{"id":"https://openalex.org/W4401692510","doi":"https://doi.org/10.1109/tim.2024.3420265","title":"AdIn-DETR: Adapting Detection Transformer for End-to-End Real-Time Power Line Insulator Defect Detection","display_name":"AdIn-DETR: Adapting Detection Transformer for End-to-End Real-Time Power Line Insulator Defect Detection","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4401692510","doi":"https://doi.org/10.1109/tim.2024.3420265"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3420265","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3420265","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100349983","display_name":"Yang Cheng","orcid":"https://orcid.org/0000-0002-9793-9211"},"institutions":[{"id":"https://openalex.org/I23632641","display_name":"Shanghai University of Electric Power","ror":"https://ror.org/02w4tny03","country_code":"CN","type":"education","lineage":["https://openalex.org/I23632641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Cheng","raw_affiliation_strings":["College of Computer Science and Technology, Shanghai University of Electric Power, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-9793-9211","affiliations":[{"raw_affiliation_string":"College of Computer Science and Technology, Shanghai University of Electric Power, Shanghai, China","institution_ids":["https://openalex.org/I23632641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053863886","display_name":"Daming Liu","orcid":"https://orcid.org/0000-0002-1774-0721"},"institutions":[{"id":"https://openalex.org/I23632641","display_name":"Shanghai University of Electric Power","ror":"https://ror.org/02w4tny03","country_code":"CN","type":"education","lineage":["https://openalex.org/I23632641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Daming Liu","raw_affiliation_strings":["College of Computer Science and Technology, Shanghai University of Electric Power, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-1774-0721","affiliations":[{"raw_affiliation_string":"College of Computer Science and Technology, Shanghai University of Electric Power, Shanghai, China","institution_ids":["https://openalex.org/I23632641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I23632641"],"apc_list":null,"apc_paid":null,"fwci":10.2243,"has_fulltext":false,"cited_by_count":49,"citation_normalized_percentile":{"value":0.98789728,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/end-to-end-principle","display_name":"End-to-end principle","score":0.5804277658462524},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4936171770095825},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.4548739194869995},{"id":"https://openalex.org/keywords/insulator","display_name":"Insulator (electricity)","score":0.44145455956459045},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43224218487739563},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3423812985420227},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2912302315235138},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2483634054660797},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10969814658164978}],"concepts":[{"id":"https://openalex.org/C74296488","wikidata":"https://www.wikidata.org/wiki/Q2527392","display_name":"End-to-end principle","level":2,"score":0.5804277658462524},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4936171770095825},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.4548739194869995},{"id":"https://openalex.org/C212702","wikidata":"https://www.wikidata.org/wiki/Q178150","display_name":"Insulator (electricity)","level":2,"score":0.44145455956459045},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43224218487739563},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3423812985420227},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2912302315235138},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2483634054660797},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10969814658164978}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3420265","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3420265","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8299999833106995}],"awards":[{"id":"https://openalex.org/G5208012277","display_name":null,"funder_award_id":"23010501500","funder_id":"https://openalex.org/F4320326190","funder_display_name":"Tianjin Science and Technology Committee"}],"funders":[{"id":"https://openalex.org/F4320326190","display_name":"Tianjin Science and Technology