{"id":"https://openalex.org/W4393034666","doi":"https://doi.org/10.1109/tim.2024.3376703","title":"Quantitative Measurement of Lay Length of Metallic Wire Ropes Using Computer Vision and Image Phase Correlation Techniques","display_name":"Quantitative Measurement of Lay Length of Metallic Wire Ropes Using Computer Vision and Image Phase Correlation Techniques","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4393034666","doi":"https://doi.org/10.1109/tim.2024.3376703"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3376703","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3376703","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Kuosheng Jiang","orcid":"https://orcid.org/0000-0003-0300-1976"},"institutions":[{"id":"https://openalex.org/I184681353","display_name":"Anhui University of Science and Technology","ror":"https://ror.org/00q9atg80","country_code":"CN","type":"education","lineage":["https://openalex.org/I184681353"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Kuosheng Jiang","raw_affiliation_strings":["State Key Laboratory of Mining Response and Disaster Prevention and Control in Deep Coal Mines, Anhui University of Science and Technology, Huainan, China"],"raw_orcid":"https://orcid.org/0000-0003-0300-1976","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Mining Response and Disaster Prevention and Control in Deep Coal Mines, Anhui University of Science and Technology, Huainan, China","institution_ids":["https://openalex.org/I184681353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103182562","display_name":"Zhongwen Hu","orcid":"https://orcid.org/0000-0001-9701-8562"},"institutions":[{"id":"https://openalex.org/I184681353","display_name":"Anhui University of Science and Technology","ror":"https://ror.org/00q9atg80","country_code":"CN","type":"education","lineage":["https://openalex.org/I184681353"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhongwen Hu","raw_affiliation_strings":["State Key Laboratory of Mining Response and Disaster Prevention and Control in Deep Coal Mines, Anhui University of Science and Technology, Huainan, China"],"raw_orcid":"https://orcid.org/0000-0001-9701-8562","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Mining Response and Disaster Prevention and Control in Deep Coal Mines, Anhui University of Science and Technology, Huainan, China","institution_ids":["https://openalex.org/I184681353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077482915","display_name":"Xinglong Qi","orcid":"https://orcid.org/0000-0003-1029-7429"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xinglong Qi","raw_affiliation_strings":["Anhui Guruide Technology Company Ltd., Huainan, China"],"raw_orcid":"https://orcid.org/0000-0003-1029-7429","affiliations":[{"raw_affiliation_string":"Anhui Guruide Technology Company Ltd., Huainan, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103080669","display_name":"Xiaozhu Wang","orcid":"https://orcid.org/0000-0002-3486-2763"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xiaozhu Wang","raw_affiliation_strings":["Jiangsu Songcheng Industrial Development Company Ltd., Nantong, China"],"raw_orcid":"https://orcid.org/0000-0002-3486-2763","affiliations":[{"raw_affiliation_string":"Jiangsu Songcheng Industrial Development Company Ltd., Nantong, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088390435","display_name":"Songmei Wu","orcid":"https://orcid.org/0000-0001-7751-7364"},"institutions":[{"id":"https://openalex.org/I4210114245","display_name":"Anhui Business College","ror":"https://ror.org/02d0cgn19","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210114245"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Songmei Wu","raw_affiliation_strings":["Anhui Vocational and Technical College, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-7751-7364","affiliations":[{"raw_affiliation_string":"Anhui Vocational and Technical College, Hefei, China","institution_ids":["https://openalex.org/I4210114245"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I184681353"],"apc_list":null,"apc_paid":null,"fwci":2.9976,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.91185103,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9739999771118164,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9739999771118164,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11201","display_name":"Metallurgy and Material Forming","score":0.902899980545044,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/length-measurement","display_name":"Length measurement","score":0.5153459906578064},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5080077648162842},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.4897346496582031},{"id":"https://openalex.org/keywords/correlation","display_name":"Correlation","score":0.47274836897850037},{"id":"https://openalex.org/keywords/digital-image-correlation","display_name":"Digital image correlation","score":0.4462599754333496},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.44134238362312317},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3999590277671814},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.36234211921691895},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2329569160938263},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20079463720321655}],"concepts":[{"id":"https://openalex.org/C21353171","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Length