{"id":"https://openalex.org/W4392207588","doi":"https://doi.org/10.1109/tim.2024.3370798","title":"A Simultaneous Diagnosis Approach for Power Switch, Grid-Side Current Sensor, and DC-Link Voltage Sensor Faults in Single-Phase Three-Level Rectifiers","display_name":"A Simultaneous Diagnosis Approach for Power Switch, Grid-Side Current Sensor, and DC-Link Voltage Sensor Faults in Single-Phase Three-Level Rectifiers","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4392207588","doi":"https://doi.org/10.1109/tim.2024.3370798"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3370798","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3370798","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054254540","display_name":"Shuiqing Xu","orcid":"https://orcid.org/0000-0003-3081-3726"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuiqing Xu","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-3081-3726","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019549355","display_name":"Xiaofan Xu","orcid":"https://orcid.org/0000-0002-8272-0620"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaofan Xu","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-8272-0620","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084942279","display_name":"J.M. Wang","orcid":"https://orcid.org/0000-0001-7916-9738"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Wang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-7916-9738","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009768180","display_name":"Hai Wang","orcid":"https://orcid.org/0000-0003-2789-9530"},"institutions":[{"id":"https://openalex.org/I176790772","display_name":"Murdoch University","ror":"https://ror.org/00r4sry34","country_code":"AU","type":"education","lineage":["https://openalex.org/I176790772"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Hai Wang","raw_affiliation_strings":["Discipline of Engineering and Energy, Murdoch University, Perth, WA, Australia"],"raw_orcid":"https://orcid.org/0000-0003-2789-9530","affiliations":[{"raw_affiliation_string":"Discipline of Engineering and Energy, Murdoch University, Perth, WA, Australia","institution_ids":["https://openalex.org/I176790772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103037128","display_name":"Yi Chai","orcid":"https://orcid.org/0000-0002-8637-8682"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Chai","raw_affiliation_strings":["School of Electrical Engineering and Automation, Chongqing University, Chongqing, China"],"raw_orcid":"https://orcid.org/0000-0002-8637-8682","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019419996","display_name":"Hongtian Chen","orcid":"https://orcid.org/0000-0002-8600-9668"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongtian Chen","raw_affiliation_strings":["Department of Automation, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-8600-9668","affiliations":[{"raw_affiliation_string":"Department of Automation, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041106018","display_name":"Mahesh Krishnamurthy","orcid":"https://orcid.org/0000-0002-1851-9666"},"institutions":[{"id":"https://openalex.org/I180949307","display_name":"Illinois Institute of Technology","ror":"https://ror.org/037t3ry66","country_code":"US","type":"education","lineage":["https://openalex.org/I180949307"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mahesh Krishnamurthy","raw_affiliation_strings":["Kaplan Institute of Innovation and Tech Entrepreneurship and the Grainger Power Electronics and Motor Drives Laboratory, Illinois Tech., Chicago, IL, USA"],"raw_orcid":"https://orcid.org/0000-0002-1851-9666","affiliations":[{"raw_affiliation_string":"Kaplan Institute of Innovation and Tech Entrepreneurship and the Grainger Power Electronics and Motor Drives Laboratory, Illinois Tech., Chicago, IL, USA","institution_ids":["https://openalex.org/I180949307"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.7639,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.82965345,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"16"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5836275219917297},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5514430403709412},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.524926483631134},{"id":"https://openalex.org/keywords/current-sensor","display_name":"Current sensor","score":0.5131171345710754},{"id":"https://openalex.org/keywords/link","display_name":"Link (geometry)","score":0.4913155138492584},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.48572689294815063},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4489086866378784},{"id":"https://openalex.org/keywords/three-phase","display_name":"Three-phase","score":0.4393007457256317},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.4277493953704834},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.41286927461624146},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3721550703048706},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3526277542114258},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2260361611843109},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.08702448010444641}],"concepts":[{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5836275219917297},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5514430403709412},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.524926483631134},{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.5131171345710754},{"id":"https://openalex.org/C2778753846","wikidata":"https://www.wikidata.org/wiki/Q6554239","display_name":"Link (geometry)","level":2,"score":0.4913155138492584},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.48572689294815063},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4489086866378784},{"id":"https://openalex.org/C173871940","wikidata":"https://www.wikidata.org/wiki/Q471846","display_name":"Three-phase","level":3,"score":0.4393007457256317},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4277493953704834},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.41286927461624146},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3721550703048706},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3526277542114258},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2260361611843109},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.08702448010444641},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3370798","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3370798","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7599999904632568}],"awards":[{"id":"https://openalex.org/G1556994328","display_name":null,"funder_award_id":"61803140","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7941178911","display_name":null,"funder_award_id":"62303308","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8892919414","display_name":null,"funder_award_id":"U2034209","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G898493330","display_name":null,"funder_award_id":"62273128","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W2038419241","https://openalex.org/W2079792035","https://openalex.org/W2205067742","https://openalex.org/W2215529216","https://openalex.org/W2247411593","https://openalex.org/W2531437605","https://openalex.org/W2605258224","https://openalex.org/W2608623198","https://openalex.org/W2615058343","https://openalex.org/W2626377653","https://openalex.org/W2919670220","https://openalex.org/W2946091921","https://openalex.org/W2955027150","https://openalex.org/W2964037087","https://openalex.org/W2965625921","https://openalex.org/W2979435001","https://openalex.org/W2988299278","https://openalex.org/W3013177357","https://openalex.org/W3016405462","https://openalex.org/W3024005278","https://openalex.org/W3025142420","https://openalex.org/W3094594436","https://openalex.org/W3135234437","https://openalex.org/W3165481132","https://openalex.org/W3171291904","https://openalex.org/W3198746209","https://openalex.org/W3217764313","https://openalex.org/W4224051121","https://openalex.org/W4225758930","https://openalex.org/W4292979794","https://openalex.org/W4317496702","https://openalex.org/W4364321982","https://openalex.org/W4366386365","https://openalex.org/W4366504059","https://openalex.org/W4386515320"],"related_works":["https://openalex.org/W1518185400","https://openalex.org/W3200586296","https://openalex.org/W2991569731","https://openalex.org/W2047091966","https://openalex.org/W1841845823","https://openalex.org/W3114725455","https://openalex.org/W2553864443","https://openalex.org/W2790161430","https://openalex.org/W2355937260","https://openalex.org/W2557428230"],"abstract_inverted_index":{"This":[0],"article":[1],"introduces":[2],"a":[3,56,134,186],"scheme":[4],"for":[5,22,46,84],"diagnosing":[6],"power":[7,152],"switch,":[8,153],"grid-side":[9,98,122,160],"current":[10,99,123,161],"sensor,":[11],"and":[12,54,69,91,102,126,133,154,164,171,185],"DC-link":[13,103,127,165],"voltage":[14,104,128,166],"sensor":[15,100,105,124,129,162,167],"faults":[16,36,163],"simultaneously":[17],"in":[18],"single-phase":[19],"three-level":[20],"rectifiers":[21],"the":[23,27,30,34,47,52,64,67,85,95,109,112,115,118,147,150,174,180],"first":[24],"time.":[25],"First,":[26],"model":[28],"of":[29,58,66,94,111,149,159,173,182],"rectifier":[31,48],"system":[32,49,53,68],"with":[33,138],"aforementioned":[35],"is":[37,44,82,131,141],"reasonably":[38],"constructed.":[39],"Next,":[40],"an":[41,75],"intermediate":[42,86],"variable":[43,87],"established":[45],"by":[50],"augmenting":[51],"performing":[55],"series":[57],"transformations,":[59],"which":[60],"helps":[61],"to":[62,88],"reduce":[63],"complexity":[65],"facilitates":[70,146],"subsequent":[71],"observer":[72,80],"design.":[73],"Subsequently,":[74],"innovative":[76],"reduced-order":[77],"sliding":[78],"mode":[79],"(SMO)":[81],"devised":[83],"obtain":[89],"simultaneous":[90],"precise":[92],"estimation":[93,113],"original":[96],"state,":[97],"fault,":[101,121,125],"fault.":[106],"Finally,":[107],"on":[108],"basis":[110],"results,":[114],"differentiation":[116],"between":[117],"open-circuit":[119],"(OC)":[120],"fault":[130,135],"achieved,":[132],"diagnosis":[136],"strategy":[137],"adaptive":[139],"threshold":[140],"proposed.":[142],"Specifically,":[143],"this":[144],"method":[145,176],"identification":[148],"defective":[151],"proficiently":[155],"estimates":[156],"various":[157],"kinds":[158],"faults.":[168],"The":[169],"robustness":[170],"availability":[172],"developed":[175],"are":[177],"showcased":[178],"via":[179],"presentation":[181],"experimental":[183],"findings":[184],"comparative":[187],"evaluation.":[188]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":4}],"updated_date":"2026-08-12T21:12:35.861297","created_date":"2025-10-10T00:00:00"}