{"id":"https://openalex.org/W4400277822","doi":"https://doi.org/10.1109/tim.2024.3418112","title":"End-to-End Direct Phase Retrieval From a Single-Frame Interferogram Based on Deep Learning","display_name":"End-to-End Direct Phase Retrieval From a Single-Frame Interferogram Based on Deep Learning","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4400277822","doi":"https://doi.org/10.1109/tim.2024.3418112"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3418112","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3418112","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078204954","display_name":"Tianshan Zhang","orcid":"https://orcid.org/0009-0002-7792-9435"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tianshan Zhang","raw_affiliation_strings":["Beijing Key Laboratory of Fractional Signals and Systems, School of Information and Electronics, Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Fractional Signals and Systems, School of Information and Electronics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101963873","display_name":"Ming-Feng Lu","orcid":"https://orcid.org/0000-0003-4932-7146"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingfeng Lu","raw_affiliation_strings":["Beijing Key Laboratory of Fractional Signals and Systems, School of Information and Electronics, Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Fractional Signals and Systems, School of Information and Electronics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100666109","display_name":"Yao Hu","orcid":"https://orcid.org/0000-0003-4573-5740"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yao Hu","raw_affiliation_strings":["Beijing Key Laboratory of Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049976796","display_name":"Qun Hao","orcid":"https://orcid.org/0000-0002-9819-731X"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qun Hao","raw_affiliation_strings":["Beijing Key Laboratory of Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073337040","display_name":"Jin-Min Wu","orcid":"https://orcid.org/0009-0008-9727-5233"},"institutions":[{"id":"https://openalex.org/I78675632","display_name":"Beijing Information Science & Technology University","ror":"https://ror.org/04xnqep60","country_code":"CN","type":"education","lineage":["https://openalex.org/I78675632"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinmin Wu","raw_affiliation_strings":["School of Automation, Beijing Information Science and Technology University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Automation, Beijing Information Science and Technology University, Beijing, China","institution_ids":["https://openalex.org/I78675632"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048583190","display_name":"Nan Zhang","orcid":"https://orcid.org/0000-0001-7608-8561"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Nan Zhang","raw_affiliation_strings":["Beijing Key Laboratory of Fractional Signals and Systems, School of Information and Electronics, Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Fractional Signals and Systems, School of Information and Electronics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006044295","display_name":"Shuai Yang","orcid":"https://orcid.org/0000-0002-3993-4308"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuai Yang","raw_affiliation_strings":["MIIT Key Laboratory of Complex-Field Intelligent Exploration, School of Optics and Photonics, Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"MIIT Key Laboratory of Complex-Field Intelligent Exploration, School of Optics and Photonics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088625596","display_name":"Wenjie He","orcid":"https://orcid.org/0009-0005-7283-1887"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenjie He","raw_affiliation_strings":["Beijing Key Laboratory of Fractional Signals and Systems, School of Information and Electronics, Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Fractional Signals and Systems, School of Information and Electronics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100784476","display_name":"Feng Zhang","orcid":"https://orcid.org/0000-0003-2643-6446"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Zhang","raw_affiliation_strings":["Beijing Key Laboratory of Fractional Signals and Systems, School of Information and Electronics, Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Fractional Signals and Systems, School of Information and Electronics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067803447","display_name":"Ran Tao","orcid":"https://orcid.org/0000-0002-5243-7189"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ran Tao","raw_affiliation_strings":["Beijing Key Laboratory of Fractional Signals and Systems, School of Information and Electronics, Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Fractional Signals and Systems, School of Information and Electronics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5078204954"],"corresponding_institution_ids":["https://openalex.org/I125839683"],"apc_list":null,"apc_paid":null,"fwci":1.2464,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.80261999,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"16"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","score":0.9872999787330627,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6006077527999878},{"id":"https://openalex.org/keywords/frame","display_name":"Frame (networking)","score":0.577168881893158},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.50755774974823},{"id":"https://openalex.org/keywords/end-to-end-principle","display_name":"End-to-end principle","score":0.49318426847457886},{"id":"https://openalex.org/keywords/interferometry","display_name":"Interferometry","score":0.4576645493507385},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.45436033606529236},{"id":"https://openalex.org/keywords/phase-retrieval","display_name":"Phase retrieval","score":0.45106369256973267},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.26367658376693726},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22271764278411865},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15334153175354004},{"id":"https://openalex.org/keywords/fourier-transform","display_name":"Fourier