{"id":"https://openalex.org/W4396754381","doi":"https://doi.org/10.1109/tim.2024.3398080","title":"Single-Exposure 3-D Measurement of High-Dynamic-Range Surfaces via Untrained Neural Network","display_name":"Single-Exposure 3-D Measurement of High-Dynamic-Range Surfaces via Untrained Neural Network","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4396754381","doi":"https://doi.org/10.1109/tim.2024.3398080"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3398080","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3398080","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073730268","display_name":"Fuqian Li","orcid":"https://orcid.org/0000-0001-6725-9955"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fuqian Li","raw_affiliation_strings":["Department of Opto-Electronic, College of Electronics and Information Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-6725-9955","affiliations":[{"raw_affiliation_string":"Department of Opto-Electronic, College of Electronics and Information Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074155582","display_name":"Qican Zhang","orcid":"https://orcid.org/0000-0002-6132-0046"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qican Zhang","raw_affiliation_strings":["Department of Opto-Electronic, College of Electronics and Information Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-6132-0046","affiliations":[{"raw_affiliation_string":"Department of Opto-Electronic, College of Electronics and Information Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100454881","display_name":"Yajun Wang","orcid":"https://orcid.org/0000-0002-0165-0561"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yajun Wang","raw_affiliation_strings":["Department of Opto-Electronic, College of Electronics and Information Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-0165-0561","affiliations":[{"raw_affiliation_string":"Department of Opto-Electronic, College of Electronics and Information Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I24185976"],"apc_list":null,"apc_paid":null,"fwci":0.2044,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.43190789,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inpainting","display_name":"Inpainting","score":0.9230406284332275},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7514485120773315},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6383023858070374},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6264243721961975},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5692685842514038},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5063782930374146},{"id":"https://openalex.org/keywords/multiple-exposure","display_name":"Multiple exposure","score":0.4548897445201874},{"id":"https://openalex.org/keywords/high-dynamic-range","display_name":"High dynamic range","score":0.4540071189403534},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.4502526819705963},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.42317378520965576},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.28219544887542725},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08928057551383972}],"concepts":[{"id":"https://openalex.org/C11727466","wikidata":"https://www.wikidata.org/wiki/Q1628157","display_name":"Inpainting","level":3,"score":0.9230406284332275},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7514485120773315},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6383023858070374},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6264243721961975},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5692685842514038},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5063782930374146},{"id":"https://openalex.org/C2779990520","wikidata":"https://www.wikidata.org/wiki/Q1561409","display_name":"Multiple exposure","level":2,"score":0.4548897445201874},{"id":"https://openalex.org/C2780056265","wikidata":"https://www.wikidata.org/wiki/Q106239881","display_name":"High dynamic range","level":3,"score":0.4540071189403534},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.4502526819705963},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.42317378520965576},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.28219544887542725},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08928057551383972},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3398080","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3398080","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.6299999952316284,"id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G3767504179","display_name":null,"funder_award_id":"62075143","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1901129140","https://openalex.org/W1967995341","https://openalex.org/W1972846054","https://openalex.org/W1975170577","https://openalex.org/W2001188872","https://openalex.org/W2030964324","https://openalex.org/W2038564190","https://openalex.org/W2765957149","https://openalex.org/W2767346351","https://openalex.org/W2800511946","https://openalex.org/W2905508965","https://openalex.org/W2906468540","https://openalex.org/W2975077065","https://openalex.org/W3020944944","https://openalex.org/W3033101048","https://openalex.org/W3035082678","https://openalex.org/W4200525884","https://openalex.org/W4214513770","https://openalex.org/W4220721592","https://openalex.org/W4223594510","https://openalex.org/W4281900991","https://openalex.org/W4283025657","https://openalex.org/W4296460185","https://openalex.org/W4312811730","https://openalex.org/W4386261962"],"related_works":["https://openalex.org/W2884377208","https://openalex.org/W2525745698","https://openalex.org/W2010724756","https://openalex.org/W2152030049","https://openalex.org/W2564543331","https://openalex.org/W2410869481","https://openalex.org/W2466475649","https://openalex.org/W3117066249","https://openalex.org/W2808003261","https://openalex.org/W2142308989"],"abstract_inverted_index":{"Three-dimensional":[0],"(3D)":[1],"measurement":[2,56,185],"for":[3,166],"high-dynamic-range":[4],"(HDR)":[5],"surfaces":[6],"is":[7],"one":[8],"of":[9,74,149,158],"challenge":[10],"issues":[11],"in":[12,28,67,102,109,125],"industry":[13],"manufacturing.":[14],"However,":[15],"current":[16],"HDR":[17,55],"methods,":[18,24],"including":[19],"conventional":[20],"methods":[21,130],"and":[22,106,172],"supervised-learning-based":[23],"generally":[25],"make":[26],"compromise":[27],"either":[29],"the":[30,33,48,72,79,86,103,110,122,134,145,153,156,177,184,194],"efficiency":[31],"or":[32],"accuracy.":[34],"To":[35],"alleviate":[36],"this":[37],"compromise,":[38],"we":[39,77,114,143],"propose":[40,78,115],"a":[41,59,116],"generalized":[42,81],"fringe":[43,100,107,150],"enhancement":[44],"method":[45,160,180],"based":[46,137],"on":[47,92,138],"untrained":[49],"neural":[50],"network":[51],"(UNN)":[52],"to":[53,71,84,120,151],"achieve":[54,99],"from":[57],"only":[58],"single":[60],"exposure.":[61],"There":[62],"are":[63],"two":[64],"important":[65],"contributions":[66],"our":[68,75,95,159],"work.":[69],"First,":[70],"best":[73],"knowledge,":[76],"first":[80],"UNN-based":[82],"framework":[83,96],"solve":[85],"underexposure-overexposure":[87],"hybrid":[88,174],"issue.":[89,112],"Without":[90],"pre-training":[91],"any":[93],"dataset,":[94],"can":[97,161,181],"simultaneously":[98],"denoising":[101],"underexposure":[104],"issue,":[105],"inpainting":[108,123],"overexposure":[111],"Second,":[113],"sine":[117],"regularization":[118],"term":[119],"improve":[121],"quality":[124],"overexposed":[126],"areas.":[127],"Unlike":[128],"existing":[129],"that":[131],"merely":[132],"inpaint":[133],"corrupted":[135],"areas":[136],"their":[139,173],"reliable":[140],"adjacent":[141],"areas,":[142],"utilize":[144],"unique":[146],"sinusoid":[147],"character":[148],"constrain":[152],"inpainting.":[154],"Consequently,":[155],"robustness":[157],"be":[162],"effectively":[163],"enhanced.":[164],"Experiments":[165],"poorly":[167],"illuminated":[168],"scenes,":[169,171],"high-reflection":[170],"scenes":[175],"demonstrate":[176],"proposed":[178],"single-exposure":[179],"substantially":[182],"eliminate":[183],"error":[186],"(0.0603":[187],"mm":[188],"vs":[189],"4.1775":[190],"mm)":[191],"compared":[192],"with":[193],"direct":[195],"measurement.":[196]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}