{"id":"https://openalex.org/W4399939565","doi":"https://doi.org/10.1109/tim.2024.3418100","title":"Defocus-Driven Variable-Shape Fringe for Accuracy Improvement in Fringe Projection Profilometry","display_name":"Defocus-Driven Variable-Shape Fringe for Accuracy Improvement in Fringe Projection Profilometry","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4399939565","doi":"https://doi.org/10.1109/tim.2024.3418100"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3418100","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3418100","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087396510","display_name":"Jing Xu","orcid":"https://orcid.org/0000-0002-2997-2351"},"institutions":[{"id":"https://openalex.org/I4391768272","display_name":"State Key Laboratory of Tribology","ror":"https://ror.org/03h33sq24","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768272","https://openalex.org/I99065089"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Xu","raw_affiliation_strings":["Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment, Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipment Control, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-2997-2351","affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment, Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipment Control, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4391768272","https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042557287","display_name":"Zhihu Li","orcid":"https://orcid.org/0000-0003-4417-1293"},"institutions":[{"id":"https://openalex.org/I4391768272","display_name":"State Key Laboratory of Tribology","ror":"https://ror.org/03h33sq24","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768272","https://openalex.org/I99065089"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhihu Li","raw_affiliation_strings":["Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment, Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipment Control, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-4417-1293","affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment, Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipment Control, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4391768272","https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103049939","display_name":"He Liu","orcid":"https://orcid.org/0009-0004-2653-880X"},"institutions":[{"id":"https://openalex.org/I11838497","display_name":"Aviation Industry Corporation of China (China)","ror":"https://ror.org/02wq41p38","country_code":"CN","type":"company","lineage":["https://openalex.org/I11838497"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"He Liu","raw_affiliation_strings":["AVIC Jiangxi Hongdu Aviation Industry Group Company Ltd., Nanchang, Jiangxi, China"],"raw_orcid":"https://orcid.org/0009-0004-2653-880X","affiliations":[{"raw_affiliation_string":"AVIC Jiangxi Hongdu Aviation Industry Group Company Ltd., Nanchang, Jiangxi, China","institution_ids":["https://openalex.org/I11838497"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100403640","display_name":"Rui Chen","orcid":"https://orcid.org/0000-0002-4041-4131"},"institutions":[{"id":"https://openalex.org/I4391768272","display_name":"State Key Laboratory of Tribology","ror":"https://ror.org/03h33sq24","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768272","https://openalex.org/I99065089"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rui Chen","raw_affiliation_strings":["Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment, Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipment Control, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-4041-4131","affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment, Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipment Control, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4391768272","https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061911091","display_name":"Dan Wu","orcid":"https://orcid.org/0000-0002-3856-1087"},"institutions":[{"id":"https://openalex.org/I4391768272","display_name":"State Key Laboratory of Tribology","ror":"https://ror.org/03h33sq24","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768272","https://openalex.org/I99065089"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dan Wu","raw_affiliation_strings":["Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment, Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipment Control, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-3856-1087","affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment, Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipment Control, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4391768272","https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091993375","display_name":"Jiwen Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I4391768272","display_name":"State Key Laboratory of Tribology","ror":"https://ror.org/03h33sq24","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768272","https://openalex.org/I99065089"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiwen Zhang","raw_affiliation_strings":["Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment, Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipment Control, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8940-325X","affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment, Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipment Control, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4391768272","https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020588540","display_name":"Guolei Wang","orcid":"https://orcid.org/0000-0002-8365-3300"},"institutions":[{"id":"https://openalex.org/I4391768272","display_name":"State Key Laboratory of Tribology","ror":"https://ror.org/03h33sq24","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768272","https://openalex.org/I99065089"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guolei Wang","raw_affiliation_strings":["Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment, Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipment Control, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-8365-3300","affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment, Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipment Control, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4391768272","https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9869,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.73852889,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/profilometer","display_name":"Profilometer","score":0.7558239698410034},{"id":"https://openalex.org/keywords/structured-light-3d-scanner","display_name":"Structured-light 