{"id":"https://openalex.org/W4400111975","doi":"https://doi.org/10.1109/tim.2024.3420361","title":"A High-Quality GAN With Data Augmentation for Aircraft Skin Defect Detection Under Limited Data","display_name":"A High-Quality GAN With Data Augmentation for Aircraft Skin Defect Detection Under Limited Data","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4400111975","doi":"https://doi.org/10.1109/tim.2024.3420361"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3420361","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3420361","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017996419","display_name":"Huipeng Li","orcid":"https://orcid.org/0000-0002-2893-9277"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Huipeng Li","raw_affiliation_strings":["College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-2893-9277","affiliations":[{"raw_affiliation_string":"College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079443528","display_name":"Congqing Wang","orcid":"https://orcid.org/0000-0003-2874-7678"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Congqing Wang","raw_affiliation_strings":["College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0003-2874-7678","affiliations":[{"raw_affiliation_string":"College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100707400","display_name":"Yang Liu","orcid":"https://orcid.org/0000-0002-1798-9033"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Liu","raw_affiliation_strings":["College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-1798-9033","affiliations":[{"raw_affiliation_string":"College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5017996419"],"corresponding_institution_ids":["https://openalex.org/I9842412"],"apc_list":null,"apc_paid":null,"fwci":1.6653,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.85051776,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9869999885559082,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.984000027179718,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6054074764251709},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5684822797775269},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.45161890983581543},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3898738622665405},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3577815890312195},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3299177587032318},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21379926800727844},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12959697842597961}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6054074764251709},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5684822797775269},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.45161890983581543},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3898738622665405},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3577815890312195},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3299177587032318},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21379926800727844},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12959697842597961},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3420361","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3420361","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7764154016","display_name":null,"funder_award_id":"61573185","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322438","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":66,"referenced_works":["https://openalex.org/W2132984323","https://openalex.org/W2512804051","https://openalex.org/W2565639579","https://openalex.org/W2746314669","https://openalex.org/W2952716587","https://openalex.org/W2962793481","https://openalex.org/W2963045696","https://openalex.org/W2963073614","https://openalex.org/W2963231598","https://openalex.org/W2963373786","https://openalex.org/W2963684088","https://openalex.org/W2963981733","https://openalex.org/W2965141076","https://openalex.org/W2966341653","https://openalex.org/W2972309292","https://openalex.org/W2972581882","https://openalex.org/W2982770724","https://openalex.org/W2997095758","https://openalex.org/W2998508940","https://openalex.org/W3003301247","https://openalex.org/W3034720584","https://openalex.org/W3034942609","https://openalex.org/W3036167779","https://openalex.org/W3099088591","https://openalex.org/W3099364866","https://openalex.org/W3121370741","https://openalex.org/W3168053944","https://openalex.org/W3171615848","https://openalex.org/W3174807077","https://openalex.org/W3176663332","https://openalex.org/W3181955432","https://openalex.org/W3184439416","https://openalex.org/W3203533989","https://openalex.org/W3204290292","https://openalex.org/W3214536939","https://openalex.org/W4225672217","https://openalex.org/W4226324275","https://openalex.org/W4280571817","https://openalex.org/W4280588274","https://openalex.org/W4285188260","https://openalex.org/W4285981784","https://openalex.org/W4294643831","https://openalex.org/W4305031114","https://openalex.org/W4312364770","https://openalex.org/W4313491188","https://openalex.org/W4380244347","https://openalex.org/W4390442884","https://openalex.org/W6679045638","https://openalex.org/W6685352114","https://openalex.org/W6718379498","https://openalex.org/W6741832134","https://openalex.org/W6743428213","https://openalex.org/W6745560452","https://openalex.org/W6755312952","https://openalex.org/W6762931180","https://openalex.org/W6779093361","https://openalex.org/W6779823529","https://openalex.org/W6780507278","https://openalex.org/W6783713337","https://openalex.org/W6788990321","https://openalex.org/W6797179183","https://openalex.org/W6798838024","https://openalex.org/W6802431797","https://openalex.org/W6803132585","https://openalex.org/W6804043765","https://openalex.org/W6846390060"],"related_works":["https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W2898370298","https://openalex.org/W2137437058","https://openalex.org/W4390401159","https://openalex.org/W2744391499","https://openalex.org/W2800070131","https://openalex.org/W4230250635","https://openalex.org/W3041790586","https://openalex.org/W2018879842"],"abstract_inverted_index":{"Aircraft":[0],"skin":[1,77,143,194],"defect":[2,18,32,46,144,202],"detection":[3,19,33,203],"is":[4,21,87,121,146,155,174,184],"one":[5],"of":[6,17,34,44,55,75,96,113,137,159,186,192,201],"the":[7,11,15,42,53,90,94,110,114,124,130,135,167,178,199],"crucial":[8],"steps":[9],"in":[10,89,205],"regular":[12],"maintenance.":[13],"However,":[14],"performance":[16],"algorithms":[20],"limited":[22,56,80],"by":[23],"insufficient":[24,45],"data,":[25,47],"which":[26,126,173,196],"makes":[27],"a":[28,149],"challenge":[29],"for":[30],"automated":[31],"aircraft":[35,76,142,193],"skin.":[36],"Although":[37],"image":[38,67],"generation":[39,68],"techniques":[40],"relieve":[41],"problem":[43],"they":[48],"are":[49,105],"not":[50],"effective":[51],"under":[52,79],"condition":[54],"original":[57,179],"data.":[58,81,180],"To":[59],"tackle":[60],"this":[61,63],"issue,":[62],"article":[64],"proposes":[65],"an":[66,141],"method":[69,154,183],"that":[70],"can":[71,127,170],"obtain":[72],"high-quality":[73],"images":[74,191],"defects":[78],"First,":[82],"high-frequency":[83,100,111],"skip":[84],"connection":[85],"(HSC)":[86],"performed":[88],"generator":[91],"to":[92,107,134],"enhance":[93],"utilization":[95],"frequency":[97],"information.":[98],"Moreover,":[99],"features":[101],"fusion":[102],"blocks":[103],"(HFFBs)":[104],"utilized":[106],"effectively":[108],"improve":[109],"awareness":[112],"discriminator.":[115],"Meanwhile,":[116],"adaptive":[117],"high-dimensional":[118],"diffusion":[119,131],"(AHD)":[120],"introduced":[122],"into":[123],"discriminator,":[125],"automatically":[128],"adjust":[129],"intensity":[132],"according":[133],"degree":[136],"discriminator":[138],"overfitting.":[139],"Finally,":[140],"dataset":[145,169],"constructed":[147],"and":[148,189],"Generation-Poisson":[150],"blending":[151],"data":[152],"augmentation":[153,168],"proposed.":[156],"The":[157,181],"mAP":[158],"you":[160],"only":[161],"look":[162],"once":[163],"(YOLOX)":[164],"trained":[165],"using":[166],"reach":[171],"78.55%,":[172],"5.27%":[175],"higher":[176],"than":[177],"proposed":[182],"capable":[185],"generating":[187],"realistic":[188],"diverse":[190],"defects,":[195],"significantly":[197],"enhances":[198],"precision":[200],"networks":[204],"various":[206],"scenes.":[207]},"counts_by_year":[{"year":2025,"cited_by_count":5}],"updated_date":"2025-12-26T23:08:49.675405","created_date":"2025-10-10T00:00:00"}