Committee","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":55,"referenced_works":["https://openalex.org/W1536680647","https://openalex.org/W1861492603","https://openalex.org/W1978459068","https://openalex.org/W2037123093","https://openalex.org/W2160613239","https://openalex.org/W2194775991","https://openalex.org/W2382849207","https://openalex.org/W2539675563","https://openalex.org/W2807888105","https://openalex.org/W2897772777","https://openalex.org/W2962766617","https://openalex.org/W2962945654","https://openalex.org/W2963026768","https://openalex.org/W2963460174","https://openalex.org/W2963923251","https://openalex.org/W2982770724","https://openalex.org/W3041133507","https://openalex.org/W3096609285","https://openalex.org/W3098389804","https://openalex.org/W3119438769","https://openalex.org/W3122239467","https://openalex.org/W3168867926","https://openalex.org/W3172087149","https://openalex.org/W3174770825","https://openalex.org/W3176828726","https://openalex.org/W3200605425","https://openalex.org/W4205991051","https://openalex.org/W4214627427","https://openalex.org/W4221149036","https://openalex.org/W4226013992","https://openalex.org/W4292972665","https://openalex.org/W4293057111","https://openalex.org/W4301703097","https://openalex.org/W4312312588","https://openalex.org/W4316843048","https://openalex.org/W4320002812","https://openalex.org/W4322766882","https://openalex.org/W4386076325","https://openalex.org/W4390873750","https://openalex.org/W4402754006","https://openalex.org/W6620707391","https://openalex.org/W6681049983","https://openalex.org/W6755682341","https://openalex.org/W6759579507","https://openalex.org/W6784094891","https://openalex.org/W6791353385","https://openalex.org/W6796581206","https://openalex.org/W6809665764","https://openalex.org/W6810879928","https://openalex.org/W6811230874","https://openalex.org/W6838701581","https://openalex.org/W6845583959","https://openalex.org/W6847613944","https://openalex.org/W6848712460","https://openalex.org/W6873058455"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W3179968364","https://openalex.org/W1999612375","https://openalex.org/W2938107654","https://openalex.org/W2151749779","https://openalex.org/W3008587939","https://openalex.org/W3196421258","https://openalex.org/W4387301579","https://openalex.org/W2763956190","https://openalex.org/W2864363823"],"abstract_inverted_index":{"In":[0],"the":[1,12,15,24,35,59,67,71,81,100,145,150,208],"daily":[2],"inspection":[3],"tasks":[4,56,88],"of":[5,11,39,61,103,149],"electric":[6],"power":[7,25,40,108],"companies,":[8],"detecting":[9],"defects":[10,167],"equipment":[13],"on":[14,34,160,192],"high-voltage":[16],"transmission":[17],"lines":[18],"is":[19],"an":[20],"essential":[21],"task,":[22],"especially":[23],"line":[26,109],"insulators":[27,194],"which":[28,204],"can":[29,53,64,156,180],"pose":[30],"a":[31,49,120],"significant":[32],"impact":[33],"stability":[36],"and":[37,44,57,69,89,138,170,183,189,198],"security":[38],"grid":[41],"operations.":[42],"Collecting":[43],"labeling":[45],"data":[46,63],"for":[47,80,107,134,168],"training":[48,62],"well-performing":[50],"deep-leaning":[51],"model":[52,123,179],"be":[54,76],"labor-intensive":[55],"reducing":[58],"amount":[60],"help":[65],"reduce":[66],"costs":[68],"increase":[70],"efficiency.":[72],"Pretrained":[73],"weights":[74,102],"may":[75],"better":[77],"initialization":[78],"points":[79],"object":[82,105],"detection":[83,95,117,122],"optimization":[84],"process":[85],"in":[86],"downstream":[87],"small-sized":[90,162],"datasets,":[91],"such":[92],"as":[93],"defect":[94,121],"tasks.":[96],"To":[97],"effectively":[98],"adapt":[99],"pretrained":[101],"common":[104],"datasets":[106,163],"insulator":[110,116],"detection,":[111],"this":[112],"article":[113,174],"proposes":[114],"adapter-enhanced":[115],"transformer":[118],"(AdIn-DETR),":[119],"with":[124,130,140,187],"two":[125],"proposed":[126,154],"adapter":[127],"modules,":[128],"GSG-Adapter":[129],"Gaussian":[131],"saliency":[132],"guidance":[133],"convolutional":[135],"feature":[136],"modulation":[137],"LFO-Adapter":[139],"looking-forward":[141],"ability":[142],"to":[143,164],"refract":[144],"learned":[146],"relational":[147],"modeling":[148],"decoder":[151],"layers.":[152],"Our":[153],"method":[155],"achieve":[157,181],"competitive":[158],"performance":[159],"relatively":[161],"detect":[165],"bunch-drop":[166],"composite":[169],"glass":[171],"insulators.":[172],"This":[173],"experimentally":[175],"demonstrates":[176],"that":[177],"our":[178],"95.4%":[182],"96.1%":[184],"AP50":[185],"accuracy":[186],"R50":[188],"R101":[190],"backbone":[191],"real-world":[193],"meanwhile":[195],"reaching":[196],"104":[197],"71":[199],"frames":[200],"per":[201],"second":[202],"(FPS)":[203],"are":[205],"faster":[206],"than":[207],"state-of-the-art":[209],"you":[210],"only":[211],"look":[212],"once":[213],"(YOLO)":[214],"models.":[215]},"counts_by_year":[{"year":2026,"cited_by_count":21},{"year":2025,"cited_by_count":28}],"updated_date":"2026-08-12T21:12:35.861297","created_date":"2025-10-10T00:00:00"}