measurement","level":2,"score":0.5153459906578064},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5080077648162842},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4897346496582031},{"id":"https://openalex.org/C117220453","wikidata":"https://www.wikidata.org/wiki/Q5172842","display_name":"Correlation","level":2,"score":0.47274836897850037},{"id":"https://openalex.org/C115635565","wikidata":"https://www.wikidata.org/wiki/Q860900","display_name":"Digital image correlation","level":2,"score":0.4462599754333496},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.44134238362312317},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3999590277671814},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36234211921691895},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2329569160938263},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20079463720321655},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3376703","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3376703","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2543013934","display_name":null,"funder_award_id":"2020YFB1314203","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G4987794879","display_name":null,"funder_award_id":"2020YFB1314103","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W2051612066","https://openalex.org/W2093782818","https://openalex.org/W2120082031","https://openalex.org/W2131372145","https://openalex.org/W2155879733","https://openalex.org/W2158453800","https://openalex.org/W2165820582","https://openalex.org/W2608858501","https://openalex.org/W2801934172","https://openalex.org/W2883194860","https://openalex.org/W2902497325","https://openalex.org/W2959216853","https://openalex.org/W2973247625","https://openalex.org/W2978331485","https://openalex.org/W2983831560","https://openalex.org/W3013282170","https://openalex.org/W3039368862","https://openalex.org/W3044502017","https://openalex.org/W3047427898","https://openalex.org/W3084325977","https://openalex.org/W3105054740","https://openalex.org/W3127075022","https://openalex.org/W3129073993","https://openalex.org/W3179070965","https://openalex.org/W3199231314","https://openalex.org/W4200291576","https://openalex.org/W4206634018","https://openalex.org/W4300818599","https://openalex.org/W4310664768","https://openalex.org/W4312404854","https://openalex.org/W4313132810"],"related_works":["https://openalex.org/W1964003912","https://openalex.org/W2533694135","https://openalex.org/W3135525037","https://openalex.org/W2682616418","https://openalex.org/W3036933026","https://openalex.org/W3036964831","https://openalex.org/W4212930811","https://openalex.org/W2390038358","https://openalex.org/W2601618127","https://openalex.org/W2351410720"],"abstract_inverted_index":{"Metallic":[0],"wire":[1,20,32,44,93,144,164,217,234],"rope":[2],"is":[3,128,191,195],"the":[4,35,55,63,70,73,77,88,114,124,132,138,142,153,159,166,174,199,205,215,222,229,237],"core":[5],"component":[6],"unit":[7],"in":[8,24,169],"construction,":[9],"and":[10,38,51,62,82,98,204],"vision-based":[11],"nondestructive":[12],"inspection":[13],"methods":[14,81],"for":[15,54,177],"condition":[16],"monitoring":[17],"of":[18,30,42,59,65,72,76,87,91,106,141,162,188,207,221,232],"metallic":[19,31,43,92,233],"ropes":[21,33,94,235],"have":[22],"progressed":[23],"recent":[25],"years.":[26],"The":[27,104,146,184,219],"lay":[28,78,89,139,160,178,230],"length":[29,79,90,140,161,179,231],"contains":[34],"stress":[36],"state":[37,40],"healthy":[39],"information":[41],"ropes,":[45],"which":[46,194],"has":[47],"important":[48],"research":[49,52,75],"significance":[50],"value":[53],"force":[56],"balance":[57],"guarantee":[58],"multi-rope":[60],"structures":[61],"safety":[64],"buildings.":[66],"This":[67],"paper":[68,171],"summarizes":[69],"shortcomings":[71],"existing":[74],"measurement":[80,85,202],"proposes":[83],"a":[84],"method":[86,156,167,190,203,206,224],"via":[95],"deep":[96],"learning":[97],"phase":[99,125,210],"correlation":[100,126,211],"image":[101,212],"analysis":[102,127,213],"algorithm.":[103],"segmentation":[105],"strand":[107,115],"module":[108],"applies":[109],"Mask-RCNN":[110],"network":[111],"to":[112,136,157],"segment":[113],"into":[116],"Voronoi-like":[117],"images":[118],"with":[119,152],"high":[120],"signal-to-noise":[121],"ratio.":[122],"Then":[123],"carried":[129],"out":[130],"on":[131,214],"obtained":[133],"Voronoi":[134],"diagram":[135],"calculate":[137],"metal":[143,163,216],"rope.":[145,218],"experimental":[147,239],"results":[148],"show":[149],"that":[150],"compared":[151],"traditional":[154,200],"manual":[155,201],"measure":[158],"rope,":[165],"proposed":[168,223],"this":[170,189],"greatly":[172],"shortens":[173],"time":[175],"required":[176],"detection,":[180],"only":[181],"0.1045":[182],"s.":[183],"average":[185],"detection":[186],"error":[187],"1.0672":[192],"mm,":[193],"far":[196],"lower":[197],"than":[198],"directly":[208],"performing":[209],"reliability":[220],"was":[225],"validated":[226],"by":[227],"varying":[228],"using":[236],"tension-slack":[238],"device.":[240]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":8}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}