{"id":"https://openalex.org/W4392940134","doi":"https://doi.org/10.1109/tim.2024.3378207","title":"Anti-Noise Light Field Depth Estimation Using Inline Occlusion Handling","display_name":"Anti-Noise Light Field Depth Estimation Using Inline Occlusion Handling","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4392940134","doi":"https://doi.org/10.1109/tim.2024.3378207"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3378207","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3378207","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023800950","display_name":"Wei Wu","orcid":"https://orcid.org/0009-0005-3015-0530"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Wu","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0005-3015-0530","affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101413025","display_name":"Longxu Jin","orcid":"https://orcid.org/0009-0002-2069-5850"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longxu Jin","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China"],"raw_orcid":"https://orcid.org/0009-0002-2069-5850","affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103025623","display_name":"Zengming Lv","orcid":"https://orcid.org/0000-0003-0185-9821"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zengming Lv","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China"],"raw_orcid":"https://orcid.org/0000-0003-0185-9821","affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101430334","display_name":"G. Li","orcid":"https://orcid.org/0009-0004-5322-382X"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guoning Li","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China"],"raw_orcid":"https://orcid.org/0009-0004-5322-382X","affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5119268733","display_name":"Jin Li","orcid":"https://orcid.org/0000-0001-9004-715X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jin Li","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","Beihang Hangzhou Innovation Institute, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-9004-715X","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Beihang Hangzhou Innovation Institute, Hangzhou, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6489,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.63540228,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5872435569763184},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48701363801956177},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.47398772835731506},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.4362800419330597},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.40740180015563965},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.304596483707428},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.2605955898761749},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2383384108543396},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20348039269447327}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5872435569763184},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48701363801956177},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.47398772835731506},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.4362800419330597},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.40740180015563965},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.304596483707428},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.2605955898761749},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2383384108543396},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20348039269447327},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3378207","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3378207","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","score":0.75,"id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W1914596733","https://openalex.org/W2012303138","https://openalex.org/W2042687553","https://openalex.org/W2082253268","https://openalex.org/W2101309634","https://openalex.org/W2106403211","https://openalex.org/W2113137767","https://openalex.org/W2128268941","https://openalex.org/W2128359381","https://openalex.org/W2137313943","https://openalex.org/W2143516773","https://openalex.org/W2148534289","https://openalex.org/W2149694199","https://openalex.org/W2200825767","https://openalex.org/W2289524987","https://openalex.org/W2430642417","https://openalex.org/W2591697814","https://openalex.org/W2744274622","https://openalex.org/W2746839867","https://openalex.org/W2753230437","https://openalex.org/W2766617240","https://openalex.org/W2911472707","https://openalex.org/W2964178790","https://openalex.org/W2990420979","https://openalex.org/W2998286311","https://openalex.org/W3008486106","https://openalex.org/W3100465609","https://openalex.org/W3195405910","https://openalex.org/W4213117431","https://openalex.org/W4220742724","https://openalex.org/W4226022249","https://openalex.org/W4244705922","https://openalex.org/W4297364025","https://openalex.org/W4312722796","https://openalex.org/W4312875618","https://openalex.org/W4323644416","https://openalex.org/W4361290961","https://openalex.org/W4381956084","https://openalex.org/W4384662932","https://openalex.org/W4386220464","https://openalex.org/W6629222711","https://openalex.org/W6634891648"],"related_works":["https://openalex.org/W2327107878","https://openalex.org/W1526760723","https://openalex.org/W2171117985","https://openalex.org/W2012356576","https://openalex.org/W2126659863","https://openalex.org/W3112120395","https://openalex.org/W4385670989","https://openalex.org/W2102487628","https://openalex.org/W2009680848","https://openalex.org/W2150465873"],"abstract_inverted_index":{"The":[0,94,140],"light":[1,37,154],"field":[2],"camera":[3],"records":[4],"spatial":[5],"and":[6,26,61,111,117,137],"angular":[7],"information":[8],"of":[9,35,87,125,151,173],"a":[10,17,45,85],"scene":[11],"within":[12],"one":[13],"shot,":[14],"which":[15,53,165],"is":[16,71,135],"unique":[18],"advantage,":[19],"especially":[20],"for":[21],"depth":[22,34,46,174],"estimation.":[23],"Both":[24],"occlusion":[25,51,63,69,171],"noise":[27,123],"make":[28],"it":[29],"difficult":[30],"to":[31,57,73,80,90],"estimate":[32],"the":[33,36,75,92,101,109,121,133,152,170],"field.":[38,155],"To":[39],"address":[40],"this":[41],"problem,":[42],"we":[43,83,145],"propose":[44],"estimation":[47,175],"method":[48,106,158],"using":[49],"inline":[50,68],"handling,":[52],"uses":[54],"digital":[55],"refocusing":[56],"obtain":[58],"refocused":[59],"images":[60],"define":[62],"types":[64],"in":[65,120,162,176],"scenes.":[66,178],"An":[67],"framework":[70],"used":[72],"construct":[74],"correlation":[76],"cost.":[77,93],"In":[78,129],"order":[79],"remove":[81],"noise,":[82],"use":[84],"variety":[86],"filtering":[88],"strategies":[89],"optimize":[91],"quantitative":[95],"results":[96,142],"show":[97,143],"that,":[98],"compared":[99],"with":[100,169],"best":[102],"performance":[103],"CAE,":[104],"our":[105,157],"can":[107,146,166],"reduce":[108],"MSE":[110],"bad":[112],"point":[113],"rate":[114],"by":[115],"40.68%":[116],"25.76%,":[118],"respectively,":[119],"challenging":[122],"scenes":[124],"Old":[126],"HCI":[127,131],"datasets.":[128],"New":[130],"datasets,":[132],"reduction":[134],"34.98%":[136],"31.26%,":[138],"respectively.":[139],"qualitative":[141],"that":[144],"preserve":[147],"various":[148],"fine":[149],"structures":[150],"real":[153],"Therefore,":[156],"has":[159],"significant":[160],"advantages":[161],"high-noise":[163],"scenes,":[164],"better":[167],"deal":[168],"problem":[172],"noisy":[177]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}