{"id":"https://openalex.org/W4400112003","doi":"https://doi.org/10.1109/tim.2024.3420370","title":"Multifunctional Wideband Digital Sampling System for the Calibration of Conventional Transformers and Electronic Transformers","display_name":"Multifunctional Wideband Digital Sampling System for the Calibration of Conventional Transformers and Electronic Transformers","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4400112003","doi":"https://doi.org/10.1109/tim.2024.3420370"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3420370","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3420370","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033526070","display_name":"Yang Pan","orcid":"https://orcid.org/0000-0003-2677-172X"},"institutions":[{"id":"https://openalex.org/I4210105460","display_name":"Shanghai Institute of Measurement and Testing Technology","ror":"https://ror.org/00zcefp03","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210105460"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Pan","raw_affiliation_strings":["Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0003-2677-172X","affiliations":[{"raw_affiliation_string":"Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China","institution_ids":["https://openalex.org/I4210105460"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5099634747","display_name":"Ji Geng","orcid":"https://orcid.org/0009-0009-9059-0203"},"institutions":[{"id":"https://openalex.org/I4210105460","display_name":"Shanghai Institute of Measurement and Testing Technology","ror":"https://ror.org/00zcefp03","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210105460"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ji Geng","raw_affiliation_strings":["Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0009-9059-0203","affiliations":[{"raw_affiliation_string":"Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China","institution_ids":["https://openalex.org/I4210105460"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037974028","display_name":"Liren Zhou","orcid":"https://orcid.org/0000-0002-2288-0120"},"institutions":[{"id":"https://openalex.org/I4210105460","display_name":"Shanghai Institute of Measurement and Testing Technology","ror":"https://ror.org/00zcefp03","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210105460"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liren Zhou","raw_affiliation_strings":["Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-2288-0120","affiliations":[{"raw_affiliation_string":"Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China","institution_ids":["https://openalex.org/I4210105460"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056326942","display_name":"Lei Lai","orcid":"https://orcid.org/0000-0001-7850-9278"},"institutions":[{"id":"https://openalex.org/I4210105460","display_name":"Shanghai Institute of Measurement and Testing Technology","ror":"https://ror.org/00zcefp03","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210105460"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Lai","raw_affiliation_strings":["Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-7850-9278","affiliations":[{"raw_affiliation_string":"Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China","institution_ids":["https://openalex.org/I4210105460"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063896472","display_name":"Guozhong Zhan","orcid":"https://orcid.org/0000-0002-9402-3224"},"institutions":[{"id":"https://openalex.org/I4210105460","display_name":"Shanghai Institute of Measurement and Testing Technology","ror":"https://ror.org/00zcefp03","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210105460"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guozhong Zhan","raw_affiliation_strings":["Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-9402-3224","affiliations":[{"raw_affiliation_string":"Division of Electron and Electricity Measurement Technology, Shanghai Institute of Measurement and Testing Technology, Shanghai, China","institution_ids":["https://openalex.org/I4210105460"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001452215","display_name":"Haiming Shao","orcid":"https://orcid.org/0000-0002-3305-4190"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiming Shao","raw_affiliation_strings":["Division of Electrical and Magnetic Metrology, National Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-3305-4190","affiliations":[{"raw_affiliation_string":"Division of Electrical and Magnetic Metrology, National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7425,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.7027557,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.6909524202346802},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5225529074668884},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.5216046571731567},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5097793936729431},{"id":"https://openalex.org/keywords/current-transformer","display_name":"Current transformer","score":0.4864199161529541},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.37987542152404785},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3743789494037628},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.28401967883110046}],"concepts":[{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.6909524202346802},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5225529074668884},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.5216046571731567},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5097793936729431},{"id":"https://openalex.org/C133770746","wikidata":"https://www.wikidata.org/wiki/Q856535","display_name":"Current transformer","level":4,"score":0.4864199161529541},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.37987542152404785},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3743789494037628},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.28401967883110046}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3420370","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3420370","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.75,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G5542139164","display_name":null,"funder_award_id":"2017YFF0205703","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1974805703","https://openalex.org/W2022055390","https://openalex.org/W2039174692","https://openalex.org/W2086094659","https://openalex.org/W2107235498","https://openalex.org/W2129833793","https://openalex.org/W2171234070","https://openalex.org/W2513227298","https://openalex.org/W2898951697","https://openalex.org/W3086784370","https://openalex.org/W4210809922","https://openalex.org/W4312455288"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W3112081258","https://openalex.org/W1480343695","https://openalex.org/W2315892906","https://openalex.org/W4384026382","https://openalex.org/W2392214114","https://openalex.org/W2864363823","https://openalex.org/W2907578801","https://openalex.org/W2061312429","https://openalex.org/W3023145401"],"abstract_inverted_index":{"The":[0],"calibration":[1,29,50,126,136],"system":[2,30,51],"for":[3,31,60,70,94,109,134,158,174],"conventional":[4,37,53],"instrument":[5,54],"transformers":[6,13,34,38,55,176],"does":[7],"not":[8],"apply":[9],"to":[10,90,124,140,145,178],"the":[11,17,20,75,80,92,118,125,135],"electronic":[12,33],"(ECT/EVT)":[14],"that":[15],"meet":[16],"requirements":[18],"of":[19,137],"IEC61850-9-2":[21],"digital":[22,44],"substation":[23],"protocol.":[24],"In":[25],"this":[26],"article,":[27],"a":[28,84,188],"both":[32],"(ETs)":[35],"and":[36,64,111,121,150,160,163,166],"based":[39],"on":[40],"sampling":[41],"techniques":[42],"using":[43],"multimeters":[45],"(DMMs)":[46],"is":[47,101,143],"reported.":[48],"This":[49,115],"uses":[52],"as":[56,103],"references,":[57],"noninductance":[58],"shunts":[59],"current-voltage":[61],"(I/V)":[62],"conversion,":[63],"an":[65],"inductive":[66],"voltage":[67,175],"divider":[68],"(IVD)":[69],"secondary":[71],"attenuation.":[72],"Having":[73],"received":[74],"pulse-per-second":[76],"(PPS)":[77],"signal":[78],"from":[79],"merging":[81],"unit":[82],"(MU),":[83],"function":[85],"generator":[86],"(FG)":[87],"burst":[88],"pulses":[89],"trigger":[91],"DMMs":[93],"synchronous":[95],"sampling.":[96],"An":[97],"improved":[98],"quasi-synchronization":[99],"algorithm":[100],"adopted":[102],"windowed":[104],"discrete":[105],"Fourier":[106],"transform":[107],"(DFT)":[108],"ratio":[110,159],"phase":[112,161],"displacement":[113,162],"calculation.":[114],"article":[116],"analyses":[117],"uncertainty":[119],"contributions":[120],"makes":[122],"corrections":[123],"results.":[127],"Uncertainty":[128],"evaluation":[129],"under":[130],"power":[131],"frequency":[132],"proposed":[133],"CT":[138],"up":[139,177],"10":[141,148],"kA":[142],"estimated":[144],"be":[146],"within":[147],"ppm":[149,165],"<inline-formula":[151,167],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[152,168,181],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[153,169,182],"<tex-math":[154,170,183],"notation=\"LaTeX\">$15~\\mu":[155],"$":[156,172],"</tex-math></inline-formula>rad":[157,173],"25":[164],"notation=\"LaTeX\">$30~\\mu":[171],"500":[179],"kV/<inline-formula":[180],"notation=\"LaTeX\">$\\surd":[184],"3$":[185],"</tex-math></inline-formula>":[186],"with":[187],"coverage":[189],"factor":[190],"k":[191],"=2.":[192]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}