3D scanner","score":0.6277600526809692},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.6088834404945374},{"id":"https://openalex.org/keywords/projection","display_name":"Projection (relational algebra)","score":0.6012151837348938},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5224686861038208},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5145899057388306},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5068500638008118},{"id":"https://openalex.org/keywords/variable","display_name":"Variable (mathematics)","score":0.4835226535797119},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.24076953530311584},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2050217092037201},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1904120147228241},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"Surface roughness","score":0.13805150985717773},{"id":"https://openalex.org/keywords/scanner","display_name":"Scanner","score":0.10087588429450989}],"concepts":[{"id":"https://openalex.org/C79261456","wikidata":"https://www.wikidata.org/wiki/Q443756","display_name":"Profilometer","level":3,"score":0.7558239698410034},{"id":"https://openalex.org/C184577583","wikidata":"https://www.wikidata.org/wiki/Q1485537","display_name":"Structured-light 3D scanner","level":3,"score":0.6277600526809692},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6088834404945374},{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.6012151837348938},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5224686861038208},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5145899057388306},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5068500638008118},{"id":"https://openalex.org/C182365436","wikidata":"https://www.wikidata.org/wiki/Q50701","display_name":"Variable (mathematics)","level":2,"score":0.4835226535797119},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24076953530311584},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2050217092037201},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1904120147228241},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.13805150985717773},{"id":"https://openalex.org/C2779751349","wikidata":"https://www.wikidata.org/wiki/Q1474480","display_name":"Scanner","level":2,"score":0.10087588429450989},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3418100","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3418100","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G269617823","display_name":null,"funder_award_id":"L232027","funder_id":"https://openalex.org/F4320334977","funder_display_name":"Beijing Municipal Natural Science Foundation"},{"id":"https://openalex.org/G2932415477","display_name":null,"funder_award_id":"51935010","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4523337021","display_name":null,"funder_award_id":"2023YFB4706001","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G5683911863","display_name":null,"funder_award_id":"62173198","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320334977","display_name":"Beijing Municipal Natural Science Foundation","ror":null},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W177330105","https://openalex.org/W1963822831","https://openalex.org/W2013613447","https://openalex.org/W2053605384","https://openalex.org/W2059571518","https://openalex.org/W2066626470","https://openalex.org/W2069160033","https://openalex.org/W2076214923","https://openalex.org/W2083612628","https://openalex.org/W2086114601","https://openalex.org/W2097782793","https://openalex.org/W2189086301","https://openalex.org/W2404089956","https://openalex.org/W2884444945","https://openalex.org/W2884478848","https://openalex.org/W2977549871","https://openalex.org/W3088649987","https://openalex.org/W3089073367","https://openalex.org/W3094556146","https://openalex.org/W3140247819","https://openalex.org/W4205910281","https://openalex.org/W4285159523","https://openalex.org/W4286560083","https://openalex.org/W4313397647","https://openalex.org/W4315778399","https://openalex.org/W4377235574","https://openalex.org/W4382677683","https://openalex.org/W4387010769","https://openalex.org/W4388289416","https://openalex.org/W6686998556"],"related_works":["https://openalex.org/W2385216742","https://openalex.org/W2045080189","https://openalex.org/W2591989483","https://openalex.org/W1984933051","https://openalex.org/W4249939034","https://openalex.org/W2743746609","https://openalex.org/W2055482831","https://openalex.org/W4205399159","https://openalex.org/W1988186120","https://openalex.org/W3048950945"],"abstract_inverted_index":{"Sinusoidal":[0],"fringe":[1,35,47,84,123,130,141,150,180],"projection":[2],"profilometry":[3],"(FPP)":[4],"is":[5,152],"a":[6,40,93,120,128],"promising":[7],"3-D":[8],"measurement":[9,161],"technique.":[10],"However,":[11],"the":[12,23,26,46,50,60,66,69,83,87,104,116,139,148,156,160,168,175],"accuracy":[13,173],"of":[14,25,62,74,106,159],"sinusoidal":[15],"FPP":[16],"will":[17],"be":[18,80,113],"seriously":[19],"reduced":[20],"due":[21],"to":[22,49,53,82,85,115,119,137,155],"impact":[24],"defocusing":[27,51,57,107,145,157],"effect.":[28],"Different":[29],"from":[30],"existing":[31],"methods":[32,177],"with":[33,178],"constant":[34,179],"shapes,":[36],"this":[37,75],"article":[38,126],"proposes":[39],"defocus-driven":[41],"variable-shape":[42,149],"method":[43,136],"that":[44,167],"adapts":[45],"shape":[48,131,142],"degree":[52],"improve":[54,86],"accuracy.":[55],"The":[56,163],"effect":[58],"reduces":[59],"modulation":[61],"each":[63,144],"harmonic":[64,89,101],"in":[65],"fringe,":[67,117],"especially":[68],"high-order":[70,77,110],"harmonics.":[71],"Taking":[72],"advantage":[73],"property,":[76],"harmonics":[78,111],"can":[79,112,170],"introduced":[81,114],"fundamental":[88],"modulation,":[90],"thereby":[91],"achieving":[92],"higher":[94,172],"signal-to-noise":[95],"ratio":[96],"(SNR)":[97],"without":[98],"causing":[99],"significant":[100],"errors.":[102],"With":[103],"increase":[105],"degree,":[108],"more":[109],"leading":[118],"varying":[121],"optimal":[122,140],"shape.":[124],"This":[125],"employs":[127],"parameterized":[129],"and":[132],"an":[133],"error":[134],"optimization":[135],"determine":[138],"for":[143],"degree.":[146],"Then,":[147],"(VSF)":[151],"generated":[153],"according":[154],"distribution":[158],"target.":[162],"experimental":[164],"results":[165],"demonstrate":[166],"VSF":[169],"achieve":[171],"than":[174],"traditional":[176],"shapes.":[181]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":2}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}