{"id":"https://openalex.org/W4392796946","doi":"https://doi.org/10.1109/tim.2024.3375976","title":"Efficient Calibration of a Scanning Probe on CMM","display_name":"Efficient Calibration of a Scanning Probe on CMM","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4392796946","doi":"https://doi.org/10.1109/tim.2024.3375976"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3375976","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3375976","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063059217","display_name":"Yijun Shen","orcid":"https://orcid.org/0000-0002-1281-3637"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yijun Shen","raw_affiliation_strings":["School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-1281-3637","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100354641","display_name":"Yang Zhang","orcid":"https://orcid.org/0000-0002-1590-8244"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Zhang","raw_affiliation_strings":["School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-1590-8244","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010429084","display_name":"Lifang Yan","orcid":"https://orcid.org/0009-0008-1896-949X"},"institutions":[{"id":"https://openalex.org/I4210148486","display_name":"Jiangsu Industry Technology Research Institute","ror":"https://ror.org/044a9d018","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210148486"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lifang Yan","raw_affiliation_strings":["Jiangsu Jitri-HUST Intelligent Equipment Technology Company Ltd., Wuxi, China"],"raw_orcid":"https://orcid.org/0009-0008-1896-949X","affiliations":[{"raw_affiliation_string":"Jiangsu Jitri-HUST Intelligent Equipment Technology Company Ltd., Wuxi, China","institution_ids":["https://openalex.org/I4210148486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101845657","display_name":"Xu Zhang","orcid":"https://orcid.org/0000-0001-8897-5600"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xu Zhang","raw_affiliation_strings":["School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-8897-5600","affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103205239","display_name":"Limin Zhu","orcid":"https://orcid.org/0000-0003-3194-6731"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Limin Zhu","raw_affiliation_strings":["School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0003-3194-6731","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.678,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.81180382,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7244234681129456},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4516795873641968},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.18762105703353882},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1151028573513031}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7244234681129456},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4516795873641968},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18762105703353882},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1151028573513031}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3375976","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3375976","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7799999713897705,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G2328950487","display_name":null,"funder_award_id":"52375505","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3939625744","display_name":null,"funder_award_id":"52305546","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6697783626","display_name":null,"funder_award_id":"91948301","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1941179539","https://openalex.org/W1999454900","https://openalex.org/W2001238362","https://openalex.org/W2015361486","https://openalex.org/W2029869499","https://openalex.org/W2071942259","https://openalex.org/W2081414658","https://openalex.org/W2086691237","https://openalex.org/W2331284299","https://openalex.org/W2408377976","https://openalex.org/W2587753011","https://openalex.org/W2793618212","https://openalex.org/W2891549108","https://openalex.org/W2942299093","https://openalex.org/W2954202378","https://openalex.org/W2965132229","https://openalex.org/W2994649000","https://openalex.org/W3002764432","https://openalex.org/W3005713209","https://openalex.org/W3120090230","https://openalex.org/W4206966814","https://openalex.org/W4214846897","https://openalex.org/W4281254530","https://openalex.org/W4283803552","https://openalex.org/W4289656803","https://openalex.org/W4365146260"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"Scanning":[0],"probes":[1,11,31],"would":[2],"achieve":[3,169],"superior":[4],"accuracy":[5,137,174],"and":[6,46,79,152],"efficiency":[7],"compared":[8,175],"to":[9,41,120,134,176],"touch-trigger":[10,38],"when":[12],"performing":[13],"measurement":[14],"on":[15,63,75,123,148],"a":[16,71,90,124],"Coordinate":[17],"Measuring":[18],"Machine(CMM).":[19],"However,":[20],"existing":[21],"research":[22],"has":[23],"found":[24],"that":[25,36,164,188],"the":[26,42,107,109,113,136,139,149,159],"calibration":[27,44,59,114,141,146,166,178,182],"time":[28,60,183],"for":[29,37,97,202],"scanning":[30,72],"is":[32,95,156,184],"much":[33],"longer":[34],"than":[35],"probes,":[39],"owing":[40],"complex":[43],"setups":[45],"procedures":[47],"of":[48,93,129,138,187,189],"current":[49],"methods.":[50],"For":[51],"industrial":[52,206],"inspection":[53],"applications":[54],"requiring":[55,116],"multiple":[56],"probe":[57,73,151,155],"angles,":[58],"significantly":[61],"impacts":[62],"overall":[64],"efficiency.":[65],"In":[66],"this":[67,98],"paper,":[68],"we":[69],"design":[70],"based":[74],"three-layer":[76],"parallel":[77],"leaf-springs":[78],"three":[80],"orthogonally":[81],"arranged":[82],"displacement":[83],"sensors.":[84],"A":[85],"semi-linear":[86],"mathematical":[87],"model":[88],"with":[89,143],"minimal":[91],"number":[92],"parameters":[94],"established":[96],"probe.":[99],"By":[100],"fully":[101],"utilizing":[102],"all":[103],"data":[104],"collected":[105],"during":[106],"probing,":[108],"proposed":[110,140,195],"method":[111,142,147,167],"simplifies":[112],"procedure,":[115],"only":[117,185],"25":[118],"points":[119],"be":[121],"probed":[122],"sphere":[125],"artifact.":[126],"Four":[127],"sets":[128],"precision":[130],"tests":[131],"are":[132],"conducted":[133],"compare":[135],"Renishaw\u2019s":[144,153,177,190],"commercial":[145],"designed":[150],"SP25":[154],"used":[157],"as":[158],"benchmark.":[160],"The":[161],"results":[162],"demonstrate":[163],"our":[165,181,194],"can":[168],"similar":[170],"or":[171],"even":[172],"higher":[173],"method.":[179,196],"Moreover,":[180],"36.6%":[186],"method,":[191],"which":[192],"validates":[193],"This":[197],"advancement":[198],"holds":[199],"promising":[200],"implications":[201],"enhancing":[203],"productivity":[204],"in":[205],"CMM":[207],"applications.":[208]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}