{"id":"https://openalex.org/W4393171208","doi":"https://doi.org/10.1109/tim.2024.3381275","title":"Optimizing Statistical Field Uniformity for RF Heating in Lyophilization: Modeling and Experimental Validation","display_name":"Optimizing Statistical Field Uniformity for RF Heating in Lyophilization: Modeling and Experimental Validation","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4393171208","doi":"https://doi.org/10.1109/tim.2024.3381275"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3381275","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2024.3381275","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/4407674/10478551.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://ieeexplore.ieee.org/ielx7/19/4407674/10478551.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085283895","display_name":"Ahmad Darwish","orcid":"https://orcid.org/0000-0001-5900-4821"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ahmad Darwish","raw_affiliation_strings":["School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN, USA"],"raw_orcid":"https://orcid.org/0000-0001-5900-4821","affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065495877","display_name":"Andrew Strongrich","orcid":"https://orcid.org/0000-0003-3074-0213"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew David Strongrich","raw_affiliation_strings":["School of Chemical Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN, USA"],"raw_orcid":"https://orcid.org/0000-0003-3074-0213","affiliations":[{"raw_affiliation_string":"School of Chemical Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057568024","display_name":"Alina Alexeenko","orcid":"https://orcid.org/0000-0003-2123-9064"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alina Alexeenko","raw_affiliation_strings":["School of Chemical Engineering, Aeronautics and Astronautics, Birck Nanotechnology Center, Purdue University, West Lafayette, IN, USA"],"raw_orcid":"https://orcid.org/0000-0003-2123-9064","affiliations":[{"raw_affiliation_string":"School of Chemical Engineering, Aeronautics and Astronautics, Birck Nanotechnology Center, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073681876","display_name":"Dimitrios Peroulis","orcid":"https://orcid.org/0000-0002-4993-1653"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dimitrios Peroulis","raw_affiliation_strings":["School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN, USA"],"raw_orcid":"https://orcid.org/0000-0002-4993-1653","affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":null,"apc_paid":null,"fwci":0.4483,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.58445313,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14156","display_name":"Engineering Applied Research","score":0.8282999992370605,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14156","display_name":"Engineering Applied Research","score":0.8282999992370605,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13924","display_name":"Internet of Things and Social Network Interactions","score":0.7541999816894531,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.538857638835907},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.42696452140808105},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4178427457809448},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4174579381942749},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4038448929786682},{"id":"https://openalex.org/keywords/process-engineering","display_name":"Process engineering","score":0.3958359956741333},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3890146315097809},{"id":"https://openalex.org/keywords/nuclear-engineering","display_name":"Nuclear engineering","score":0.3567608594894409},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27783164381980896},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2620912194252014},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14703625440597534}],"concepts":[{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.538857638835907},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.42696452140808105},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4178427457809448},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4174579381942749},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4038448929786682},{"id":"https://openalex.org/C21880701","wikidata":"https://www.wikidata.org/wiki/Q2144042","display_name":"Process engineering","level":1,"score":0.3958359956741333},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3890146315097809},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.3567608594894409},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27783164381980896},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2620912194252014},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14703625440597534},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3381275","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2024.3381275","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/4407674/10478551.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tim.2024.3381275","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2024.3381275","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/4407674/10478551.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320333974","display_name":"Davidson School of Chemical Engineering, Purdue University","ror":null},{"id":"https://openalex.org/F4320337821","display_name":"National Institute for Innovation in Manufacturing Biopharmaceuticals","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4393171208.pdf","grobid_xml":"https://content.openalex.org/works/W4393171208.grobid-xml"},"referenced_works_count":30,"referenced_works":["https://openalex.org/W1602507354","https://openalex.org/W1963572687","https://openalex.org/W1970748913","https://openalex.org/W1977805806","https://openalex.org/W2007433231","https://openalex.org/W2052734135","https://openalex.org/W2096595073","https://openalex.org/W2104872001","https://openalex.org/W2111075774","https://openalex.org/W2112095319","https://openalex.org/W2119220213","https://openalex.org/W2129386548","https://openalex.org/W2244274414","https://openalex.org/W2484132603","https://openalex.org/W2577739129","https://openalex.org/W2786210447","https://openalex.org/W2804429729","https://openalex.org/W2806895914","https://openalex.org/W2857500415","https://openalex.org/W2996161374","https://openalex.org/W2996410236","https://openalex.org/W3125603480","https://openalex.org/W3195435719","https://openalex.org/W3196965320","https://openalex.org/W4238772270","https://openalex.org/W4280615004","https://openalex.org/W4285391411","https://openalex.org/W4296913781","https://openalex.org/W4297512928","https://openalex.org/W6747786594"],"related_works":["https://openalex.org/W4376453582","https://openalex.org/W3147033875","https://openalex.org/W4385556635","https://openalex.org/W1568390478","https://openalex.org/W2764722704","https://openalex.org/W3209221379","https://openalex.org/W318913410","https://openalex.org/W2355543518","https://openalex.org/W2601840227","https://openalex.org/W2131832954"],"abstract_inverted_index":{"Freeze-drying":[0],"has":[1],"been":[2],"widely":[3],"adopted":[4],"in":[5,20],"the":[6,42,114,121,143,150,166],"manufacturing":[7],"of":[8,66,119,140,158],"biologics":[9],"for":[10,41,169],"producing":[11],"vaccines":[12],"and":[13,57,76,83,105,147],"protein-based":[14],"therapeutics":[15],"that":[16],"are":[17,81,107],"highly":[18,32],"unstable":[19],"liquid":[21],"form.":[22],"Radiofrequency":[23],"(RF)-assisted":[24],"lyophilization":[25],"can":[26],"significantly":[27],"accelerate":[28],"drying":[29,55,138],"by":[30,127],"applying":[31],"controllable":[33],"volumetric":[34],"heating.":[35],"In":[36],"this":[37],"paper,":[38],"we":[39,134],"design,":[40],"first":[43],"time,":[44],"a":[45,72,77,86,96,136],"quasi-random":[46],"field":[47,123],"(qRF)":[48],"system.":[49],"The":[50,100],"system":[51],"demonstrates":[52],"a)":[53],"primary":[54,137],"acceleration":[56,139],"b)":[58],"very":[59],"high":[60],"uniformity":[61,124],"with":[62,142,149],"two":[63],"different":[64],"types":[65],"antennas":[67],"at":[68,130],"8":[69,131],"GHz.":[70,132],"Specifically,":[71],"double-ridged":[73,151],"horn":[74,152],"antenna":[75,80,103,146,153],"wideband":[78,144],"conical":[79,145],"designed":[82],"placed":[84],"inside":[85,95],"metallic":[87],"enclosure":[88],"(reverberation":[89],"chamber)":[90],"to":[91,113],"excite":[92],"electromagnetic":[93,122],"waves":[94],"standard":[97,115],"R&D":[98],"freeze-dryer.":[99],"most":[101],"suitable":[102],"type":[104],"location":[106],"determined":[108],"using":[109,154],"full-wave":[110],"simulations.":[111],"Compared":[112],"2.45":[116],"GHz":[117],"frequency":[118],"operation,":[120],"is":[125],"improved":[126],"2.47":[128],"times":[129],"Furthermore,":[133],"show":[135],"81%":[141],"119%":[148],"only":[155],"25":[156],"W":[157],"RF":[159],"power.":[160],"Residual":[161],"moisture":[162],"content":[163],"measurements":[164],"validate":[165],"proposed":[167],"design":[168],"both":[170],"implementations.":[171]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}