{"id":"https://openalex.org/W4394585970","doi":"https://doi.org/10.1109/tim.2024.3385818","title":"Analysis and Suppression for Critical Optical Nonorthogonal Noise in SERF Comagnetometers","display_name":"Analysis and Suppression for Critical Optical Nonorthogonal Noise in SERF Comagnetometers","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4394585970","doi":"https://doi.org/10.1109/tim.2024.3385818"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3385818","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3385818","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034734880","display_name":"Zitong Xu","orcid":"https://orcid.org/0000-0002-0090-9017"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zitong Xu","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0090-9017","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061100046","display_name":"Kai Wei","orcid":"https://orcid.org/0000-0002-8867-2332"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Wei","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-8867-2332","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100353301","display_name":"Chang Liu","orcid":"https://orcid.org/0000-0002-7953-0594"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chang Liu","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-7953-0594","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026842137","display_name":"Xing Heng","orcid":"https://orcid.org/0000-0002-0593-8677"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xing Heng","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0593-8677","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053125155","display_name":"Xiaofei Huang","orcid":"https://orcid.org/0000-0003-2996-9424"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaofei Huang","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-2996-9424","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108297585","display_name":"Dinghui Gong","orcid":"https://orcid.org/0009-0000-3968-9376"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dinghui Gong","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0000-3968-9376","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027326288","display_name":"Fan Wang","orcid":"https://orcid.org/0009-0009-8056-1214"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fan Wang","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0009-8056-1214","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059361149","display_name":"Yueyang Zhai","orcid":"https://orcid.org/0000-0002-0441-0520"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yueyang Zhai","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0441-0520","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109324703","display_name":"Wei Quan","orcid":"https://orcid.org/0000-0003-2130-3046"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Quan","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-2130-3046","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5034734880"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":6.6127,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.97470348,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12424","display_name":"Earthquake Detection and Analysis","score":0.9925000071525574,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12424","display_name":"Earthquake Detection and Analysis","score":0.9925000071525574,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11993","display_name":"Atomic and Subatomic Physics Research","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11786","display_name":"Geomagnetism and Paleomagnetism Studies","score":0.9890000224113464,"subfield":{"id":"https://openalex.org/subfields/1312","display_name":"Molecular Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.554959237575531},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5506340265274048},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43706148862838745},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.43114370107650757},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.36976325511932373},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3658515214920044},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.34188112616539},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25274842977523804},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.15106692910194397},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11235183477401733}],"concepts":[{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.554959237575531},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5506340265274048},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43706148862838745},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.43114370107650757},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.36976325511932373},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3658515214920044},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.34188112616539},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25274842977523804},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.15106692910194397},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11235183477401733},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3385818","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3385818","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4000000059604645,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[{"id":"https://openalex.org/G2334678485","display_name":null,"funder_award_id":"2021M700345","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"},{"id":"https://openalex.org/G3783685441","display_name":null,"funder_award_id":"62203030","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8217485446","display_name":null,"funder_award_id":"61925301","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321543","display_name":"China