transform","score":0.12022137641906738}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6006077527999878},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.577168881893158},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.50755774974823},{"id":"https://openalex.org/C74296488","wikidata":"https://www.wikidata.org/wiki/Q2527392","display_name":"End-to-end principle","level":2,"score":0.49318426847457886},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.4576645493507385},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.45436033606529236},{"id":"https://openalex.org/C81793267","wikidata":"https://www.wikidata.org/wiki/Q7180962","display_name":"Phase retrieval","level":3,"score":0.45106369256973267},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.26367658376693726},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22271764278411865},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15334153175354004},{"id":"https://openalex.org/C102519508","wikidata":"https://www.wikidata.org/wiki/Q6520159","display_name":"Fourier transform","level":2,"score":0.12022137641906738},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3418112","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3418112","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1565016122","display_name":null,"funder_award_id":"XDA25020317","funder_id":"https://openalex.org/F4320321133","funder_display_name":"Chinese Academy of Sciences"},{"id":"https://openalex.org/G3934596819","display_name":null,"funder_award_id":"2023BITSYB02","funder_id":"https://openalex.org/F4320323110","funder_display_name":"Beijing Institute of Technology"},{"id":"https://openalex.org/G4537004512","display_name":null,"funder_award_id":"62171025","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321133","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35"},{"id":"https://openalex.org/F4320323110","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":65,"referenced_works":["https://openalex.org/W1649590900","https://openalex.org/W1745334888","https://openalex.org/W1932847118","https://openalex.org/W1974607187","https://openalex.org/W1975650229","https://openalex.org/W1976788088","https://openalex.org/W1976921161","https://openalex.org/W1984309565","https://openalex.org/W1997542937","https://openalex.org/W2006703509","https://openalex.org/W2022532533","https://openalex.org/W2023933338","https://openalex.org/W2041837587","https://openalex.org/W2051554926","https://openalex.org/W2065912702","https://openalex.org/W2066941820","https://openalex.org/W2089951674","https://openalex.org/W2103900066","https://openalex.org/W2111787976","https://openalex.org/W2111845465","https://openalex.org/W2123216265","https://openalex.org/W2124509324","https://openalex.org/W2138518554","https://openalex.org/W2147238549","https://openalex.org/W2194775991","https://openalex.org/W2408816843","https://openalex.org/W2567422056","https://openalex.org/W2567576169","https://openalex.org/W2884436604","https://openalex.org/W2900139389","https://openalex.org/W2905542217","https://openalex.org/W2905995769","https://openalex.org/W2908510526","https://openalex.org/W2922795189","https://openalex.org/W2944779716","https://openalex.org/W2960994981","https://openalex.org/W2963263347","https://openalex.org/W2971057120","https://openalex.org/W2974285835","https://openalex.org/W2997457044","https://openalex.org/W3007642752","https://openalex.org/W3016525206","https://openalex.org/W3086177986","https://openalex.org/W3120977060","https://openalex.org/W3124424106","https://openalex.org/W3126099975","https://openalex.org/W3163881346","https://openalex.org/W3204459004","https://openalex.org/W4205499987","https://openalex.org/W4205606841","https://openalex.org/W4214513770","https://openalex.org/W4225243265","https://openalex.org/W4251384556","https://openalex.org/W4255162188","https://openalex.org/W4285105754","https://openalex.org/W4313031557","https://openalex.org/W4323345618","https://openalex.org/W4384703528","https://openalex.org/W4384703636","https://openalex.org/W4387252416","https://openalex.org/W6726497184","https://openalex.org/W6740483536","https://openalex.org/W6757817989","https://openalex.org/W6774081470","https://openalex.org/W6783437975"],"related_works":["https://openalex.org/W3179968364","https://openalex.org/W1988809445","https://openalex.org/W2112026144","https://openalex.org/W2045753504","https://openalex.org/W2016541458","https://openalex.org/W4248877799","https://openalex.org/W2024935319","https://openalex.org/W2021614875","https://openalex.org/W2011100284","https://openalex.org/W3004215674"],"abstract_inverted_index":{"In":[0],"the":[1,14,33,39,44,97,101,116],"field":[2],"of":[3,17,46],"optical":[4,124],"interferometry,":[5],"phase":[6,15,26,41,53,90,110],"retrieval":[7,27,54],"is":[8,104],"a":[9,29,61],"critical":[10],"step":[11],"in":[12],"acquiring":[13],"information":[16],"fringes.":[18],"Various":[19],"deep-learning-based":[20],"methods":[21,35],"have":[22,114],"been":[23],"proposed":[24,102,117],"for":[25,55,119,123],"from":[28],"single-frame":[30],"interferogram.":[31],"However,":[32],"existing":[34,98],"still":[36],"cannot":[37],"obtain":[38],"unwrapped":[40],"directly":[42],"without":[43,87],"aid":[45],"extra":[47],"steps.":[48],"To":[49],"truly":[50],"fulfill":[51],"end-to-end":[52],"various":[56],"fringe":[57],"patterns,":[58],"we":[59],"propose":[60],"novel":[62],"method":[63,103,118],"with":[64,106],"carefully":[65],"crafted":[66],"network":[67],"architecture":[68],"and":[69,76,84],"training":[70],"methodology.":[71],"Experimental":[72],"results":[73],"on":[74],"simulated":[75],"actual":[77],"interferograms":[78,108],"show":[79],"excellent":[80],"accuracy,":[81],"noise":[82],"robustness,":[83],"demodulation":[85],"efficiency":[86],"any":[88],"further":[89],"unwrapping":[91],"or":[92],"polynomial":[93],"fitting":[94],"required":[95],"by":[96],"methods.":[99],"Furthermore,":[100],"compatible":[105],"non-Zernike-polynomial-phase":[107],"containing":[109],"discontinuities.":[111],"These":[112],"properties":[113],"qualified":[115],"high-standard":[120],"interferometric":[121],"measurement":[122],"fabrication.":[125]},"counts_by_year":[{"year":2025,"cited_by_count":5}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}