{"id":"https://openalex.org/W4400033874","doi":"https://doi.org/10.1109/tim.2024.3418110","title":"A Novel Time\u2013Frequency-Domain Reflectometry Location Method for Power Cable Defects Based on Synchrosqueezing Transform","display_name":"A Novel Time\u2013Frequency-Domain Reflectometry Location Method for Power Cable Defects Based on Synchrosqueezing Transform","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4400033874","doi":"https://doi.org/10.1109/tim.2024.3418110"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3418110","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3418110","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033519367","display_name":"Pengfei Meng","orcid":"https://orcid.org/0000-0002-8279-3491"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengfei Meng","raw_affiliation_strings":["School of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-8279-3491","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090693565","display_name":"Tengfei Li","orcid":"https://orcid.org/0009-0004-5487-1271"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tengfei Li","raw_affiliation_strings":["School of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0004-5487-1271","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037003531","display_name":"Kai Zhou","orcid":"https://orcid.org/0000-0002-8109-6408"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Zhou","raw_affiliation_strings":["School of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-8109-6408","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022337054","display_name":"Zhirong Tang","orcid":"https://orcid.org/0000-0001-8328-5862"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhirong Tang","raw_affiliation_strings":["School of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-8328-5862","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078742258","display_name":"Guangya Zhu","orcid":"https://orcid.org/0000-0003-3790-4014"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangya Zhu","raw_affiliation_strings":["School of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-3790-4014","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101654601","display_name":"Zerui Li","orcid":"https://orcid.org/0000-0003-2639-6034"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zerui Li","raw_affiliation_strings":["School of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-2639-6034","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007044996","display_name":"Yating Cao","orcid":"https://orcid.org/0000-0001-7249-0764"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yating Cao","raw_affiliation_strings":["School of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-7249-0764","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044316554","display_name":"Hongzhou Zhang","orcid":"https://orcid.org/0000-0002-6445-4955"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongzhou Zhang","raw_affiliation_strings":["School of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-6445-4955","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008441077","display_name":"Yue Yin","orcid":"https://orcid.org/0009-0002-9166-2669"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yue Yin","raw_affiliation_strings":["School of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0002-9166-2669","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084754458","display_name":"Jingke Guo","orcid":"https://orcid.org/0009-0005-1885-2281"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingke Guo","raw_affiliation_strings":["School of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0005-1885-2281","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I24185976"],"apc_list":null,"apc_paid":null,"fwci":1.9214,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.85981807,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9830999970436096,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reflectometry","display_name":"Reflectometry","score":0.9094731211662292},{"id":"https://openalex.org/keywords/time\u2013frequency-analysis","display_name":"Time\u2013frequency analysis","score":0.6200472712516785},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.6091795563697815},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.5499054789543152},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4782627820968628},{"id":"https://openalex.org/keywords/power-cable","display_name":"Power cable","score":0.44134849309921265},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43328022956848145},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4327651262283325},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41678112745285034},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3140825927257538},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.27471283078193665},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2611200213432312},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2315305769443512},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.13146692514419556}],"concepts":[{"id":"https://openalex.org/C2778925768","wikidata":"https://www.wikidata.org/wiki/Q3454718","display_name":"Reflectometry","level":3,"score":0.9094731211662292},{"id":"https://openalex.org/C142433447","wikidata":"https://www.wikidata.org/wiki/Q7806653","display_name":"Time\u2013frequency