{"id":"https://openalex.org/W4399571988","doi":"https://doi.org/10.1109/tim.2024.3413142","title":"Remaining Useful Life Prognosis Method of Rolling Bearings Considering Degradation Distribution Shift","display_name":"Remaining Useful Life Prognosis Method of Rolling Bearings Considering Degradation Distribution Shift","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4399571988","doi":"https://doi.org/10.1109/tim.2024.3413142"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3413142","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3413142","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082731513","display_name":"Bo Tang","orcid":"https://orcid.org/0009-0008-8729-6428"},"institutions":[{"id":"https://openalex.org/I62853816","display_name":"Beijing University of Civil Engineering and Architecture","ror":"https://ror.org/02yj0p855","country_code":"CN","type":"education","lineage":["https://openalex.org/I62853816"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Bo Tang","raw_affiliation_strings":["School of Mechanical Electronic and Vehicle Engineering, Beijing University of Civil Engineering and Architecture, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Electronic and Vehicle Engineering, Beijing University of Civil Engineering and Architecture, Beijing, China","institution_ids":["https://openalex.org/I62853816"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010056672","display_name":"Dechen Yao","orcid":"https://orcid.org/0000-0002-9489-7984"},"institutions":[{"id":"https://openalex.org/I62853816","display_name":"Beijing University of Civil Engineering and Architecture","ror":"https://ror.org/02yj0p855","country_code":"CN","type":"education","lineage":["https://openalex.org/I62853816"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dechen Yao","raw_affiliation_strings":["School of Mechanical Electronic and Vehicle Engineering, Beijing University of Civil Engineering and Architecture, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Electronic and Vehicle Engineering, Beijing University of Civil Engineering and Architecture, Beijing, China","institution_ids":["https://openalex.org/I62853816"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018066168","display_name":"Jianwei Yang","orcid":"https://orcid.org/0000-0003-2536-2334"},"institutions":[{"id":"https://openalex.org/I62853816","display_name":"Beijing University of Civil Engineering and Architecture","ror":"https://ror.org/02yj0p855","country_code":"CN","type":"education","lineage":["https://openalex.org/I62853816"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianwei Yang","raw_affiliation_strings":["School of Mechanical Electronic and Vehicle Engineering, Beijing University of Civil Engineering and Architecture, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Electronic and Vehicle Engineering, Beijing University of Civil Engineering and Architecture, Beijing, China","institution_ids":["https://openalex.org/I62853816"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041246135","display_name":"F.W. Zhang","orcid":"https://orcid.org/0000-0003-3196-6185"},"institutions":[{"id":"https://openalex.org/I62853816","display_name":"Beijing University of Civil Engineering and Architecture","ror":"https://ror.org/02yj0p855","country_code":"CN","type":"education","lineage":["https://openalex.org/I62853816"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fan Zhang","raw_affiliation_strings":["School of Mechanical Electronic and Vehicle Engineering, Beijing University of Civil Engineering and Architecture, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Electronic and Vehicle Engineering, Beijing University of Civil Engineering and Architecture, Beijing, China","institution_ids":["https://openalex.org/I62853816"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5082731513"],"corresponding_institution_ids":["https://openalex.org/I62853816"],"apc_list":null,"apc_paid":null,"fwci":8.387,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.98243727,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11062","display_name":"Gear and Bearing Dynamics Analysis","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.9771999716758728,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6730863451957703},{"id":"https://openalex.org/keywords/distribution","display_name":"Distribution (mathematics)","score":0.4199545681476593},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41027718782424927},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.41002386808395386},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3848128020763397},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3480340242385864},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.3394077718257904},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2913706302642822},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19801300764083862},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.11759164929389954}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6730863451957703},{"id":"https://openalex.org/C110121322","wikidata":"https://www.wikidata.org/wiki/Q865811","display_name":"Distribution (mathematics)","level":2,"score":0.4199545681476593},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41027718782424927},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.41002386808395386},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3848128020763397},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3480340242385864},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.3394077718257904},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2913706302642822},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19801300764083862},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.11759164929389954}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3413142","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3413142","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Zero hunger","id":"https://metadata.un.org/sdg/2","score":0.4399999976158142}],"awards":[{"id":"https://openalex.org/G4349027260","display_name":null,"funder_award_id":"52305090","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4992184810","display_name":null,"funder_award_id":"51975038","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":46,"referenced_works":["https://openalex.org/W1975687401","https://openalex.org/W1992113394","https://openalex.org/W2062613656","https://openalex.org/W2077942936","https://openalex.org/W2130855329","https://openalex.org/W2131774270","https://openalex.org/W2157331557","https://openalex.org/W2463813940","https://openalex.org/W2471161958","https://openalex.org/W2473294140","https://openalex.org/W2599868532","https://openalex.org/W2772084711","https://openalex.org/W2890096158","https://openalex.org/W2904460913","https://openalex.org/W2919115771","https://openalex.org/W2941666212","https://openalex.org/W2945413072","https://openalex.org/W2948490758","https://openalex.org/W2971114125","https://openalex.org/W2976697886","https://openalex.org/W3005331186","https://openalex.org/W3011171540","https://openalex.org/W3033580259","https://openalex.org/W3034552520","https://openalex.org/W3083550439","https://openalex.org/W3123983671","https://openalex.org/W3167907675","https://openalex.org/W3173071471","https://openalex.org/W3185016559","https://openalex.org/W4200473862","https://openalex.org/W4287200447","https://openalex.org/W4313175250","https://openalex.org/W4323108654","https://openalex.org/W4323891857","https://openalex.org/W4362682282","https://openalex.org/W4382203079","https://openalex.org/W4385245566","https://openalex.org/W4389352680","https://openalex.org/W4390452688","https://openalex.org/W4396877909","https://openalex.org/W4400767051","https://openalex.org/W6736412012","https://openalex.org/W6840267290","https://openalex.org/W6850522680","https://openalex.org/W6851253260","https://openalex.org/W6851299910"],"related_works":["https://openalex.org/W2534928293","https://openalex.org/W2150099345","https://openalex.org/W3004580327","https://openalex.org/W1490077415","https://openalex.org/W2160318243","https://openalex.org/W4293463510","https://openalex.org/W1815542355","https://openalex.org/W2152540334","https://openalex.org/W2351837897","https://openalex.org/W2384416889"],"abstract_inverted_index":{"The":[0,139,158,169],"problem":[1],"of":[2,8,20,75,98,117,143],"distribution":[3,64,206],"shift":[4,65],"during":[5],"the":[6,17,21,27,70,76,92,96,102,114,137,144,148,194,201],"degradation":[7,115],"rolling":[9],"bearings":[10],"can":[11,204],"lead":[12],"to":[13,40,62,90,110,132],"a":[14,52,73,118,166],"decrease":[15],"in":[16,37],"prediction":[18,47,210],"accuracy":[19,211],"remaining":[22],"useful":[23],"life":[24],"(RUL).":[25],"Moreover,":[26],"traditional":[28],"sequential":[29],"long":[30],"short-term":[31],"memory":[32],"(LSTM)":[33],"model":[34],"has":[35],"limitations":[36],"its":[38,46],"ability":[39],"extract":[41],"relevant":[42],"information,":[43],"which":[44],"hinders":[45],"performance.":[48,168],"This":[49],"article":[50,123],"presents":[51],"novel":[53],"strategy":[54,104,146,160,203],"called":[55],"channel":[56,59],"dependent":[57],"and":[58,79,107,141,154,179,189,208],"independent":[60],"(CD-CI)":[61],"alleviate":[63,205],"by":[66,182,186,212],"improving":[67],"robustness.":[68,214],"In":[69],"CD":[71],"strategy,":[72],"fusion":[74],"residual":[77],"LSTM":[78],"self-attention":[80,108],"(RLSA)":[81],"module":[82,131],"is":[83],"proposed.":[84],"Subsequently,":[85],"residuals":[86],"connect":[87],"multiple":[88],"RLSAs":[89],"create":[91],"RRLSA":[93],"stack,":[94],"enhancing":[95,213],"learning":[97],"feature":[99],"dependencies.":[100],"Meanwhile,":[101],"CI":[103],"fuses":[105],"DLinear":[106],"(DLSA)":[109],"intensify":[111],"attention":[112,128],"toward":[113],"information":[116],"single":[119],"feature.":[120],"Ultimately,":[121],"this":[122],"introduces":[124],"an":[125],"adaptive":[126],"channel-time":[127],"shrinkage":[129],"(CTAS)":[130],"reduce":[133],"internal":[134],"noise":[135],"within":[136],"model.":[138,196],"validation":[140],"analysis":[142],"CD-CI":[145,159,202],"uses":[147],"IEEE":[149],"PHM":[150],"2012":[151],"bearing":[152,156],"dataset":[153],"XJTU-SY":[155],"dataset.":[157],"exhibits":[161],"minimal":[162],"(non-)robustness":[163],"variation,":[164],"indicating":[165],"robust":[167],"root":[170],"mean":[171,175],"square":[172],"error":[173,177],"(RMSE),":[174],"absolute":[176],"(MAE),":[178],"score":[180],"predicted":[181],"RUL":[183],"are":[184],"improved":[185],"9.9%,":[187],"16.4%,":[188],"15.9%,":[190],"respectively,":[191],"compared":[192],"with":[193],"advanced":[195],"These":[197],"experiments":[198],"indicate":[199],"that":[200],"shifts":[207],"improve":[209]},"counts_by_year":[{"year":2025,"cited_by_count":16},{"year":2024,"cited_by_count":8}],"updated_date":"2025-12-19T19:40:27.379048","created_date":"2025-10-10T00:00:00"}