{"id":"https://openalex.org/W4392450469","doi":"https://doi.org/10.1109/tim.2024.3372220","title":"DGICR-Net: Dual-Graph Interactive Consistency Reasoning Network for Weld Defect Recognition With Limited Labeled Samples","display_name":"DGICR-Net: Dual-Graph Interactive Consistency Reasoning Network for Weld Defect Recognition With Limited Labeled Samples","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4392450469","doi":"https://doi.org/10.1109/tim.2024.3372220"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3372220","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3372220","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100605604","display_name":"Xiaoyuan Liu","orcid":"https://orcid.org/0000-0001-9259-7016"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoyuan Liu","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0001-9259-7016","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100729536","display_name":"Jinhai Liu","orcid":"https://orcid.org/0000-0002-1256-1337"},"institutions":[{"id":"https://openalex.org/I4391767858","display_name":"State Key Laboratory of Synthetical Automation for Process Industries","ror":"https://ror.org/0380ng272","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391767858","https://openalex.org/I9224756"]},{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinhai Liu","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China","State Key Laboratory of Synthetical Automation for Process Industries, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0002-1256-1337","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]},{"raw_affiliation_string":"State Key Laboratory of Synthetical Automation for Process Industries, Shenyang, China","institution_ids":["https://openalex.org/I4391767858"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058300201","display_name":"Huanqun Zhang","orcid":"https://orcid.org/0000-0002-5200-8210"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huanqun Zhang","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China","Shenyang Paidelin Technology Company Ltd., Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0002-5200-8210","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]},{"raw_affiliation_string":"Shenyang Paidelin Technology Company Ltd., Shenyang, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100625792","display_name":"Huaguang Zhang","orcid":"https://orcid.org/0000-0002-2375-9824"},"institutions":[{"id":"https://openalex.org/I4391767858","display_name":"State Key Laboratory of Synthetical Automation for Process Industries","ror":"https://ror.org/0380ng272","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391767858","https://openalex.org/I9224756"]},{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huaguang Zhang","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China","Shenyang Paidelin Technology Company Ltd., Shenyang, China","State Key Laboratory of Synthetical Automation for Process Industries, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0002-2375-9824","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]},{"raw_affiliation_string":"Shenyang Paidelin Technology Company Ltd., Shenyang, China","institution_ids":[]},{"raw_affiliation_string":"State Key Laboratory of Synthetical Automation for Process Industries, Shenyang, China","institution_ids":["https://openalex.org/I4391767858"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052544605","display_name":"Xiangkai Shen","orcid":"https://orcid.org/0000-0003-3164-2156"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangkai Shen","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0003-3164-2156","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1186,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.72620937,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9873999953269958,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9563000202178955,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5999006628990173},{"id":"https://openalex.org/keywords/consistency","display_name":"Consistency (knowledge bases)","score":0.5572453737258911},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.5556309223175049},{"id":"https://openalex.org/keywords/welding","display_name":"Welding","score":0.4770752191543579},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.4723152816295624},{"id":"https://openalex.org/keywords/net","display_name":"Net (polyhedron)","score":0.43321746587753296},{"id":"https://openalex.org/keywords/graph-theory","display_name":"Graph theory","score":0.4262222349643707},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4218951165676117},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.38183367252349854},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.369964599609375},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.24186444282531738},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19470760226249695},{"id":"https://openalex.org/keywords/combinatorics","display_name":"Combinatorics","score":0.11108013987541199},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.08435431122779846}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5999006628990173},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.5572453737258911},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.5556309223175049},{"id":"https://openalex.org/C19474535","wikidata":"https://www.wikidata.org/wiki/Q131172","display_name":"Welding","level":2,"score":0.4770752191543579},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.4723152816295624},{"id":"https://openalex.org/C14166107","wikidata":"https://www.wikidata.org/wiki/Q253829","display_name":"Net (polyhedron)","level":2,"score":0.43321746587753296},{"id":"https://openalex.org/C88230418","wikidata":"https://www.wikidata.org/wiki/Q131476","display_name":"Graph theory","level":2,"score":0.4262222349643707},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4218951165676117},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.38183367252349854},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.369964599609375},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24186444282531738},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19470760226249695},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.11108013987541199},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.08435431122779846},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3372220","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3372220","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1451900309","display_name":null,"funder_award_id":"N2104020","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G2587347264","display_name":null,"funder_award_id":"U21A20481","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G524500553","display_name":null,"funder_award_id":"61973071","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5856693318","display_name":null,"funder_award_id":"XLYC2002046","funder_id":"https://openalex.org/F4320329895","funder_display_name":"Liaoning Revitalization Talents Program"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320329895","display_name":"Liaoning Revitalization Talents Program","ror":null},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W2175342987","https://openalex.org/W2811058982","https://openalex.org/W2913266832","https://openalex.org/W2943605315","https://openalex.org/W2964015378","https://openalex.org/W2985580362","https://openalex.org/W3003166104","https://openalex.org/W3012255272","https://openalex.org/W3035738486","https://openalex.org/W3037030727","https://openalex.org/W3108417339","https://openalex.org/W3110667462","https://openalex.org/W3159280478","https://openalex.org/W3163460434","https://openalex.org/W3164124914","https://openalex.org/W3173196825","https://openalex.org/W3199863078","https://openalex.org/W3205842317","https://openalex.org/W3211350522","https://openalex.org/W3211391700","https://openalex.org/W3213315512","https://openalex.org/W4205247958","https://openalex.org/W4206572781","https://openalex.org/W4225518185","https://openalex.org/W4226043457","https://openalex.org/W4226063738","https://openalex.org/W4285818910","https://openalex.org/W4293704388","https://openalex.org/W4295308550","https://openalex.org/W4317038506","https://openalex.org/W4318832642","https://openalex.org/W4321608115","https://openalex.org/W4322707280","https://openalex.org/W4379116586","https://openalex.org/W4385626811","https://openalex.org/W4386702820","https://openalex.org/W6726873649"],"related_works":["https://openalex.org/W2912321008","https://openalex.org/W2262409920","https://openalex.org/W3192220280","https://openalex.org/W2514640320","https://openalex.org/W2549651119","https://openalex.org/W1998607122","https://openalex.org/W2393201117","https://openalex.org/W1995340519","https://openalex.org/W4220851919","https://openalex.org/W2969591342"],"abstract_inverted_index":{"Weld":[0],"defect":[1,177],"recognition":[2,44,178,206],"has":[3],"become":[4],"a":[5,51,64,89],"major":[6],"research":[7],"topic":[8],"as":[9,82],"it":[10],"ensures":[11],"the":[12,48,98,102,109,119,133,152,156,161,171,189,196,200],"security":[13],"of":[14],"industrial":[15],"equipment.":[16],"Existing":[17],"methods":[18,211],"for":[19,212],"this":[20,61],"task":[21],"rely":[22],"on":[23,188],"abundant":[24],"labeled":[25,141,181,214],"X-ray":[26,70,76,86,115,142,146,182,215],"images,":[27,116],"which":[28],"however,":[29],"are":[30,105,122,166,186],"not":[31],"always":[32],"available":[33],"due":[34],"to":[35,42,83,107,144,168],"costly":[36],"annotation":[37,78],"and":[38,75,101,117,128,160,193,195],"environmental":[39],"complexity,":[40],"leading":[41],"undesirable":[43],"performance.":[45],"To":[46],"solve":[47],"above":[49],"issues,":[50],"dual-graph":[52,90],"interactive":[53,91,127],"consistency":[54,163],"reasoning":[55,93,130],"network":[56,94],"(DGICR-Net)":[57],"is":[58,79,95],"proposed":[59,201],"in":[60,125],"paper.":[62],"Firstly,":[63],"data":[65],"acquisition":[66],"approach":[67],"completed":[68],"by":[69],"radiographic":[71],"inspection,":[72],"film":[73],"scanning":[74],"image":[77],"presented,":[80],"so":[81],"obtain":[84],"weld":[85,176],"images.":[87,147,183,216],"Secondly,":[88],"consistent":[92,129],"proposed,":[96],"where":[97],"instance":[99,153],"graph":[100,104,154,158],"distribution":[103,157],"constructed":[106],"capture":[108],"global":[110],"correlation":[111],"information":[112,135],"between":[113],"multiple":[114],"then":[118],"two":[120],"graphs":[121],"continuously":[123],"updated":[124],"an":[126],"way,":[131],"thus":[132],"label":[134],"can":[136,203],"be":[137],"aggregated":[138],"from":[139],"limited":[140,180,213],"images":[143],"unlabeled":[145],"Finally,":[148],"three":[149],"losses":[150],"containing":[151],"loss,":[155],"loss":[159,165],"structure":[162],"constraint":[164],"designed":[167],"completely":[169],"train":[170],"overall":[172],"DGICR-Net,":[173],"enabling":[174],"achieving":[175],"with":[179],"Three":[184],"experiments":[185],"conducted":[187],"datasets":[190],"PPL,":[191],"MTL":[192],"GDXray,":[194],"results":[197],"demonstrate":[198],"that":[199],"DGICR-Net":[202],"achieve":[204],"superior":[205],"performance":[207],"than":[208],"other":[209],"state-of-the-art":[210]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}