{"id":"https://openalex.org/W4400111998","doi":"https://doi.org/10.1109/tim.2024.3417594","title":"A Real-Time Determination Method for Homodyne Grating Interferometer Signal Nonlinear Error Based on Duty Cycle Measurement of States","display_name":"A Real-Time Determination Method for Homodyne Grating Interferometer Signal Nonlinear Error Based on Duty Cycle Measurement of States","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4400111998","doi":"https://doi.org/10.1109/tim.2024.3417594"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3417594","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3417594","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100687275","display_name":"Weicheng Wang","orcid":"https://orcid.org/0000-0002-2961-2997"},"institutions":[{"id":"https://openalex.org/I1327237609","display_name":"Ministry of Education of the People's Republic of China","ror":"https://ror.org/01mv9t934","country_code":"CN","type":"government","lineage":["https://openalex.org/I1327237609","https://openalex.org/I4210127390"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Weicheng Wang","raw_affiliation_strings":["Key Laboratory of Geophysical Exploration Equipment, Ministry of Education of China, Department of College of Instrumentation and Electrical Engineering, Changchun, China"],"raw_orcid":"https://orcid.org/0000-0002-2961-2997","affiliations":[{"raw_affiliation_string":"Key Laboratory of Geophysical Exploration Equipment, Ministry of Education of China, Department of College of Instrumentation and Electrical Engineering, Changchun, China","institution_ids":["https://openalex.org/I1327237609"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051297707","display_name":"Jun Lin","orcid":"https://orcid.org/0000-0002-7568-9346"},"institutions":[{"id":"https://openalex.org/I1327237609","display_name":"Ministry of Education of the People's Republic of China","ror":"https://ror.org/01mv9t934","country_code":"CN","type":"government","lineage":["https://openalex.org/I1327237609","https://openalex.org/I4210127390"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Lin","raw_affiliation_strings":["Key Laboratory of Geophysical Exploration Equipment, Ministry of Education of China, Department of College of Instrumentation and Electrical Engineering, Changchun, China"],"raw_orcid":"https://orcid.org/0000-0002-7568-9346","affiliations":[{"raw_affiliation_string":"Key Laboratory of Geophysical Exploration Equipment, Ministry of Education of China, Department of College of Instrumentation and Electrical Engineering, Changchun, China","institution_ids":["https://openalex.org/I1327237609"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5099634744","display_name":"Siyu Jin","orcid":"https://orcid.org/0000-0003-2839-7065"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Siyu Jin","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China"],"raw_orcid":"https://orcid.org/0000-0003-2839-7065","affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I4210088164","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005985408","display_name":"Yu Bai","orcid":"https://orcid.org/0009-0003-5647-5750"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Bai","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China"],"raw_orcid":"https://orcid.org/0009-0003-5647-5750","affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I4210088164","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041811480","display_name":"Lin Liu","orcid":"https://orcid.org/0009-0007-7017-9068"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lin Liu","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China"],"raw_orcid":"https://orcid.org/0009-0007-7017-9068","affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I4210088164","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115599639","display_name":"Zhaowu Liu","orcid":"https://orcid.org/0009-0007-6076-4108"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaowu Liu","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China"],"raw_orcid":"https://orcid.org/0009-0007-6076-4108","affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I4210088164","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015482372","display_name":"Yishu Sun","orcid":"https://orcid.org/0000-0002-3250-513X"},"institutions":[{"id":"https://openalex.org/I196038209","display_name":"Hunan University of Arts and Science","ror":"https://ror.org/01ggnn306","country_code":"CN","type":"education","lineage":["https://openalex.org/I196038209"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yishu Sun","raw_affiliation_strings":["College of Computer and Electrical Engineering, Hunan University of Arts and Science, Changde, China"],"raw_orcid":"https://orcid.org/0000-0002-3250-513X","affiliations":[{"raw_affiliation_string":"College of Computer and Electrical Engineering, Hunan University of Arts and Science, Changde, China","institution_ids":["https://openalex.org/I196038209"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100362643","display_name":"Wenhao Li","orcid":"https://orcid.org/0009-0008-9144-8682"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenhao Li","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China"],"raw_orcid":"https://orcid.org/0009-0008-9144-8682","affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I4210088164","https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5100687275"],"corresponding_institution_ids":["https://openalex.org/I1327237609"],"apc_list":null,"apc_paid":null,"fwci":1.0145,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.71789711,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interferometry","display_name":"Interferometry","score":0.6995092630386353},{"id":"https://openalex.org/keywords/duty-cycle","display_name":"Duty cycle","score":0.6865369081497192},{"id":"https://openalex.org/keywords/direct-conversion-receiver","display_name":"Direct-conversion receiver","score":0.6502050757408142},{"id":"https://openalex.org/keywords/homodyne-detection","display_name":"Homodyne