10.1109/tim.2024.3440375","title":"An Impact Velocity Measurement System for Electromagnetic Forming Process","display_name":"An Impact Velocity Measurement System for Electromagnetic Forming Process","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4401415452","doi":"https://doi.org/10.1109/tim.2024.3440375"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3440375","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3440375","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101955241","display_name":"Yao Chen","orcid":"https://orcid.org/0009-0009-4402-856X"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yao Chen","raw_affiliation_strings":["Wuhan National High Magnetic Field Center and the State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0009-0009-4402-856X","affiliations":[{"raw_affiliation_string":"Wuhan National High Magnetic Field Center and the State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008927953","display_name":"Zelin Wu","orcid":"https://orcid.org/0000-0002-3760-5041"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zelin Wu","raw_affiliation_strings":["Interdisciplinary Center of High Magnetic Field Physics, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China"],"raw_orcid":"https://orcid.org/0000-0002-3760-5041","affiliations":[{"raw_affiliation_string":"Interdisciplinary Center of High Magnetic Field Physics, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063750451","display_name":"Runze Liu","orcid":"https://orcid.org/0009-0005-3740-8311"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Runze Liu","raw_affiliation_strings":["Wuhan National High Magnetic Field Center and the State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0009-0005-3740-8311","affiliations":[{"raw_affiliation_string":"Wuhan National High Magnetic Field Center and the State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002783345","display_name":"Yifan Huang","orcid":"https://orcid.org/0009-0005-0951-7537"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yifan Huang","raw_affiliation_strings":["Wuhan National High Magnetic Field Center and the State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0009-0005-0951-7537","affiliations":[{"raw_affiliation_string":"Wuhan National High Magnetic Field Center and the State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011468770","display_name":"Hanshi Zeng","orcid":"https://orcid.org/0009-0007-1624-0884"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hanshi Zeng","raw_affiliation_strings":["Wuhan National High Magnetic Field Center and the State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0009-0007-1624-0884","affiliations":[{"raw_affiliation_string":"Wuhan National High Magnetic Field Center and the State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089026547","display_name":"Xiaotao Han","orcid":"https://orcid.org/0000-0002-7089-9598"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaotao Han","raw_affiliation_strings":["Wuhan National High Magnetic Field Center and the State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0002-7089-9598","affiliations":[{"raw_affiliation_string":"Wuhan National High Magnetic Field Center and the State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1127983,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10700","display_name":"Metal Forming Simulation Techniques","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10700","display_name":"Metal Forming Simulation Techniques","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13965","display_name":"Laser and Thermal Forming Techniques","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11201","display_name":"Metallurgy and Material Forming","score":0.9882000088691711,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5362090468406677},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3924484848976135},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.33236247301101685},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.330751895904541},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33022817969322205},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.321427583694458},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.31440114974975586}],"concepts":[{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5362090468406677},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3924484848976135},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.33236247301101685},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.330751895904541},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33022817969322205},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.321427583694458},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.31440114974975586},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3440375","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3440375","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4178502374","display_name":null,"funder_award_id":"52077092","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4549248861","display_name":null,"funder_award_id":"2023M732346","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321543","display_name":"China