Postdoctoral Science Foundation","ror":"https://ror.org/0426zh255"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W61124585","https://openalex.org/W1964104555","https://openalex.org/W1973137433","https://openalex.org/W1993412823","https://openalex.org/W1998320990","https://openalex.org/W2007602039","https://openalex.org/W2012962169","https://openalex.org/W2077767829","https://openalex.org/W2276794720","https://openalex.org/W2473628221","https://openalex.org/W2509759833","https://openalex.org/W2554356373","https://openalex.org/W2581790978","https://openalex.org/W2621164122","https://openalex.org/W2758367473","https://openalex.org/W2762585259","https://openalex.org/W2795591891","https://openalex.org/W2899669511","https://openalex.org/W2947467960","https://openalex.org/W2956889413","https://openalex.org/W2957302531","https://openalex.org/W2986893055","https://openalex.org/W2988102354","https://openalex.org/W2995398186","https://openalex.org/W3004015973","https://openalex.org/W3015546313","https://openalex.org/W3101517701","https://openalex.org/W3111564966","https://openalex.org/W3127609916","https://openalex.org/W3140177698","https://openalex.org/W3191733438","https://openalex.org/W4213345338","https://openalex.org/W4226510561","https://openalex.org/W4283812404","https://openalex.org/W4294275297","https://openalex.org/W4310640220","https://openalex.org/W4316661244","https://openalex.org/W4319946508","https://openalex.org/W4321366910","https://openalex.org/W4382119037","https://openalex.org/W6602444540","https://openalex.org/W6694733331","https://openalex.org/W6770252188","https://openalex.org/W6772085773"],"related_works":["https://openalex.org/W2327107878","https://openalex.org/W1526760723","https://openalex.org/W2171117985","https://openalex.org/W2012356576","https://openalex.org/W2126659863","https://openalex.org/W3112120395","https://openalex.org/W4385670989","https://openalex.org/W2102487628","https://openalex.org/W2009680848","https://openalex.org/W2150465873"],"abstract_inverted_index":{"Ultrasensitive":[0],"atomic":[1],"comagnetometers":[2,18],"have":[3,19],"proven":[4],"to":[5,72,167],"be":[6],"valuable":[7],"tools":[8],"for":[9,14,21,60,105,181,189],"precise":[10],"measurement":[11],"and":[12,24,47,54,81,93,102,143,193],"search":[13,188],"new":[15,182],"physics.":[16],"Besides,":[17,124],"potential":[20],"inertial":[22,149],"navigation":[23],"quantum":[25],"information.":[26],"Despite":[27],"their":[28],"great":[29],"potential,":[30],"sensitivity":[31,151],"improvement":[32],"has":[33],"been":[34],"limited":[35],"by":[36,121],"different":[37],"types":[38],"of":[39,49,107,127,140,152],"noise.":[40,85],"To":[41],"address":[42],"this":[43],"issue,":[44],"the":[45,61,90,94,108,115,131,137,147,162,172,187,194],"sources":[46],"magnitudes":[48],"noises":[50],"are":[51],"comprehensively":[52],"analyzed":[53],"a":[55,103],"suppression":[56,106,142],"method":[57,104],"is":[58,100,111,119,134,170],"proposed":[59,112],"most":[62,173],"critical":[63,73],"noise":[64,118,141],"source,":[65],"optical":[66,69,91,109,116],"non-orthogonality.":[67],"The":[68],"non-orthogonality":[70,92,110],"leads":[71],"transverse":[74,78,82,97],"pumping":[75],"effect,":[76],"thus":[77],"light":[79],"shift,":[80],"effective":[83],"magnetic":[84],"A":[86],"direct":[87],"correlation":[88],"between":[89],"electronic":[95],"spin":[96],"relaxation":[98],"rate":[99],"found,":[101],"accordingly.":[113],"Finally,":[114],"non-orthogonal":[117],"suppressed":[120],"3.1":[122],"dB.":[123],"an":[125],"increase":[126],"5.2":[128],"dB":[129],"in":[130,161],"scale":[132,144],"factor":[133,145],"achieved.":[135],"With":[136],"combined":[138],"effect":[139],"enhancement,":[146],"resulting":[148],"rotation":[150],"2.4\u00d710":[153],"<sup":[154,158],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[155,159],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-8</sup>":[156],"rad/s/Hz":[157],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">1/2</sup>":[160],"frequency":[163],"range":[164],"from":[165],"1":[166],"3":[168],"Hz":[169],"among":[171],"sensitive":[174],"comagnetometers,":[175],"which":[176],"opens":[177],"up":[178],"promising":[179],"opportunities":[180],"physics":[183],"measurements,":[184],"such":[185],"as":[186],"ultralight":[190],"dark":[191],"matter":[192],"fifth":[195],"force.":[196]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}