detection","score":0.5999569892883301},{"id":"https://openalex.org/keywords/grating","display_name":"Grating","score":0.5783442258834839},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5563442707061768},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4757782518863678},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.4352441132068634},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.41843000054359436},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4178309142589569},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3798295855522156},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35768410563468933},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17963328957557678},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.17134618759155273},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.154642254114151}],"concepts":[{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.6995092630386353},{"id":"https://openalex.org/C199822604","wikidata":"https://www.wikidata.org/wiki/Q557120","display_name":"Duty cycle","level":3,"score":0.6865369081497192},{"id":"https://openalex.org/C26351279","wikidata":"https://www.wikidata.org/wiki/Q1227627","display_name":"Direct-conversion receiver","level":3,"score":0.6502050757408142},{"id":"https://openalex.org/C2778184138","wikidata":"https://www.wikidata.org/wiki/Q1626181","display_name":"Homodyne detection","level":2,"score":0.5999569892883301},{"id":"https://openalex.org/C2777813233","wikidata":"https://www.wikidata.org/wiki/Q1527816","display_name":"Grating","level":2,"score":0.5783442258834839},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5563442707061768},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4757782518863678},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.4352441132068634},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.41843000054359436},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4178309142589569},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3798295855522156},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35768410563468933},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17963328957557678},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.17134618759155273},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.154642254114151},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3417594","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3417594","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","display_name":"Climate action","score":0.4099999964237213}],"awards":[{"id":"https://openalex.org/G190307152","display_name":null,"funder_award_id":"20220505001ZP","funder_id":"https://openalex.org/F4320317784","funder_display_name":"Jilin Provincial Postdoctoral Science Foundation"},{"id":"https://openalex.org/G4571525475","display_name":null,"funder_award_id":"52275554","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7834102335","display_name":null,"funder_award_id":"U21A2050","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G902585991","display_name":null,"funder_award_id":"20230201057GX","funder_id":"https://openalex.org/F4320317784","funder_display_name":"Jilin Provincial Postdoctoral Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320317784","display_name":"Jilin Provincial Postdoctoral Science Foundation","ror":null},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W819057243","https://openalex.org/W1965834495","https://openalex.org/W1967486736","https://openalex.org/W2038869889","https://openalex.org/W2057720447","https://openalex.org/W2061412609","https://openalex.org/W2065176945","https://openalex.org/W2071715394","https://openalex.org/W2072588726","https://openalex.org/W2115452265","https://openalex.org/W2140427427","https://openalex.org/W2244526966","https://openalex.org/W2276287855","https://openalex.org/W2567993580","https://openalex.org/W2787261804","https://openalex.org/W2938197072","https://openalex.org/W2985371126","https://openalex.org/W2997838039","https://openalex.org/W2999222068","https://openalex.org/W3108958504","https://openalex.org/W3159002379","https://openalex.org/W4200212486","https://openalex.org/W4200316310","https://openalex.org/W4226015332","https://openalex.org/W4308438357","https://openalex.org/W4312292028","https://openalex.org/W4312875646","https://openalex.org/W4380930547","https://openalex.org/W4384130949","https://openalex.org/W4387789695"],"related_works":["https://openalex.org/W2084259546","https://openalex.org/W1974753956","https://openalex.org/W2037935301","https://openalex.org/W2024923816","https://openalex.org/W2981825965","https://openalex.org/W2015793188","https://openalex.org/W4385065708","https://openalex.org/W4321264582","https://openalex.org/W2766542271","https://openalex.org/W2068253929"],"abstract_inverted_index":{"Nonlinear":[0],"error":[1,33,64,114],"is":[2,94],"a":[3,26,75,126],"serious":[4],"obstruction":[5],"for":[6,80],"inc-":[7],"reasing":[8],"the":[9,14,20,31,35,43,49,62,81,91,105,109,137],"resolution":[10],"and":[11,48,58,74,86,101],"accuracy":[12,100],"of":[13,52],"homodyne":[15,36],"grating":[16,37],"interferometer.":[17],"To":[18],"eliminate":[19],"nonlinear":[21,32,63,113],"error,":[22],"this":[23],"article":[24],"presents":[25],"real-time":[27],"method":[28,68,93],"to":[29,60,96,118,136],"determine":[30,61],"in":[34,125],"interferometer":[38],"signal.":[39],"Two":[40],"thresholds":[41],"separate":[42],"signal":[44],"into":[45],"four":[46],"states,":[47],"duty":[50],"cycle":[51],"each":[53],"state":[54],"will":[55],"be":[56,116],"measured":[57],"used":[59],"parameters":[65],"separately.":[66],"The":[67,84,112],"proposed":[69,92],"was":[70],"implemented":[71],"using":[72],"MATLAB":[73],"field-programmable":[76],"gate":[77],"array":[78],"(FPGA)":[79],"determination":[82],"process.":[83],"simulation":[85],"experimental":[87],"results":[88],"indicated":[89],"that":[90],"easier":[95],"achieve":[97],"with":[98,104],"similar":[99,135],"precision":[102],"compared":[103],"methods":[106],"based":[107],"on":[108],"fitting":[110,138],"algorithm.":[111],"could":[115],"reduced":[117],"about":[119],"37":[120],"nm":[121,124],"from":[122],"79":[123],"100-<inline-formula":[127],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[128],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[129],"<tex-math":[130],"notation=\"LaTeX\">$\\mu":[131],"$":[132],"</tex-math></inline-formula>m":[133],"test,":[134],"algorithms.":[139]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}