{"id":"https://openalex.org/W4399118893","doi":"https://doi.org/10.1109/tim.2024.3406820","title":"Three-Dimensional Surface-Shape Measurement of Moving Billets Using Phase-Shifting Profilometry","display_name":"Three-Dimensional Surface-Shape Measurement of Moving Billets Using Phase-Shifting Profilometry","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4399118893","doi":"https://doi.org/10.1109/tim.2024.3406820"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3406820","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3406820","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052757789","display_name":"Qing He","orcid":"https://orcid.org/0000-0002-6695-9471"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qing He","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0002-6695-9471","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036066741","display_name":"Zhuanfang Zheng","orcid":"https://orcid.org/0009-0001-4132-4015"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhuanfang Zheng","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0009-0001-4132-4015","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052782463","display_name":"Bentao Zhang","orcid":"https://orcid.org/0000-0003-1981-6942"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bentao Zhang","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0003-1981-6942","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103125471","display_name":"Wei Wei","orcid":"https://orcid.org/0000-0002-3173-6905"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wei Wei","raw_affiliation_strings":["Liaoning Institute of Metrology, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0002-3173-6905","affiliations":[{"raw_affiliation_string":"Liaoning Institute of Metrology, Shenyang, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027639983","display_name":"Hongji Meng","orcid":"https://orcid.org/0000-0001-9219-011X"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongji Meng","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0001-9219-011X","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5052757789"],"corresponding_institution_ids":["https://openalex.org/I9224756"],"apc_list":null,"apc_paid":null,"fwci":3.3331,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.93376465,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9842000007629395,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/profilometer","display_name":"Profilometer","score":0.9220077991485596},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5738334655761719},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.5523989200592041},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.5071539878845215},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.43080973625183105},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"Surface roughness","score":0.3726325035095215},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.21695926785469055},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20869708061218262},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.17722520232200623},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1643657684326172}],"concepts":[{"id":"https://openalex.org/C79261456","wikidata":"https://www.wikidata.org/wiki/Q443756","display_name":"Profilometer","level":3,"score":0.9220077991485596},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5738334655761719},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.5523989200592041},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5071539878845215},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.43080973625183105},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.3726325035095215},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.21695926785469055},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20869708061218262},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.17722520232200623},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1643657684326172},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3406820","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3406820","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5300458679","display_name":null,"funder_award_id":"62373083","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":43,"referenced_works":["https://openalex.org/W1971598090","https://openalex.org/W1975551334","https://openalex.org/W1975617938","https://openalex.org/W2007431582","https://openalex.org/W2019782026","https://openalex.org/W2044932224","https://openalex.org/W2051901894","https://openalex.org/W2055524104","https://openalex.org/W2076214923","https://openalex.org/W2085134744","https://openalex.org/W2086954949","https://openalex.org/W2155903085","https://openalex.org/W2562378388","https://openalex.org/W2591617906","https://openalex.org/W2778531572","https://openalex.org/W2791731233","https://openalex.org/W2804654620","https://openalex.org/W2885875999","https://openalex.org/W2898413211","https://openalex.org/W2904796626","https://openalex.org/W2917204118","https://openalex.org/W2964321433","https://openalex.org/W2969559750","https://openalex.org/W2998291476","https://openalex.org/W3007791797","https://openalex.org/W3013349362","https://openalex.org/W3041814977","https://openalex.org/W3066948994","https://openalex.org/W3082264678","https://openalex.org/W3084093109","https://openalex.org/W3130295290","https://openalex.org/W3137326543","https://openalex.org/W3140963551","https://openalex.org/W3165012668","https://openalex.org/W3179407796","https://openalex.org/W3200199988","https://openalex.org/W4200426600","https://openalex.org/W4206217610","https://openalex.org/W4285203025","https://openalex.org/W4303709937","https://openalex.org/W4310670106","https://openalex.org/W4313327864","https://openalex.org/W4383753272"],"related_works":["https://openalex.org/W2318290115","https://openalex.org/W2349732462","https://openalex.org/W4361004102","https://openalex.org/W2383005713","https://openalex.org/W2237675683","https://openalex.org/W4390339492","https://openalex.org/W621187962","https://openalex.org/W3113335811","https://openalex.org/W4312455104","https://openalex.org/W2081951157"],"abstract_inverted_index":{"Three-dimensional":[0],"shape":[1],"of":[2,91,108,164],"the":[3,12,69,92,102,109,133,153,157,160,165],"billet/slab":[4],"surface":[5,13,28,167],"is":[6,17,65],"an":[7],"import":[8],"cue":[9],"to":[10,22,39,54,67,100,151],"detect":[11],"defects,":[14],"but":[15],"it":[16],"difficult":[18],"for":[19,120,141],"phase-shifting":[20],"profilometry":[21],"handle":[23],"moving":[24,170],"objects":[25,70],"with":[26,56,72,136],"textured":[27],"such":[29],"as":[30,176],"casting":[31],"billets/slabs.":[32],"There":[33],"are":[34,84,111,126,139,148],"two":[35,58],"issues":[36],"that":[37,81,177],"need":[38],"be":[40],"addressed":[41],"together,":[42],"including":[43],"object":[44,77,94],"tracking":[45],"and":[46,62,89,95,118,146],"phase":[47,82,103,115,123,142],"error":[48,104,116,124,129,143],"correction.":[49,144],"We":[50],"propose":[51,97],"a":[52,98,180],"method":[53],"deal":[55],"these":[57],"issues.":[59],"A":[60],"projection":[61],"imaging":[63],"technique":[64],"introduced":[66],"track":[68],"covered":[71],"fringe":[73],"patterns.":[74],"Based":[75],"on":[76],"tracking,":[78],"we":[79,96],"find":[80],"errors":[83],"mainly":[85],"induced":[86],"by":[87,113,132],"rotations":[88],"translations":[90],"measured":[93,168,178],"model":[99,110,135],"describe":[101],"distributions.":[105],"The":[106],"coefficients":[107,138],"determined":[112,137],"actual":[114,122],"distributions,":[117],"algorithms":[119],"obtaining":[121],"distributions":[125,130],"developed.":[127],"Phase":[128],"provided":[131],"proposed":[134,154,158],"used":[140],"Simulations":[145],"experiments":[147],"carried":[149],"out":[150],"validate":[152],"method.":[155],"Via":[156],"method,":[159],"three-dimensional":[161],"reconstruction":[162],"result":[163],"billet":[166],"in":[169,179],"conditions":[171],"can":[172],"provide":[173],"stereoscopic":[174],"details":[175],"stationary":[181],"state.":[182]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":3}],"updated_date":"2026-04-24T08:23:43.765630","created_date":"2025-10-10T00:00:00"}