{"id":"https://openalex.org/W4396534899","doi":"https://doi.org/10.1109/tim.2024.3394490","title":"Realization of Inductance Scale Using Digital Bridges at Low Frequencies","display_name":"Realization of Inductance Scale Using Digital Bridges at Low Frequencies","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4396534899","doi":"https://doi.org/10.1109/tim.2024.3394490"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3394490","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3394490","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046459750","display_name":"Dan Bee Kim","orcid":"https://orcid.org/0000-0002-5992-0990"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dan Bee Kim","raw_affiliation_strings":["Korea Research Institute of Standards and Science, Daejeon, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-5992-0990","affiliations":[{"raw_affiliation_string":"Korea Research Institute of Standards and Science, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056176868","display_name":"Seong Su Shin","orcid":null},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seong Su Shin","raw_affiliation_strings":["Korea Research Institute of Standards and Science, Daejeon, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0001-7454-9686","affiliations":[{"raw_affiliation_string":"Korea Research Institute of Standards and Science, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084954573","display_name":"Wan-Seop Kim","orcid":"https://orcid.org/0000-0002-1588-8386"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Wan-Seop Kim","raw_affiliation_strings":["Korea Research Institute of Standards and Science, Daejeon, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-1588-8386","affiliations":[{"raw_affiliation_string":"Korea Research Institute of Standards and Science, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090018624","display_name":"Jan Ku\u010dera","orcid":"https://orcid.org/0000-0003-3209-8594"},"institutions":[{"id":"https://openalex.org/I4210124866","display_name":"\u010cesk\u00fd metrologick\u00fd institut","ror":"https://ror.org/02m5haa59","country_code":"CZ","type":"government","lineage":["https://openalex.org/I4210124866"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Jan Kucera","raw_affiliation_strings":["Czech Metrology Institute, Brno, Czech Republic"],"raw_orcid":"https://orcid.org/0000-0003-3209-8594","affiliations":[{"raw_affiliation_string":"Czech Metrology Institute, Brno, Czech Republic","institution_ids":["https://openalex.org/I4210124866"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2495,"currency":"USD","value_usd":2495},"apc_paid":null,"fwci":0.3516,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.494602,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/realization","display_name":"Realization (probability)","score":0.8064026832580566},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.6469547748565674},{"id":"https://openalex.org/keywords/equivalent-series-inductance","display_name":"Equivalent series inductance","score":0.5251792669296265},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5222725868225098},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.49258238077163696},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.46141374111175537},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4532221555709839},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3547486662864685},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.29017698764801025},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15393540263175964},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13262400031089783}],"concepts":[{"id":"https://openalex.org/C2781089630","wikidata":"https://www.wikidata.org/wiki/Q21856745","display_name":"Realization (probability)","level":2,"score":0.8064026832580566},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.6469547748565674},{"id":"https://openalex.org/C141490761","wikidata":"https://www.wikidata.org/wiki/Q5384728","display_name":"Equivalent series inductance","level":4,"score":0.5251792669296265},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5222725868225098},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.49258238077163696},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.46141374111175537},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4532221555709839},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3547486662864685},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.29017698764801025},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15393540263175964},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13262400031089783},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3394490","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3394490","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1483090339","https://openalex.org/W1977377847","https://openalex.org/W2003450917","https://openalex.org/W2007577110","https://openalex.org/W2017642372","https://openalex.org/W2047936857","https://openalex.org/W2158106419","https://openalex.org/W2326864645","https://openalex.org/W3001970243","https://openalex.org/W3102130313","https://openalex.org/W3160577468","https://openalex.org/W4240858106","https://openalex.org/W4312583045","https://openalex.org/W4360603607","https://openalex.org/W4376456849"],"related_works":["https://openalex.org/W3205678237","https://openalex.org/W2039404188","https://openalex.org/W2371924276","https://openalex.org/W2039573805","https://openalex.org/W2949499314","https://openalex.org/W2074913316","https://openalex.org/W2365402110","https://openalex.org/W2349179171","https://openalex.org/W2166925515","https://openalex.org/W2373643149"],"abstract_inverted_index":{"This":[0],"article":[1],"describes":[2],"a":[3,17,68,74,127,133,148],"traceability":[4],"chain":[5],"for":[6,168],"the":[7,11,25,44,64,78,94,98,101,104,110,124,136,143,160,163,173,179,183],"inductance":[8,32,41,53,111,139,174],"scale":[9,112],"from":[10],"dc":[12],"quantum":[13],"Hall":[14],"resistance":[15,37,80],"using":[16,63,123],"multipurpose":[18],"digital":[19,26,65,70,164],"impedance":[20],"bridge.":[21,184],"In":[22,132],"this":[23],"study,":[24],"bridge":[27,66,125,165],"was":[28,58,113,140,166],"employed":[29],"in":[30,43,67,90,126],"various":[31,169],"measurements":[33],"against":[34,77,142],"either":[35],"ac":[36,79],"standards":[38,42],"or":[39],"other":[40],"wide":[45],"range":[46],"from$100~\\mu":[47,118],"$H":[48,119],"to":[49,120,171],"10":[50,121,137,152],"H.":[51],"An":[52],"standard":[54,81,108],"of":[55,82,151,182],"100":[56,106],"mH":[57,107,138],"calibrated":[59,105,141],"at":[60,147],"1":[61,83,144],"kHz":[62],"fully":[69],"(FD)":[71],"mode":[72],"by":[73,115],"direct":[75],"comparison":[76],"k$\\Omega":[84,145],"$.":[85],"The":[86],"measurement":[87,175],"results":[88],"were":[89],"good":[91],"agreements":[92],"with":[93],"reference":[95],"value":[96],"on":[97],"level":[99],"of$10^{-6}$at":[100],"best.":[102],"From":[103],"inductor,":[109],"realized":[114],"10:1":[116],"comparisons":[117],"H":[122],"digitally":[128],"assisted":[129],"(DA)":[130],"mode.":[131],"similar":[134],"manner,":[135],"$resistance":[146],"higher":[149],"frequency":[150],"kHz,":[153],"then":[154],"scaled":[155],"down":[156],"to$100~\\mu":[157],"$H.":[158],"During":[159],"extensive":[161],"measurements,":[162],"studied":[167],"ways":[170],"improve":[172],"accuracy,":[176],"such":[177],"as":[178],"phase":[180],"correction":[181]},"counts_by_year":[{"year":2025,"cited_by_count":3}],"updated_date":"2026-08-28T12:50:07.497085","created_date":"2025-10-10T00:00:00"}