Postdoctoral Science Foundation","ror":"https://ror.org/0426zh255"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1796387312","https://openalex.org/W2015238062","https://openalex.org/W2023856147","https://openalex.org/W2037334870","https://openalex.org/W2038376475","https://openalex.org/W2040994860","https://openalex.org/W2053944822","https://openalex.org/W2066071523","https://openalex.org/W2084633070","https://openalex.org/W2160312516","https://openalex.org/W2246561929","https://openalex.org/W2368607537","https://openalex.org/W2768545184","https://openalex.org/W3024992794","https://openalex.org/W3203314966","https://openalex.org/W4223565121","https://openalex.org/W4225806160","https://openalex.org/W4283374991","https://openalex.org/W4289313591","https://openalex.org/W4308908851","https://openalex.org/W4324139199","https://openalex.org/W4385607514","https://openalex.org/W4388540583","https://openalex.org/W4389681519","https://openalex.org/W4389723569","https://openalex.org/W6620585333"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2031453039","https://openalex.org/W2549138563","https://openalex.org/W2335010068","https://openalex.org/W2899315007","https://openalex.org/W1969976809","https://openalex.org/W2035889111","https://openalex.org/W4241891915","https://openalex.org/W4382136933","https://openalex.org/W1972818812"],"abstract_inverted_index":{"Electromagnetic":[0],"forming":[1],"(EMF)":[2],"is":[3,49,65,148,157,167,177,189,220,251],"a":[4,53,114,208],"high-speed":[5,229],"process":[6,38],"that":[7,239],"uses":[8],"pulsed":[9],"electromagnetic":[10],"force":[11],"to":[12,35,42,51,127],"drive":[13],"metal":[14],"forming.":[15],"The":[16,61,134,159,179,222,235],"impact":[17,212,249],"velocity":[18,213,250],"significantly":[19],"affects":[20],"the":[21,25,28,37,43,79,96,101,105,109,137,141,145,155,164,170,174,182,186,192,197,204,217,240,245,262,267],"deformation":[22],"behavior":[23],"of":[24,45,81,108,136,140,163,173,181,196,244],"workpiece":[26],"in":[27,76,95,131,266],"die":[29],"and":[30,68,86,103,120,154,169,191,194,210,224,232,248,253,260],"it":[31,48],"can":[32],"be":[33],"used":[34,75],"guide":[36],"parameters":[39,139,184],"design.":[40],"Due":[41],"constraints":[44],"narrow":[46],"space,":[47],"difficult":[50],"construct":[52],"suitable":[54],"optical":[55],"path":[56],"for":[57,216,264],"noncontact":[58],"measurement":[59,63,112,146,165,198,214],"methods.":[60],"tactile":[62,111],"device":[64],"another":[66],"low-cost":[67,110,211],"effective":[69],"method,":[70,113],"but":[71],"most":[72],"designs":[73],"currently":[74],"EMF":[77,97,218,268],"have":[78],"shortcomings":[80],"inconsequence":[82],"contact":[83,117],"probe":[84,118,142],"structure":[85,119,143,156],"low":[87],"signal-to-noise":[88],"ratio":[89],"(SNR),":[90],"which":[91,256],"limit":[92],"their":[93],"application":[94,106,265],"process.":[98,269],"To":[99],"improve":[100],"performance":[102,259],"broaden":[104],"scope":[107],"more":[115],"durable":[116],"easily":[121],"implemented":[122],"external":[123],"circuit":[124,161,183,205],"topology":[125],"connected":[126],"probes":[128],"are":[129,200,226],"introduced":[130],"this":[132],"article.":[133],"influence":[135,180],"characteristic":[138],"on":[144,185],"results":[147,237],"investigated":[149],"through":[150,228],"finite":[151],"element":[152],"simulation":[153,233],"optimized.":[158],"equivalent":[160],"diagram":[162],"system":[166,199,215],"constructed":[168],"analytical":[171],"expression":[172],"output":[175,187],"signal":[176,188],"derived.":[178],"analyzed,":[190],"stability":[193],"SNR":[195],"improved":[201],"by":[202],"optimizing":[203],"parameters.":[206],"Therefore,":[207],"robust":[209],"experiment":[219],"constructed.":[221],"accuracy":[223],"feasibility":[225],"confirmed":[227],"camera":[230],"experiments":[231],"analysis.":[234],"experimental":[236],"show":[238],"maximum":[241],"relative":[242],"error":[243],"collision":[246],"moment":[247],"3.32%":[252],"7.34%,":[254],"respectively,":[255],"shows":[257],"good":[258],"confirms":[261],"potential":[263]},"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}