analysis","level":3,"score":0.6200472712516785},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.6091795563697815},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.5499054789543152},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4782627820968628},{"id":"https://openalex.org/C2777772068","wikidata":"https://www.wikidata.org/wiki/Q1939150","display_name":"Power cable","level":3,"score":0.44134849309921265},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43328022956848145},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4327651262283325},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41678112745285034},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3140825927257538},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.27471283078193665},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2611200213432312},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2315305769443512},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.13146692514419556},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3418110","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3418110","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8399999737739563}],"awards":[{"id":"https://openalex.org/G272259057","display_name":null,"funder_award_id":"52107158","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3192770309","display_name":null,"funder_award_id":"2024NSFSC0116","funder_id":"https://openalex.org/F4320329861","funder_display_name":"Natural Science Foundation of Sichuan Province"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320329861","display_name":"Natural Science Foundation of Sichuan Province","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1572718985","https://openalex.org/W1968166327","https://openalex.org/W2009596440","https://openalex.org/W2026574307","https://openalex.org/W2149183817","https://openalex.org/W2293705379","https://openalex.org/W2760233602","https://openalex.org/W2791546190","https://openalex.org/W3005680279","https://openalex.org/W3006290036","https://openalex.org/W3011229054","https://openalex.org/W3016541735","https://openalex.org/W3128694165","https://openalex.org/W3129489040","https://openalex.org/W3153103222","https://openalex.org/W3156328647","https://openalex.org/W3194002489","https://openalex.org/W4220989484","https://openalex.org/W4225657267","https://openalex.org/W4285059590","https://openalex.org/W4312957727","https://openalex.org/W4375947005","https://openalex.org/W4387789920","https://openalex.org/W4388937535","https://openalex.org/W4390204068"],"related_works":["https://openalex.org/W3184095098","https://openalex.org/W4247269142","https://openalex.org/W2396133027","https://openalex.org/W2084522216","https://openalex.org/W2169212713","https://openalex.org/W1965835773","https://openalex.org/W1493885512","https://openalex.org/W2021460492","https://openalex.org/W1947057263","https://openalex.org/W2355447608"],"abstract_inverted_index":{"The":[0],"time-frequency-domain":[1],"reflectometry":[2],"(TFDR)":[3],"method":[4,54,132],"has":[5],"found":[6],"its":[7],"extensive":[8],"application":[9],"in":[10,30,34],"location":[11,36],"detection":[12],"of":[13,26,38,73,79,100,104,119,129,140],"power":[14,91,141],"cable":[15,27,59,122,142],"defects.":[16,123],"Traditionally,":[17],"it":[18],"adopts":[19],"Wigner-Ville":[20],"distribution":[21],"(WVD)":[22],"to":[23,55,85,97],"analyze":[24],"time-frequency":[25,70,106],"signals,":[28],"resulting":[29],"numerous":[31],"cross":[32],"terms":[33],"the":[35,58,65,76,80,90,98,105,110,115,121,125,130],"spectrum":[37],"defects,":[39,60],"thereby":[40],"inducing":[41],"defect":[42],"misjudgment.":[43],"To":[44],"address":[45],"it,":[46],"this":[47],"article":[48],"proposes":[49],"a":[50,137],"synchrosqueezing":[51],"transform":[52],"(SST)-based":[53],"accurately":[56],"locate":[57],"which":[61],"takes":[62],"SST":[63,108],"as":[64],"new":[66],"kernel":[67],"function":[68],"for":[69],"analysis":[71],"instead":[72],"WVD.":[74],"Moreover,":[75],"modulation":[77],"criteria":[78],"test":[81,89],"signal":[82],"are":[83,133],"defined":[84],"effectively":[86],"and":[87,102,127,143],"flexibly":[88],"cables":[92],"with":[93],"different":[94],"lengths.":[95],"Due":[96],"characteristics":[99],"compression":[101],"rearrangement":[103],"spectrogram,":[107],"suppresses":[109],"cross-term":[111],"interference,":[112],"thus":[113],"improving":[114],"spectral":[116],"peak":[117],"resolution":[118],"locating":[120],"Finally,":[124],"feasibility":[126],"effectiveness":[128],"SST-based":[131],"verified":[134],"by":[135],"building":[136],"simulation":[138],"model":[139],"field":[144],"tests,":[145],"respectively.":[146]},"counts_by_year":[{"year":2026,"cited_by_count":6},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":2}],"updated_date":"2026-08-12T21:12:35.861297","created_date":"2025-10-10T00:00:00"}